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Research Output 1980 2019

Ac-dc interference, complete mode locking, and origin of coherent oscillations in sliding charge-density-wave systems

Thorne, R. E., Hubacek, J. S., Lyons, W. G., Lyding, J. W. & Tucker, J. R., Jan 1 1988, In : Physical Review B. 37, 17, p. 10055-10067 13 p.

Research output: Contribution to journalArticle

locking
sliding
interference
oscillations
harmonics

Adsorption of cobalt phthalocyanine on Si(1 0 0)2 × 1 and Si(1 0 0)2 × 1:H surfaces studied by scanning tunneling microscopy and spectroscopy

Liu, L., Yu, J., Viernes, N. O. L., Moore, J. S. & Lyding, J. W., Sep 10 2002, In : Surface Science. 516, 1-2, p. 118-126 9 p.

Research output: Contribution to journalArticle

Scanning tunneling microscopy
scanning tunneling microscopy
Cobalt
cobalt
Spectroscopy

Alternative approach for modeling the hot carrier degradation of the Si/SiO2 interface

Chen, Z., Lee, J. & Lyding, J. W., Jan 1 1998, In : Materials Research Society Symposium - Proceedings. 513, p. 313-317 5 p.

Research output: Contribution to journalConference article

Hot carriers
degradation
Degradation
traps
approximation

An alternative interpretation of hot electron interface degradation in NMOSFET's: Isotope results irreconcilable with major defect generation by holes?

Hess, K., Lee, J., Chen, Z., Lyding, J. W., Kim, Y. K., Kim, B. S., Lee, Y. H., Kim, Y. W. & Suh, K. P., Dec 1 1999, In : IEEE Transactions on Electron Devices. 46, 9, p. 1914-1916 3 p.

Research output: Contribution to journalArticle

Hot electrons
Isotopes
Degradation
Oxides
Defects

An Analytical Model to Project MOS Transistor Lifetime Improvement by Deuterium Passivation of Interface Traps

Cheng, K. & Lyding, J. W., Oct 1 2003, In : IEEE Electron Device Letters. 24, 10, p. 655-657 3 p.

Research output: Contribution to journalArticle

Hot carriers
Deuterium
MOSFET devices
Passivation
Analytical models

A new technique to quantify deuterium passivation of interface traps in MOS devices

Cheng, K., Hess, K. & Lyding, J. W., May 1 2001, In : IEEE Electron Device Letters. 22, 5, p. 203-205 3 p.

Research output: Contribution to journalArticle

MOS devices
Deuterium
Passivation
Hydrogen
Silicon oxides

Annealing free, clean graphene transfer using alternative polymer scaffolds

Wood, J. D., Doidge, G. P., Carrion, E. A., Koepke, J. C., Kaitz, J. A., Datye, I., Behnam, A., Hewaparakrama, J., Aruin, B., Chen, Y., Dong, H., Haasch, R. T., Lyding, J. W. & Pop, E., Jun 6 2015, In : Nanotechnology. 26, 5, 055302.

Research output: Contribution to journalArticle

Graphite
Polymethyl Methacrylate
Scaffolds
Graphene
Polymers

Application of high pressure deuterium annealing for improving the hot carrier reliability of CMOS transistors

Jinju, L., Cheng, K., Chen, Z., Hess, K., Lyding, J. W., Young-Kwang, K., Seung, L., Young-Wug, K. & Kwang-Pyuk, S., May 1 2000, In : IEEE Electron Device Letters. 21, 5, p. 221-223 3 p.

Research output: Contribution to journalArticle

Hot carriers
Deuterium
Transistors
Annealing
Secondary ion mass spectrometry

Application of the deuterium sintering process to improve the device design rule in reducing plasma induced damages

Kim, Y. K., Lee, S. H., Lee, H. S., Kim, B. S., Lee, Y. H., Lee, J., Cheng, K., Chen, Z., Hess, K. & Lyding, J. W., Dec 1 1999, p. 65-68. 4 p.

Research output: Contribution to conferencePaper

Deuterium
Sintering
Plasmas
Interface states
Electrodes
selective surfaces
nanofabrication
Chemisorption
Nanotechnology
chemisorption

Approach for efficiently locating and electrically contacting nanostructures fabricated via UHV-STM lithography on Si(100)

Hersam, M. C., Abeln, G. C. & Lyding, J. W., Jun 1999, In : Microelectronic Engineering. 47, 1, p. 235-237 3 p.

Research output: Contribution to journalConference article

nanofabrication
p-n junctions
Lithography
Nanostructures
lithography

Approach to enhance deuterium incorporation for improved hot carrier reliability in metal-oxide-semiconductor devices

Cheng, K., Lee, J. & Lyding, J. W., Oct 9 2000, In : Applied Physics Letters. 77, 15, p. 2358-2360 3 p.

