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Research Output 1980 2019

2010

Direct visualization of two-state dynamics on metallic glass surfaces well below T g

Ashtekar, S., Scott, G., Lyding, J. & Gruebele, M., Jul 1 2010, In : Journal of Physical Chemistry Letters. 1, 13, p. 1941-1945 5 p.

Research output: Contribution to journalArticle

Metallic glass
metallic glasses
Visualization
Glass
glass

Direct writing of sub-5 nm hafnium diboride metallic nanostructures

Ye, W., Peña Martin, P. A., Kumar, N., Daly, S. R., Rockett, A. A., Abelson, J. R., Girolami, G. S. & Lyding, J. W., Nov 23 2010, In : ACS Nano. 4, 11, p. 6818-6824 7 p.

Research output: Contribution to journalArticle

Hafnium
hafnium
Nanostructures
electron beams
scanning

Layer-by-layer transfer of multiple, large area sheets of graphene grown in multilayer stacks on a single SiC wafer

Unarunotai, S., Koepke, J. C., Tsai, C. L., Du, F., Chialvo, C. E., Murata, Y., Haasch, R., Petrov, I., Mason, N., Shim, M., Lyding, J. & Rogers, J. A., Oct 26 2010, In : ACS Nano. 4, 10, p. 5591-5598 8 p.

Research output: Contribution to journalArticle

Graphite
Graphene
graphene
Multilayers
wafers

Scanning tunneling microscopic analysis of Cu (In,Ga) Se2 epitaxial layers

Mayer, M. A., Ruppalt, L. B., Hebert, D., Lyding, J. W. & Rockett, A., Feb 24 2010, In : Journal of Applied Physics. 107, 3, 034906.

Research output: Contribution to journalArticle

scanning
scanning tunneling microscopy
spectroscopy
dimers
spacing

Scanning tunneling microscopy as a probe of defects iN CuInSe2

Mayer, M., Martin, P., Lyding, J. W. & Rockett, A., Dec 20 2010, Program - 35th IEEE Photovoltaic Specialists Conference, PVSC 2010. p. 233-238 6 p. 5614487. (Conference Record of the IEEE Photovoltaic Specialists Conference).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Scanning tunneling microscopy
Image resolution
Defects
Spectroscopy
Epitaxial films

Separation-dependent electronic transparency of monolayer graphene membranes on III-V semiconductor substrates

He, K. T., Koepke, J. C., Barraza-Lopez, S. & Lyding, J. W., Sep 8 2010, In : Nano letters. 10, 9, p. 3446-3452 7 p.

Research output: Contribution to journalArticle

Graphite
Transparency
Graphene
Monolayers
graphene
2009

Atomic precision lithography on Si

Randall, J. N., Lyding, J. W., Schmucker, S., Von Ehr, J. R., Ballard, J., Saini, R., Xu, H. & Ding, Y., Dec 1 2009, In : Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures. 27, 6, p. 2764-2768 5 p.

Research output: Contribution to journalArticle

Lithography
lithography
Hydrogen
Atomic layer epitaxy
Silicon

Carbon nanotube alignment using meniscus action

Wood, J. D. & Lyding, J. W., Dec 1 2009, 2009 9th IEEE Conference on Nanotechnology, IEEE NANO 2009. p. 475-476 2 p. 5394701. (2009 9th IEEE Conference on Nanotechnology, IEEE NANO 2009).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Carbon Nanotubes
Single-walled carbon nanotubes (SWCN)
Carbon nanotubes
Nanoelectronics
Electrophoresis

Carbon nanotubes: A simple approach to superlattices

Lyding, J. W., Sep 2009, In : Nature Nanotechnology. 4, 9, p. 545-546 2 p.

Research output: Contribution to journalShort survey

Carbon Nanotubes
Superlattices
Crystallization
Nanotechnology
Nanostructured materials

Carbon nanotubes on partially depassivated n -doped Si (100) - (2×1): H substrates

Barraza-Lopez, S., Albrecht, P. M. & Lyding, J. W., Aug 6 2009, In : Physical Review B - Condensed Matter and Materials Physics. 80, 4, 045415.

Research output: Contribution to journalArticle

Carbon Nanotubes
Carbon nanotubes
carbon nanotubes
Hydrogen
Ultrahigh vacuum

Direct writing of sub-5 nm metals on carbon nanotubes and graphene using a UHV-STM

Ye, W., Martin, P., Kumar, N., Zhang, F., Rockett, A., Abelson, J. R., Girolami, G. S. & Lyding, J. W., Dec 1 2009, 2009 9th IEEE Conference on Nanotechnology, IEEE NANO 2009. p. 825-826 2 p. 5394672. (2009 9th IEEE Conference on Nanotechnology, IEEE NANO 2009).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Carbon Nanotubes
Graphite
Scanning tunneling microscopy
Graphene
Carbon nanotubes

The influence of edge structure on the electronic properties of graphene quantum dots and nanoribbons

Ritter, K. A. & Lyding, J. W., Mar 2009, In : Nature Materials. 8, 3, p. 235-242 8 p.

