1980 …2020

Research output per year

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Research Output

Ac-dc interference, complete mode locking, and origin of coherent oscillations in sliding charge-density-wave systems

Thorne, R. E., Hubacek, J. S., Lyons, W. G., Lyding, J. W. & Tucker, J. R., Jan 1 1988, In : Physical Review B. 37, 17, p. 10055-10067 13 p.

Research output: Contribution to journalArticle

Adsorption of cobalt phthalocyanine on Si(1 0 0)2 × 1 and Si(1 0 0)2 × 1:H surfaces studied by scanning tunneling microscopy and spectroscopy

Liu, L., Yu, J., Viernes, N. O. L., Moore, J. S. & Lyding, J. W., Sep 10 2002, In : Surface Science. 516, 1-2, p. 118-126 9 p.

Research output: Contribution to journalArticle

Alternative approach for modeling the hot carrier degradation of the Si/SiO2 interface

Chen, Z., Lee, J. & Lyding, J. W., Jan 1 1998, In : Materials Research Society Symposium - Proceedings. 513, p. 313-317 5 p.

Research output: Contribution to journalConference article

An alternative interpretation of hot electron interface degradation in NMOSFET's: Isotope results irreconcilable with major defect generation by holes?

Hess, K., Lee, J., Chen, Z., Lyding, J. W., Kim, Y. K., Kim, B. S., Lee, Y. H., Kim, Y. W. & Suh, K. P., Dec 1 1999, In : IEEE Transactions on Electron Devices. 46, 9, p. 1914-1916 3 p.

Research output: Contribution to journalArticle

An Analytical Model to Project MOS Transistor Lifetime Improvement by Deuterium Passivation of Interface Traps

Cheng, K. & Lyding, J. W., Oct 1 2003, In : IEEE Electron Device Letters. 24, 10, p. 655-657 3 p.

Research output: Contribution to journalArticle

A new technique to quantify deuterium passivation of interface traps in MOS devices

Cheng, K., Hess, K. & Lyding, J. W., May 1 2001, In : IEEE Electron Device Letters. 22, 5, p. 203-205 3 p.

Research output: Contribution to journalArticle

Annealing free, clean graphene transfer using alternative polymer scaffolds

Wood, J. D., Doidge, G. P., Carrion, E. A., Koepke, J. C., Kaitz, J. A., Datye, I., Behnam, A., Hewaparakrama, J., Aruin, B., Chen, Y., Dong, H., Haasch, R. T., Lyding, J. W. & Pop, E., Jun 6 2015, In : Nanotechnology. 26, 5, 055302.

Research output: Contribution to journalArticle

Application of high pressure deuterium annealing for improving the hot carrier reliability of CMOS transistors

Jinju, L., Cheng, K., Chen, Z., Hess, K., Lyding, J. W., Young-Kwang, K., Seung, L., Young-Wug, K. & Kwang-Pyuk, S., May 1 2000, In : IEEE Electron Device Letters. 21, 5, p. 221-223 3 p.

Research output: Contribution to journalArticle

Application of the deuterium sintering process to improve the device design rule in reducing plasma induced damages

Kim, Y. K., Lee, S. H., Lee, H. S., Kim, B. S., Lee, Y. H., Lee, J., Cheng, K., Chen, Z., Hess, K. & Lyding, J. W., Dec 1 1999, p. 65-68. 4 p.

Research output: Contribution to conferencePaper

Approach for efficiently locating and electrically contacting nanostructures fabricated via UHV-STM lithography on Si(100)

Hersam, M. C., Abeln, G. C. & Lyding, J. W., Jun 1999, In : Microelectronic Engineering. 47, 1, p. 235-237 3 p.

Research output: Contribution to journalConference article

Approach to enhance deuterium incorporation for improved hot carrier reliability in metal-oxide-semiconductor devices

Cheng, K., Lee, J. & Lyding, J. W., Oct 9 2000, In : Applied Physics Letters. 77, 15, p. 2358-2360 3 p.

Research output: Contribution to journalArticle

A scanning tunneling microscopy study: Si/SiO 2 : Interface roughness induced by chemical etching

Yu, J., Liu, L. & Lyding, J. W., Dec 1 2004, Scanning-Probe and Other Novel Microscopies of Local Phenomena in Nanostructured Materials. p. 44-49 6 p. (Materials Research Society Symposium Proceedings; vol. 838).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Atomic-level study of the robustness of the Si(100)-2X1:H surface following exposure to ambient conditions

Hersam, M. C., Guisinger, N. P., Lyding, J. W., Thompson, D. S. & Moore, J. S., Feb 12 2001, In : Applied Physics Letters. 78, 7, p. 886-888 3 p.