Research output: Contribution to journalArticle

semiconductor devices
metal oxide semiconductors
deuterium
hydrogen
transistors

A scanning tunneling microscopy study: Si/SiO 2 : Interface roughness induced by chemical etching

Yu, J., Liu, L. & Lyding, J. W., Dec 1 2004, Scanning-Probe and Other Novel Microscopies of Local Phenomena in Nanostructured Materials. p. 44-49 6 p. (Materials Research Society Symposium Proceedings; vol. 838).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Scanning tunneling microscopy
scanning tunneling microscopy
Etching
roughness
Surface roughness

Atomic-level study of the robustness of the Si(100)-2X1:H surface following exposure to ambient conditions

Hersam, M. C., Guisinger, N. P., Lyding, J. W., Thompson, D. S. & Moore, J. S., Feb 12 2001, In : Applied Physics Letters. 78, 7, p. 886-888 3 p.

Research output: Contribution to journalArticle

x ray spectroscopy
scanning tunneling microscopy
photoelectron spectroscopy
nanofabrication
meteorology

Atomic precision lithography on Si

Randall, J. N., Lyding, J. W., Schmucker, S., Von Ehr, J. R., Ballard, J., Saini, R., Xu, H. & Ding, Y., Dec 1 2009, In : Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures. 27, 6, p. 2764-2768 5 p.

Research output: Contribution to journalArticle

Lithography
lithography
Hydrogen
Atomic layer epitaxy
Silicon

Atomic precision patterning on Si: An opportunity for a digitized process

Randall, J. N., Ballard, J. B., Lyding, J. W., Schmucker, S., Von Ehr, J. R., Saini, R., Xu, H. & Ding, Y., May 1 2010, In : Microelectronic Engineering. 87, 5-8, p. 955-958 4 p.

Research output: Contribution to journalArticle

Atoms
atoms
Fabrication
fabrication
complex systems
Single-walled carbon nanotubes (SWCN)
Microscopes
carbon nanotubes
microscopes
Scanning
Ultrahigh vacuum
Single-walled carbon nanotubes (SWCN)
Nanotubes
ultrahigh vacuum
nanotubes

Atomic-scale desorption through electronic and vibrational excitation mechanisms

Shen, T. C., Wang, C., Abeln, G. C., Tucker, J. R., Lyding, J. W., Avouris, P. & Walkup, R. E., Jan 1 1995, In : Science. 268, 5217, p. 1590-1592 3 p.

Research output: Contribution to journalArticle

Electrons
Hydrogen
Silicon
Heating

Atomic-scale electrical characterization of carbon nanotubes on silicon surfaces with the UHV-STM

Albrecht, P. M. & Lyding, J. W., Dec 1 2005, 2005 IEEE Workshop on Microelectronics and Electron Devices, WMED. p. 49-52 4 p. 1431615. (2005 IEEE Workshop on Microelectronics and Electron Devices, WMED; vol. 2005).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Ultrahigh vacuum
Single-walled carbon nanotubes (SWCN)
Carbon nanotubes
Microscopes
Scanning

Atomic-scale evidence for potential barriers and strong carrier scattering at graphene grain boundaries: A scanning tunneling microscopy study

Koepke, J. C., Wood, J. D., Estrada, D., Ong, Z. Y., He, K. T., Pop, E. & Lyding, J. W., Jan 22 2013, In : ACS Nano. 7, 1, p. 75-86 12 p.

Research output: Contribution to journalArticle

Graphite
Scanning tunneling microscopy
Graphene
scanning tunneling microscopy
graphene

Atomic-scale study of scattering and electronic properties of CVD graphene grain boundaries

Koepke, J. C., Wood, J. D., Estrada, D., Ong, Z. Y., Xiong, F., Pop, E. & Lyding, J. W., Nov 22 2012, 2012 12th IEEE International Conference on Nanotechnology, NANO 2012. 6322107. (Proceedings of the IEEE Conference on Nanotechnology).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Graphite
Electronic properties
Graphene
Chemical vapor deposition
graphene

Atom-resolved three-dimensional mapping of boron dopants in Si(100) by scanning tunneling microscopy

Liu, L., Yu, J. & Lyding, J. W., Jan 15 2001, In : Applied Physics Letters. 78, 3, p. 386-388 3 p.

Research output: Contribution to journalArticle

scanning tunneling microscopy
boron
atoms
ultrahigh vacuum
electronic structure

Breaking individual chemical bonds via STM-induced excitations

Avouris, P., Walkup, R. E., Rossi, A. R., Akpati, H. C., Nordlander, P., Shen, T. C., Abeln, G. C. & Lyding, J. W., Aug 1 1996, In : Surface Science. 363, 1-3, p. 368-377 10 p.

