If you made any changes in Pure, your changes will be visible here soon.

Research Output 1980 2019

Detecting single-molecule absorption

Gruebele, M., Lyding, J., Carmichael, E. & Ballard, J., Jun 1 2007, In : Materials Today. 10, 6, p. 48-49 2 p.

Research output: Contribution to journalArticle

Microscopes
microscopes
Scanning
spectral mixture analysis
Molecules

Deuterium isotope effect for AC and DC hot-carrier degradation of MOS transistors: A comparison study

Chen, Z., Cheng, K., Lee, J., Lyding, J. W., Hess, K. & Chetlur, S., Apr 1 2001, In : IEEE Transactions on Electron Devices. 48, 4, p. 813-815 3 p.

Research output: Contribution to journalArticle

Hot carriers
Deuterium
MOSFET devices
Isotopes
Degradation

Deuterium passivation in CMOS technology

Lyding, J. W., Lee, J., Cheng, K., Albrecht, P. M., Ruppalt, L. B. & Hess, K., Dec 1 2005, p. 135-143. 9 p.

Research output: Contribution to conferencePaper

Deuterium
Passivation
Desorption
Hydrogen
Hot carriers

Deuterium passivation of interface traps in MOS devices

Cheng, K., Hess, K. & Lyding, J. W., Sep 1 2001, In : IEEE Electron Device Letters. 22, 9, p. 441-443 3 p.

Research output: Contribution to journalArticle

MOS devices
Deuterium
Passivation
Hydrogen
Hot electrons

Deuterium post metal annealing of MOSFETs for improved hot carrier reliability

Kizilyalli, I. C., Lyding, J. W. & Hess, K., Jan 1 1996, p. 14-15. 2 p.

Research output: Contribution to conferencePaper

Hot carriers
Deuterium
Hot electrons
Annealing
Metals

Deuterium post-metal annealing of MOSFET's for improved hot carrier reliability

Kizilyalli, I. C., Lyding, J. W. & Hess, K., Mar 1 1997, In : IEEE Electron Device Letters. 18, 3, p. 81-83 3 p.

Research output: Contribution to journalArticle

Hot carriers
Deuterium
Metals
Hydrogen
Annealing

Deuterium pressure dependence of characteristics and hot-carrier reliability of CMOS devices

Cheng, K., Lee, J., Chen, Z., Shah, S., Hess, K., Lyding, J. W., Kim, Y. K., Kim, Y. W. & Suh, K. P., Aug 1 2001, In : Microelectronic Engineering. 56, 3-4, p. 353-358 6 p.

Research output: Contribution to journalArticle

Hot carriers
Deuterium
pressure dependence
deuterium
CMOS

Deuterium process of CMOS devices: New phenomena and dramatic improvement

Chen, Z., Lee, J., Lyding, J. W. & Hess, K., Jan 1 1998, In : Digest of Technical Papers - Symposium on VLSI Technology. p. 180-181 2 p.

Research output: Contribution to journalConference article

Deuterium
Degradation
Electric potential
Temperature

Development of a tunnelling model of charge-density-wve depinning

Bardeen, J., Lyding, J. W., Lyons, W. G., Miller, J. H., Thorne, R. E. & Tucker, J. R., Mar 1987, In : Synthetic Metals. 19, 1-3, p. 1-6 6 p.

Research output: Contribution to journalArticle

Charge density
Metals
Charge density waves
Harmonic generation
Frequency response

Direct imaging of room temperature optical absorption with subnanometer spatial resolution

Scott, G., Ashtekar, S., Lyding, J. & Gruebele, M., Dec 8 2010, In : Nano Letters. 10, 12, p. 4897-4900 4 p.

Research output: Contribution to journalArticle

Light absorption
Carbon Nanotubes
optical absorption
spatial resolution
Imaging techniques

Direct imaging of two-state dynamics on the amorphous silicon surface

Ashtekar, S., Scott, G., Lyding, J. & Gruebele, M., Jun 10 2011, In : Physical review letters. 106, 23, 235501.