Research output: Contribution to journalArticle

Atomic precision lithography on Si

Randall, J. N., Lyding, J. W., Schmucker, S., Von Ehr, J. R., Ballard, J., Saini, R., Xu, H. & Ding, Y., Dec 1 2009, In : Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures. 27, 6, p. 2764-2768 5 p.

Research output: Contribution to journalArticle

Atomic precision patterning on Si: An opportunity for a digitized process

Randall, J. N., Ballard, J. B., Lyding, J. W., Schmucker, S., Von Ehr, J. R., Saini, R., Xu, H. & Ding, Y., May 1 2010, In : Microelectronic Engineering. 87, 5-8, p. 955-958 4 p.

Research output: Contribution to journalArticle

Atomic-scale desorption through electronic and vibrational excitation mechanisms

Shen, T. C., Wang, C., Abeln, G. C., Tucker, J. R., Lyding, J. W., Avouris, P. & Walkup, R. E., Jan 1 1995, In : Science. 268, 5217, p. 1590-1592 3 p.

Research output: Contribution to journalArticle

Atomic-scale electrical characterization of carbon nanotubes on silicon surfaces with the UHV-STM

Albrecht, P. M. & Lyding, J. W., Dec 1 2005, 2005 IEEE Workshop on Microelectronics and Electron Devices, WMED. p. 49-52 4 p. 1431615. (2005 IEEE Workshop on Microelectronics and Electron Devices, WMED; vol. 2005).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Atomic-scale evidence for potential barriers and strong carrier scattering at graphene grain boundaries: A scanning tunneling microscopy study

Koepke, J. C., Wood, J. D., Estrada, D., Ong, Z. Y., He, K. T., Pop, E. & Lyding, J. W., Jan 22 2013, In : ACS Nano. 7, 1, p. 75-86 12 p.

Research output: Contribution to journalArticle

Atomic-scale study of scattering and electronic properties of CVD graphene grain boundaries

Koepke, J. C., Wood, J. D., Estrada, D., Ong, Z. Y., Xiong, F., Pop, E. & Lyding, J. W., Nov 22 2012, 2012 12th IEEE International Conference on Nanotechnology, NANO 2012. 6322107. (Proceedings of the IEEE Conference on Nanotechnology).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Atom-resolved three-dimensional mapping of boron dopants in Si(100) by scanning tunneling microscopy

Liu, L., Yu, J. & Lyding, J. W., Jan 15 2001, In : Applied Physics Letters. 78, 3, p. 386-388 3 p.

Research output: Contribution to journalArticle

Breaking individual chemical bonds via STM-induced excitations

Avouris, P., Walkup, R. E., Rossi, A. R., Akpati, H. C., Nordlander, P., Shen, T. C., Abeln, G. C. & Lyding, J. W., Aug 1 1996, In : Surface Science. 363, 1-3, p. 368-377 10 p.

Research output: Contribution to journalArticle

Buried channel silicon-on-insulator MOSFETs for hot-electron spectroscopy

Yang, J., Thornton, T. J., Goodnick, S. M., Kozicki, M. & Lyding, J. W., Mar 1 2002, In : Physica B: Condensed Matter. 314, 1-4, p. 354-357 4 p.

Research output: Contribution to journalArticle

Carbon nanotube alignment using meniscus action

Wood, J. D. & Lyding, J. W., Dec 1 2009, 2009 9th IEEE Conference on Nanotechnology, IEEE NANO 2009. p. 475-476 2 p. 5394701. (2009 9th IEEE Conference on Nanotechnology, IEEE NANO 2009).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Carbon nanotubes: A simple approach to superlattices

Lyding, J. W., Sep 2009, In : Nature Nanotechnology. 4, 9, p. 545-546 2 p.

Research output: Contribution to journalShort survey

Carbon nanotubes on partially depassivated n -doped Si (100) - (2×1): H substrates

Barraza-Lopez, S., Albrecht, P. M. & Lyding, J. W., Aug 6 2009, In : Physical Review B - Condensed Matter and Materials Physics. 80, 4, 045415.

Research output: Contribution to journalArticle

Carrier profiling via scanning tunneling spectroscopy: Comparison with scanning capacitance microscopy

Liu, F. Y., Griffin, P. B., Plummer, J. D., Lyding, J. W., Moran, J. M., Richards, J. F. & Kulig, L., Jan 1 2004, In : Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures. 22, 1, p. 422-426 5 p.

Research output: Contribution to journalArticle

Chalcogenide-based 2D materials: Intrinsic nanoscale patterning

Lyding, J. W., Jul 1 2017, In : Nature Materials. 16, 7, p. 706-707 2 p.