Research output: Contribution to journalArticle

Nanoribbons
Carbon Nanotubes
Graphite
Electronic properties
Graphene

Theoretical and experimental study of tip electronic structures in scanning tunneling microscope

Choi, H. S., Huang, M., Ballard, J. B., He, K. T., Schmucker, S. W., Lyding, J. W., Randall, J. N. & Cho, K., Dec 1 2009, Computational Nanoscience - How to Exploit Synergy Between Predictive Simulations and Experiment. p. 19-24 6 p. (Materials Research Society Symposium Proceedings; vol. 1177).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Electron tunneling
Electronic structure
Microscopes
microscopes
electronic structure

Theoretical predictions for carbon nanotube alignment by meniscus action

Wood, J. D., Nazareth, V. & Lyding, J. W., Dec 1 2009, 2009 International Semiconductor Device Research Symposium, ISDRS '09. 5378126. (2009 International Semiconductor Device Research Symposium, ISDRS '09).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Carbon Nanotubes
2008
Graphite
Scanning tunneling microscopy
Graphene
Nanoelectronics
Ultrahigh vacuum
2007
Carbon Nanotubes
Charge transfer
Single-walled carbon nanotubes (SWCN)
Carbon nanotubes
Nanotubes

Detecting single-molecule absorption

Gruebele, M., Lyding, J., Carmichael, E. & Ballard, J., Jun 1 2007, In : Materials Today. 10, 6, p. 48-49 2 p.

Research output: Contribution to journalArticle

Microscopes
microscopes
Scanning
spectral mixture analysis
Molecules

Frequency-modulated, single-molecule absorption detected by scanning tunneling microscopy

Carmichael, E. S., Ballard, J. B., Lyding, J. W. & Gruebele, M., Mar 1 2007, In : Journal of Physical Chemistry C. 111, 8, p. 3314-3321 8 p.

Research output: Contribution to journalArticle

Scanning tunneling microscopy
scanning tunneling microscopy
Frequency modulation
frequency modulation
Molecules

Lateral manipulation of single-walled carbon nanotubes on H-passivated Si(100) surfaces with an ultrahigh-vacuum scanning tunneling microscope

Albrecht, P. M. & Lyding, J. W., Jan 1 2007, In : Small. 3, 1, p. 146-152 7 p.

Research output: Contribution to journalArticle

Scanning Tunnelling Microscopy
Carbon Nanotubes
Ultrahigh vacuum
Single-walled carbon nanotubes (SWCN)
Vacuum
Ultrahigh vacuum
Single-walled carbon nanotubes (SWCN)
Hydrogen
Desorption
Microscopes

Metal-induced gap states at a carbon-nanotube intramolecular heterojunction observed by scanning tunneling microscopy

Ruppalt, L. B. & Lyding, J. W., Feb 1 2007, In : Small. 3, 2, p. 280-284 5 p.

Research output: Contribution to journalArticle

Scanning Tunnelling Microscopy
Carbon Nanotubes
Scanning tunneling microscopy
Single-walled carbon nanotubes (SWCN)
Heterojunctions

Preferential orientation of a chiral semiconducting carbon nanotube on the locally depassivated Si(100)-2 × 1:H surface identified by scanning tunneling microscopy

Albrecht, P. M., Barraza-Lopez, S. & Lyding, J. W., Aug 1 2007, In : Small. 3, 8, p. 1402-1406 5 p.

Research output: Contribution to journalArticle

Scanning Tunnelling Microscopy
Carbon Nanotubes
Scanning tunneling microscopy
Carbon nanotubes
Spectrum Analysis
Single-walled carbon nanotubes (SWCN)
Hydrogen
Spectroscopy
Scanning
Substrates

UHV-STM nanofabrication on silicon

Albrecht, P. M., Ruppalt, L. B. & Lyding, J. W., Dec 1 2007, Scanning Probe Microscopy. Springer New York, Vol. 2. p. 880-905 26 p.

Research output: Chapter in Book/Report/Conference proceedingChapter

Ultrahigh vacuum
Silicon
Nanotechnology
Microscopes
Scanning
2006

Laser absorption scanning tunneling microscopy of carbon nanotubes

Ballard, J. B., Carmichael, E. S., Shi, D., Lyding, J. W. & Gruebele, M., Jan 1 2006, In : Nano Letters. 6, 1, p. 45-49 5 p.