Research output: Contribution to journalArticle

amorphous silicon
glass
metallic glasses
hydrogenation
bombardment

Direct integration of single-walled carbon nanotubes with silicon

Albrecht, P. M., Farrell, R. M., Ye, W. & Lyding, J. W., Jan 1 2003, 2003 3rd IEEE Conference on Nanotechnology, IEEE-NANO 2003 - Proceedings. IEEE Computer Society, p. 327-330 4 p. 1231784. (Proceedings of the IEEE Conference on Nanotechnology; vol. 1).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Silicon
Single-walled carbon nanotubes (SWCN)
carbon nanotubes
silicon
Substrates

Direct observation of resistive heating at graphene wrinkles and grain boundaries

Grosse, K. L., Dorgan, V. E., Estrada, D., Wood, J. D., Vlassiouk, I., Eres, G., Lyding, J. W., King, W. P. & Pop, E., Oct 6 2014, In : Applied Physics Letters. 105, 14, 143109.

Research output: Contribution to journalArticle

graphene
grain boundaries
heating
temperature scales
temperature

Direct observation of strained substrate in graded Si1-xGex/Si heterostructures

Tao, M. & Lyding, J. W., Apr 5 1999, In : Applied Physics Letters. 74, 14, p. 2020-2022 3 p.

Research output: Contribution to journalArticle

scanning tunneling microscopy
defects

Direct visualization of two-state dynamics on metallic glass surfaces well below T g

Ashtekar, S., Scott, G., Lyding, J. & Gruebele, M., Jul 1 2010, In : Journal of Physical Chemistry Letters. 1, 13, p. 1941-1945 5 p.

Research output: Contribution to journalArticle

Metallic glass
metallic glasses
Visualization
Glass
glass

Direct writing of sub-5 nm hafnium diboride metallic nanostructures

Ye, W., Peña Martin, P. A., Kumar, N., Daly, S. R., Rockett, A. A., Abelson, J. R., Girolami, G. S. & Lyding, J. W., Nov 23 2010, In : ACS Nano. 4, 11, p. 6818-6824 7 p.

Research output: Contribution to journalArticle

Hafnium
hafnium
Nanostructures
electron beams
scanning

Direct writing of sub-5 nm metals on carbon nanotubes and graphene using a UHV-STM

Ye, W., Martin, P., Kumar, N., Zhang, F., Rockett, A., Abelson, J. R., Girolami, G. S. & Lyding, J. W., Dec 1 2009, 2009 9th IEEE Conference on Nanotechnology, IEEE NANO 2009. p. 825-826 2 p. 5394672. (2009 9th IEEE Conference on Nanotechnology, IEEE NANO 2009).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Carbon Nanotubes
Graphite
Scanning tunneling microscopy
Graphene
Carbon nanotubes

Effect of carbon nanotube network morphology on thin film transistor performance

Timmermans, M. Y., Estrada, D., Nasibulin, A. G., Wood, J. D., Behnam, A., Sun, D. M., Ohno, Y., Lyding, J. W., Hassanien, A., Pop, E. & Kauppinen, E. I., May 1 2012, In : Nano Research. 5, 5, p. 307-319 13 p.

Research output: Contribution to journalArticle

Carbon Nanotubes
Thin film transistors
Carbon nanotubes
Aerosols
Transport properties

Effect of low temperature deuterium annealing on plasma process induced damage

Lee, S. H., Kim, Y. K., Lee, Y. H., Kang, H. S., Ahn, C. G., Kang, B. K., Lee, J., Cheng, K., Chen, Z., Hess, K. & Lyding, J. W., Dec 1 1999, p. 188-191. 4 p.

Research output: Contribution to conferencePaper

Deuterium
Annealing
Plasmas
Polysilicon
Temperature

Effects of gallium arsenide passivation on scanning tunneling microscope excited luminescence

Reuter, E. E., Gu, S. Q., Bohn, P. W., Dorsten, J. F., Abeln, G. C., Lyding, J. W. & Bishop, S. G., Dec 1 1995, In : Materials Research Society Symposium - Proceedings. 380, p. 119-124 6 p.