Research output: Contribution to journalComment/debate

Charge-density-wave transport in quasi-one-dimensional conductors. I. Current oscillations

Thorne, R. E., Lyons, W. G., Lyding, J. W., Tucker, J. R. & Bardeen, J., Jan 1 1987, In : Physical Review B. 35, 12, p. 6348-6359 12 p.

Research output: Contribution to journalArticle

Charge-density-wave transport in quasi-one-dimensional conductors. II. ac-dc interference phenomena

Thorne, R. E., Lyons, W. G., Lyding, J. W., Tucker, J. R. & Bardeen, J., Jan 1 1987, In : Physical Review B. 35, 12, p. 6360-6372 13 p.

Research output: Contribution to journalArticle

Coexistence of two diffusion mechanisms: W on W(100)

Olewicz, T., Antczak, G., Jurczyszyn, L., Lyding, J. W. & Ehrlich, G., Jun 9 2014, In : Physical Review B - Condensed Matter and Materials Physics. 89, 23, 235408.

Research output: Contribution to journalArticle

COFACIALLY LINKED METALLOMACROCYCLIC CONDUCTIVE POLYMERS. HALOGEN DOPANT LEVEL AND MACROMOLECULE ARCHITECTURE, ELECTRONIC STRUCTURE, AND CHARGE TRANSPORT.

Diel, B. N., Inabe, T., Lyding, J. W., Schoch, K. F., Kannewurf, C. R. & Marks, T. J., Mar 1 1982, In : American Chemical Society, Polymer Preprints, Division of Polymer Chemistry. 23, 1, p. 124-125 2 p.

Research output: Contribution to journalConference article

Communication: An obligatory glass surface

Ashtekar, S., Nguyen, D., Zhao, K., Lyding, J., Wang, W. H. & Gruebele, M., Oct 14 2012, In : Journal of Chemical Physics. 137, 14, 141102.

Research output: Contribution to journalArticle

Comparison of n- and p-type InGaAs/InP quantum well infrared photodetectors

Sengupta, D. K., Malin, J. L., Jackson, S. I., Fang, W., Wu, W., Kuo, H. C., Rowe, C., Chuang, S. L., Hsieh, K. C., Tucker, J. R., Lyding, J. W., Feng, M., Stillman, G. E. & Liu, H. C., Dec 1 1996, In : Materials Research Society Symposium - Proceedings. 421, p. 203-208 6 p.

Research output: Contribution to journalConference article

Composition-dependent metallic glass alloys correlate atomic mobility with collective glass surface dynamics

Nguyen, D., Zhu, Z. G., Pringle, B., Lyding, J., Wang, W. H. & Gruebele, M., Jan 1 2016, In : Physical Chemistry Chemical Physics. 18, 25, p. 16856-16861 6 p.

Research output: Contribution to journalArticle

Computer Automated Charge Transport Measurement System

Lyding, J. W., Marks, T. J., Marcy, H. O. & Kannewurf, C. R., Mar 1988, In : IEEE Transactions on Instrumentation and Measurement. 37, 1, p. 76-80 5 p.

Research output: Contribution to journalArticle

Cryogenic UHV-STM study of hydrogen and deuterium desorption from Si(100)

Foley, E. T., Kam, A. F., Lyding, J. W. & Avouris, P., Jan 1 1998, In : Physical review letters. 80, 6, p. 1336-1339 4 p.

Research output: Contribution to journalArticle

Cryogenic variable temperature ultrahigh vacuum scanning tunneling microscope

Foley, E. T., Kam, A. F. & Lyding, J. W., Sep 2000, In : Review of Scientific Instruments. 71, 9, p. 3428-3435 8 p.

Research output: Contribution to journalArticle

Current oscillations in charge-density-wave transport

Thorne, R. E., Lyons, W. G., Miller, J. H., Lyding, J. W. & Tucker, J. R., Jan 1 1986, In : Physical Review B. 34, 8, p. 5988-5991 4 p.

Research output: Contribution to journalArticle

Deposition and STM investigation of single-walled carbon nanotubes on GaAs(110)

Ruppalt, L. B., Albrecht, P. M. & Lyding, J. W., Dec 1 2004, 2004 4th IEEE Conference on Nanotechnology. p. 13-15 3 p. (2004 4th IEEE Conference on Nanotechnology).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Design and operation of a variable temperature scanning tunnelling microscope

Lyding, J. W., Skala, S., Hubacek, J. S., Brockenbrough, R. & Gammie, G., 1988, In : Journal of Microscopy. 152, 2, p. 371-378 8 p.

Research output: Contribution to journalArticle