Research output: Contribution to journalArticle

Carbon Nanotubes
Scanning tunneling microscopy
scanning tunneling microscopy
Carbon nanotubes
carbon nanotubes

UHV-STM study of single-walled carbon nanotubes applied to the GaAs(110) and InAs(110) surfaces

Ruppalt, L. B., Albrecht, P. M. & Lyding, J. W., Mar 1 2006, Proceedings - ICFSI-10 - 10th International Conference on the Formation of Semiconductor Interfaces. p. 31-34 4 p. (Journal De Physique. IV : JP; vol. 132).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

ultrahigh vacuum
scanning tunneling microscopy
carbon nanotubes
nanotubes
spectroscopy
2005

Atomic-scale electrical characterization of carbon nanotubes on silicon surfaces with the UHV-STM

Albrecht, P. M. & Lyding, J. W., Dec 1 2005, 2005 IEEE Workshop on Microelectronics and Electron Devices, WMED. p. 49-52 4 p. 1431615. (2005 IEEE Workshop on Microelectronics and Electron Devices, WMED; vol. 2005).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Ultrahigh vacuum
Single-walled carbon nanotubes (SWCN)
Carbon nanotubes
Microscopes
Scanning

Deuterium passivation in CMOS technology

Lyding, J. W., Lee, J., Cheng, K., Albrecht, P. M., Ruppalt, L. B. & Hess, K., Dec 1 2005, p. 135-143. 9 p.

Research output: Contribution to conferencePaper

Deuterium
Passivation
Desorption
Hydrogen
Hot carriers
2004

A scanning tunneling microscopy study: Si/SiO 2 : Interface roughness induced by chemical etching

Yu, J., Liu, L. & Lyding, J. W., Dec 1 2004, Scanning-Probe and Other Novel Microscopies of Local Phenomena in Nanostructured Materials. p. 44-49 6 p. (Materials Research Society Symposium Proceedings; vol. 838).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Scanning tunneling microscopy
scanning tunneling microscopy
Etching
roughness
Surface roughness
Single-walled carbon nanotubes (SWCN)
Microscopes
carbon nanotubes
microscopes
Scanning

Carrier profiling via scanning tunneling spectroscopy: Comparison with scanning capacitance microscopy

Liu, F. Y., Griffin, P. B., Plummer, J. D., Lyding, J. W., Moran, J. M., Richards, J. F. & Kulig, L., Jan 1 2004, In : Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures. 22, 1, p. 422-426 5 p.

Research output: Contribution to journalArticle

Microscopic examination
Capacitance
capacitance
Spectroscopy
microscopy

Deposition and STM investigation of single-walled carbon nanotubes on GaAs(110)

Ruppalt, L. B., Albrecht, P. M. & Lyding, J. W., Dec 1 2004, 2004 4th IEEE Conference on Nanotechnology. p. 13-15 3 p. (2004 4th IEEE Conference on Nanotechnology).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Single-walled carbon nanotubes (SWCN)
Microscopes
Scanning
Energy gap
Substrates
Oxide films
Deuterium
Hydrogen
Oxides
Annealing

Hydrogen-related extrinsic oxide trap generation in thin gate oxide film during negative-bias temperature instability stress

Lee, J. S., Lyding, J. W. & Hess, K., Jan 1 2004, In : IEEE International Reliability Physics Symposium Proceedings. 2004-January, January, p. 685-686 2 p., 1315451.

Research output: Contribution to journalConference article

Oxide films
Deuterium
Hydrogen
Oxides
Annealing

Scanning tunneling microscopy using dynamic laser heating

Ballard, J., Shi, D., Carmichael, E., Pappu, S., Lyding, J. & Gruebele, M., Dec 1 2004, 2004 4th IEEE Conference on Nanotechnology. p. 68-70 3 p. (2004 4th IEEE Conference on Nanotechnology).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Laser heating
Scanning tunneling microscopy
Heating
Ultrafast lasers
Laser excitation
2003

An Analytical Model to Project MOS Transistor Lifetime Improvement by Deuterium Passivation of Interface Traps

Cheng, K. & Lyding, J. W., Oct 1 2003, In : IEEE Electron Device Letters. 24, 10, p. 655-657 3 p.