Research output: Contribution to journalConference article

Gallium arsenide
Passivation
passivity
gallium
Luminescence

Effects of polycrystalline Cu substrate on graphene growth by chemical vapor deposition

Wood, J. D., Schmucker, S. W., Lyons, A. S., Pop, E. & Lyding, J. W., Nov 9 2011, In : Nano letters. 11, 11, p. 4547-4554 8 p.

Research output: Contribution to journalArticle

Graphite
Graphene
Chemical vapor deposition
graphene
vapor deposition

Electrical conductivity of iodine doped poly(phthalocyaninatosiloxane)/PPTA blend fibers

Zhou, X., Lyding, J. W., Marks, T. J. & Carr, S. H., Dec 1 1988, In : Chinese Journal of Polymer Science (English Edition). 6, 3, p. 208-215 8 p.

Research output: Contribution to journalArticle

Iodine
Polysilicon
Fibers
Polytetrafluoroethylene
Benzene

Electrically conductive, processable polymeric materials constructed from metallophthalocyanines

Inabe, T., Lomax, J. F., Lyding, J. W., Kannewurf, C. R. & Marks, T. J., Apr 1984, In : Synthetic Metals. 9, 2, p. 303-316 14 p.

Research output: Contribution to journalArticle

Conductive materials
Kevlar (trademark)
fibers
Fibers
Polymers

ENFORCED SEGREGATED STACKING IN METALLOMACROCYCLIC 'METALS. ' NEW INFORMATION ON PHTHALOCYANINE DONOR-ACCEPTOR INTERACTIONS.

Inabe, T., Kannewurf, C. R., Lyding, J. W., Moguel, M. K. & Marks, T. J., Jan 1 1982, In : Molecular crystals and liquid crystals. 93, 1-4, p. 355-367 13 p.

Research output: Contribution to journalConference article

Metals
Doping (additives)
brackets
Optical conductivity
conductivity
Electron devices
MOSFET devices
Deuterium
Passivation
Analytical models

EVAC: A virtual environment for control of remote imaging instrumentation

Potter, C., Brady, R., Moran, P., Gregory, C., Carragher, B., Kisseberth, N., Lyding, J. & Lindquist, J., Jul 1 1996, In : IEEE Computer Graphics and Applications. 16, 4, p. 62-66 5 p.

Research output: Contribution to journalArticle

HIgh speed networks
Remote control
Virtual reality
Imaging techniques

Evidence for bulk "narrow-band noise" in NbSe3: Thermal-gradient studies

Lyding, J. W., Hubacek, J. S., Gammie, G. & Thorne, R. E., Jan 1 1986, In : Physical Review B. 33, 6, p. 4341-4344 4 p.

Research output: Contribution to journalArticle

narrowband
gradients
oscillations
white noise
sliding

Experimental evidence of Si-H bond energy variation at SiO2-Si interface

Cheng, K., Lee, J. & Lyding, J. W., Nov 20 2000, In : Applied Physics Letters. 77, 21, p. 3388-3390 3 p.

Research output: Contribution to journalArticle

degradation
energy
semiconductor devices
metal oxide semiconductors
desorption

Field-directed sputter sharpening for tailored probe materials and atomic-scale lithography

Schmucker, S. W., Kumar, N., Abelson, J. R., Daly, S. R., Girolami, G. S., Bischof, M. R., Jaeger, D. L., Reidy, R. F., Gorman, B. P., Alexander, J., Ballard, J. B., Randall, J. N. & Lyding, J. W., Aug 15 2012, In : Nature communications. 3, 935.

Research output: Contribution to journalArticle

Scanning Probe Microscopy
Lithography
lithography
Electrons
probes

Frequency-modulated, single-molecule absorption detected by scanning tunneling microscopy

Carmichael, E. S., Ballard, J. B., Lyding, J. W. & Gruebele, M., Mar 1 2007, In : Journal of Physical Chemistry C. 111, 8, p. 3314-3321 8 p.

Research output: Contribution to journalArticle

Scanning tunneling microscopy
scanning tunneling microscopy
Frequency modulation
frequency modulation
Molecules
MOS devices
Silicon oxides
Ultrahigh vacuum
Deuterium
silicon oxides

Giant isotope effect in hot electron degradation of metal oxide silicon devices

Hess, K., Kizilyalli, I. C. & Lyding, J. W., Dec 1 1998, In : IEEE Transactions on Electron Devices. 45, 2, p. 406-416 11 p.

Research output: Contribution to journalArticle

Hot electrons
Deuterium
Silicon oxides
Isotopes
Metals

Graphene-Based Platform for Infrared Near-Field Nanospectroscopy of Water and Biological Materials in an Aqueous Environment

Khatib, O., Wood, J. D., McLeod, A. S., Goldflam, M. D., Wagner, M., Damhorst, G. L., Koepke, J. C., Doidge, G. P., Rangarajan, A., Bashir, R., Pop, E., Lyding, J. W., Thiemens, M. H., Keilmann, F. & Basov, D. N., Aug 25 2015, In : ACS Nano. 9, 8, p. 7968-7975 8 p.

Research output: Contribution to journalArticle

Graphite
Biological materials
Graphene
near fields
graphene

Growth mechanism and surface atomic structure of AgInSe 2

Pea Martin, P., Rockett, A. A. & Lyding, J., Jul 1 2012, In : Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films. 30, 4, 04D115.

Research output: Contribution to journalArticle

atomic structure
Screw dislocations
screw dislocations
Surface reconstruction
Scanning tunneling microscopy

Helical carbon nanotubes enhance the early immune response and inhibit macrophage-mediated phagocytosis of Pseudomonas aeruginosa

Walling, B. E., Kuang, Z., Hao, Y., Estrada, D., Wood, J. D., Lian, F., Miller, L. A., Shah, A. B., Jeffries, J. L., Haasch, R. T., Lyding, J. W., Pop, E. & Lau, G. W., Nov 18 2013, In : PloS one. 8, 11, e80283.

Research output: Contribution to journalArticle

carbon nanotubes
Carbon Nanotubes
Macrophages
phagocytosis
Phagocytosis

Highly conductive metallophthalocyanine assemblies. Structure, charge transport, and anisotropy in the metal-free molecular metal H2(Pc)I

Inabe, T., Marks, T. J., Burton, R. L., Lyding, J. W., McCarthy, W. J., Kannewurf, C. R., Reisner, G. M. & Herbstein, F. H., May 1985, In : Solid State Communications. 54, 6, p. 501-504 4 p.

Research output: Contribution to journalArticle

Magnetic susceptibility
norms
assemblies
Metal ions
Charge transfer

High-performance chip reliability from short-time-tests-statistical models for optical interconnect and HCI/TDDB/NBTI deep-submicron transistor failures

Haggag, A., McMahon, W., Hess, K., Cheng, K., Lee, J. & Lyding, J., Jan 1 2001, IEEE International Reliability Physics Symposium Proceedings. Vol. 2001-January. p. 271-279 9 p. 922913

Research output: Chapter in Book/Report/Conference proceedingChapter

Hot carriers
Optical interconnects
Transistors
Degradation
Defects

High-performance chip reliability from short-time-tests Statistical models for optical interconnect and HCl/TDDB/NBTI deep-submicron transistor failures

Haggag, A., McMahon, W., Hess, K., Cheng, K., Lee, J. & Lyding, J., Jan 1 2001, In : Annual Proceedings - Reliability Physics (Symposium). p. 271-279 9 p.

Research output: Contribution to journalConference article

Optical interconnects
Transistors
Degradation
Defects
Bragg gratings

Hot-carrier-induced oxide charge trapping and interface trap creation in metal-oxide-semiconductor devices studied by hydrogen/deuterium isotope effect

Cheng, K., Lee, J., Hess, K. & Lyding, J. W., Mar 26 2001, In : Applied Physics Letters. 78, 13, p. 1882-1884 3 p.

Research output: Contribution to journalArticle

semiconductor devices
metal oxide semiconductors
isotope effect
deuterium
transistors
Hot carriers
Deuterium
Isotopes
Leakage currents
Hydrogen

Hydrogen-related extrinsic oxide trap generation in thin gate oxide film during negative-bias temperature instability stress

Lee, J. S., Lyding, J. W. & Hess, K., Jan 1 2004, In : IEEE International Reliability Physics Symposium Proceedings. 2004-January, January, p. 685-686 2 p., 1315451.