Research output: Contribution to journalArticle

Hot carriers
Deuterium
MOSFET devices
Passivation
Analytical models
Ultrahigh vacuum
Single-walled carbon nanotubes (SWCN)
Nanotubes
ultrahigh vacuum
nanotubes

Direct integration of single-walled carbon nanotubes with silicon

Albrecht, P. M., Farrell, R. M., Ye, W. & Lyding, J. W., Jan 1 2003, 2003 3rd IEEE Conference on Nanotechnology, IEEE-NANO 2003 - Proceedings. IEEE Computer Society, p. 327-330 4 p. 1231784. (Proceedings of the IEEE Conference on Nanotechnology; vol. 1).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Silicon
Single-walled carbon nanotubes (SWCN)
carbon nanotubes
silicon
Substrates
Electron devices
MOSFET devices
Deuterium
Passivation
Analytical models
Hot carriers
Deuterium
Isotopes
Leakage currents
Hydrogen

Ultrahigh-vacuum scanning tunneling microscopy and spectroscopy of single-walled carbon nanotubes on hydrogen-passivated Si(100) surfaces

Albrecht, P. M. & Lyding, J. W., Dec 15 2003, In : Applied Physics Letters. 83, 24, p. 5029-5031 3 p.

Research output: Contribution to journalArticle

image resolution
ultrahigh vacuum
scanning tunneling microscopy
carbon nanotubes
hydrogen
2002

Adsorption of cobalt phthalocyanine on Si(1 0 0)2 × 1 and Si(1 0 0)2 × 1:H surfaces studied by scanning tunneling microscopy and spectroscopy

Liu, L., Yu, J., Viernes, N. O. L., Moore, J. S. & Lyding, J. W., Sep 10 2002, In : Surface Science. 516, 1-2, p. 118-126 9 p.

Research output: Contribution to journalArticle

Scanning tunneling microscopy
scanning tunneling microscopy
Cobalt
cobalt
Spectroscopy

Buried channel silicon-on-insulator MOSFETs for hot-electron spectroscopy

Yang, J., Thornton, T. J., Goodnick, S. M., Kozicki, M. & Lyding, J. W., Mar 1 2002, In : Physica B: Condensed Matter. 314, 1-4, p. 354-357 4 p.

Research output: Contribution to journalArticle

Hot carriers
Electron spectroscopy
Hot electrons
Silicon
hot electrons
scanning tunneling microscopy
Doping (additives)
Scanning tunneling microscopy
arsenic
ultrahigh vacuum

Improved hot-carrier reliability of SOI transistors by deuterium passivation of defects at oxide/silicon interfaces

Cheng, K., Lee, J., Hess, K., Lyding, J. W., Kim, Y. K., Kim, Y. W. & Suh, K. P., Mar 1 2002, In : IEEE Transactions on Electron Devices. 49, 3, p. 529-531 3 p.

Research output: Contribution to journalArticle

Hot carriers
Deuterium
Silicon oxides
Silicon
Passivation

Scanning tunneling microscopy observation of single dangling bonds on the Si(100)2×1:H surface

Liu, L., Yu, J. & Lyding, J. W., Jan 1 2002, In : Materials Research Society Symposium - Proceedings. 705, p. 187-192 6 p.

Research output: Contribution to journalConference article

Dangling bonds
Scanning tunneling microscopy
scanning tunneling microscopy
ultrahigh vacuum
lithography

Subsurface dopant-induced features on the Si(100)2 × 1:H surface: Fundamental study and applications

Liu, L., Yu, J. & Lyding, J. W., Dec 1 2002, In : IEEE Transactions on Nanotechnology. 1, 4, p. 176-183 8 p.

Research output: Contribution to journalArticle

Doping (additives)
Scanning tunneling microscopy
Surface states
Arsenic
Boron

The effects of a multiple carrier model of interface trap generation on lifetime extraction for MOSFETs

McMahon, W., Matsuda, K., Lee, J., Hess, K. & Lyding, J. W., Dec 1 2002, 2002 International Conference on Modeling and Simulation of Microsystems - MSM 2002. Laudon, M. & Romanowicz, B. (eds.). p. 576-579 4 p. (2002 International Conference on Modeling and Simulation of Microsystems - MSM 2002).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Multiple scattering
Drain current
Extrapolation
Isotopes
Electrons

Variable temperature study of the passivation of dangling bonds at Si(100)-2×1 reconstructed surfaces with H and D

Hersam, M. C., Guisinger, N. P., Lee, J., Cheng, K. & Lyding, J. W., Jan 14 2002, In : Applied Physics Letters. 80, 2, p. 201-203 3 p.

Research output: Contribution to journalArticle

passivity
scanning tunneling microscopy
temperature
desorption
vapor phases
2001

A new technique to quantify deuterium passivation of interface traps in MOS devices

Cheng, K., Hess, K. & Lyding, J. W., May 1 2001, In : IEEE Electron Device Letters. 22, 5, p. 203-205 3 p.

Research output: Contribution to journalArticle

MOS devices
Deuterium
Passivation
Hydrogen
Silicon oxides