Research output: Contribution to journalConference article

Oxide films
Deuterium
Hydrogen
Oxides
Annealing
Oxide films
Deuterium
Hydrogen
Oxides
Annealing

Imaging and Manipulating Energy Transfer among Quantum Dots at Individual Dot Resolution

Nguyen, D., Nguyen, H. A., Lyding, J. W. & Gruebele, M., Jun 27 2017, In : ACS Nano. 11, 6, p. 6328-6335 8 p.

Research output: Contribution to journalArticle

Energy transfer
Semiconductor quantum dots
energy transfer
quantum dots
Imaging techniques

Imaging Excited Orbitals of Quantum Dots: Experiment and Electronic Structure Theory

Nienhaus, L., Goings, J. J., Nguyen, D., Wieghold, S., Lyding, J. W., Li, X. & Gruebele, M., Nov 25 2015, In : Journal of the American Chemical Society. 137, 46, p. 14743-14750 8 p.

Research output: Contribution to journalArticle

Quantum Dots
Semiconductor quantum dots
Electronic structure
laser
Imaging techniques

Imaging of Carbon Nanotube Electronic States Polarized by the Field of an Excited Quantum Dot

Nguyen, D., Wallum, A., Nguyen, H. A., Nguyen, N. T., Lyding, J. W. & Gruebele, M. H. W., Feb 26 2019, In : ACS Nano. 13, 2, p. 1012-1018 7 p.

Research output: Contribution to journalArticle

Carbon Nanotubes
Electronic states
Carbon nanotube field effect transistors
Semiconductor quantum dots
Carbon nanotubes

Impact of nanostructure research on conventional solid-state electronics: The giant isotope effect in hydrogen desorption and CMOS lifetime

Hess, K., Register, L. F., Tuttle, B., Lyding, J. W. & Kizilyalli, I. C., Oct 16 1998, In : Physica E: Low-Dimensional Systems and Nanostructures. 3, 1-3, p. 1-7 7 p.

Research output: Contribution to journalArticle

Electronic states
Isotopes
isotope effect
Hydrogen
Nanostructures

Implications of atomic-level manipulation on the Si(100) surface: From enhanced CMOS reliability to molecular nanoelectronics

Hersam, M. C., Lee, J., Guisinger, N. P. & Lyding, J. W., May 2000, In : Superlattices and Microstructures. 27, 5, p. 583-591 9 p.

Research output: Contribution to journalConference article

Nanoelectronics
manipulators
Desorption
CMOS
Metals

Improved graphene growth and fluorination on Cu with clean transfer to surfaces

Wood, J. D., Schmucker, S. W., Haasch, R. T., Doidge, G. P., Nienhaus, L., Damhorst, G. L., Lyons, A. S., Gruebele, M., Bashir, R., Pop, E. & Lyding, J. W., Nov 22 2012, 2012 12th IEEE International Conference on Nanotechnology, NANO 2012. 6322101. (Proceedings of the IEEE Conference on Nanotechnology).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Fluorination
fluorination
Graphite
Graphene
graphene

Improved hot-carrier reliability of SOI transistors by deuterium passivation of defects at oxide/silicon interfaces

Cheng, K., Lee, J., Hess, K., Lyding, J. W., Kim, Y. K., Kim, Y. W. & Suh, K. P., Mar 1 2002, In : IEEE Transactions on Electron Devices. 49, 3, p. 529-531 3 p.

Research output: Contribution to journalArticle

Hot carriers
Deuterium
Silicon oxides
Silicon
Passivation

Improvement of hot carrier reliability with deuterium anneals for manufacturing multilevel metal/dielectric MOS systems

Kizilyalli, I. C., Abeln, G. C., Chen, Z., Lee, J., Weber, G., Kotzias, B., Chetlur, S., Lyding, J. W. & Hess, K., Nov 1 1998, In : IEEE Electron Device Letters. 19, 11, p. 444-446 3 p.

Research output: Contribution to journalArticle

Hot carriers
Deuterium
Metals
Isotopes
Hydrogen