Research output: Contribution to journalArticle

Chemical bonds
chemical bonds
Desorption
Atoms
desorption
Bromine
Halogens
bromine
palladium
Palladium

Buried channel silicon-on-insulator MOSFETs for hot-electron spectroscopy

Yang, J., Thornton, T. J., Goodnick, S. M., Kozicki, M. & Lyding, J. W., Mar 1 2002, In : Physica B: Condensed Matter. 314, 1-4, p. 354-357 4 p.

Research output: Contribution to journalArticle

Hot carriers
Electron spectroscopy
Hot electrons
Silicon
hot electrons

Carbon nanotube alignment using meniscus action

Wood, J. D. & Lyding, J. W., Dec 1 2009, 2009 9th IEEE Conference on Nanotechnology, IEEE NANO 2009. p. 475-476 2 p. 5394701. (2009 9th IEEE Conference on Nanotechnology, IEEE NANO 2009).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Carbon Nanotubes
Single-walled carbon nanotubes (SWCN)
Carbon nanotubes
Nanoelectronics
Electrophoresis

Carbon nanotubes: A simple approach to superlattices

Lyding, J. W., Sep 2009, In : Nature Nanotechnology. 4, 9, p. 545-546 2 p.

Research output: Contribution to journalShort survey

Carbon Nanotubes
Superlattices
Crystallization
Nanotechnology
Nanostructured materials

Carbon nanotubes on partially depassivated n -doped Si (100) - (2×1): H substrates

Barraza-Lopez, S., Albrecht, P. M. & Lyding, J. W., Aug 6 2009, In : Physical Review B - Condensed Matter and Materials Physics. 80, 4, 045415.

Research output: Contribution to journalArticle

Carbon Nanotubes
Carbon nanotubes
carbon nanotubes
Hydrogen
Ultrahigh vacuum

Carrier profiling via scanning tunneling spectroscopy: Comparison with scanning capacitance microscopy

Liu, F. Y., Griffin, P. B., Plummer, J. D., Lyding, J. W., Moran, J. M., Richards, J. F. & Kulig, L., Jan 1 2004, In : Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures. 22, 1, p. 422-426 5 p.

Research output: Contribution to journalArticle

Microscopic examination
Capacitance
capacitance
Spectroscopy
microscopy

Chalcogenide-based 2D materials: Intrinsic nanoscale patterning

Lyding, J. W., Jul 1 2017, In : Nature Materials. 16, 7, p. 706-707 2 p.

Research output: Contribution to journalComment/debate

Graphite
Scanning tunneling microscopy
Graphene
Nanoelectronics
Ultrahigh vacuum

Charge-density-wave transport in quasi-one-dimensional conductors. I. Current oscillations

Thorne, R. E., Lyons, W. G., Lyding, J. W., Tucker, J. R. & Bardeen, J., Jan 1 1987, In : Physical Review B. 35, 12, p. 6348-6359 12 p.

Research output: Contribution to journalArticle

conductors
oscillations
impurities
crystal defects
velocity distribution

Charge-density-wave transport in quasi-one-dimensional conductors. II. ac-dc interference phenomena

Thorne, R. E., Lyons, W. G., Lyding, J. W., Tucker, J. R. & Bardeen, J., Jan 1 1987, In : Physical Review B. 35, 12, p. 6360-6372 13 p.

Research output: Contribution to journalArticle

conductors
interference
harmonics
oscillations
thresholds
Carbon Nanotubes
Charge transfer
Single-walled carbon nanotubes (SWCN)
Carbon nanotubes
Nanotubes

Coexistence of two diffusion mechanisms: W on W(100)

Olewicz, T., Antczak, G., Jurczyszyn, L., Lyding, J. W. & Ehrlich, G., Jun 9 2014, In : Physical Review B - Condensed Matter and Materials Physics. 89, 23, 235408.

Research output: Contribution to journalArticle

Adatoms
Surface diffusion
Activation energy
Ion microscopes
surface diffusion
Pyrazines
Halogens
halogen
optical property
Transport properties
Macromolecules
Oxidants
oxidant
Band structure
Metals

COFACIALLY LINKED METALLOMACROCYCLIC CONDUCTIVE POLYMERS. HALOGEN DOPANT LEVEL AND MACROMOLECULE ARCHITECTURE, ELECTRONIC STRUCTURE, AND CHARGE TRANSPORT.

Diel, B. N., Inabe, T., Lyding, J. W., Schoch, K. F., Kannewurf, C. R. & Marks, T. J., Mar 1 1982, In : American Chemical Society, Polymer Preprints, Division of Polymer Chemistry. 23, 1, p. 124-125 2 p.

Research output: Contribution to journalConference article

Halogens
Macromolecules
Electronic structure
Charge transfer
Polymers

Communication: An obligatory glass surface

Ashtekar, S., Nguyen, D., Zhao, K., Lyding, J., Wang, W. H. & Gruebele, M., Oct 14 2012, In : Journal of Chemical Physics. 137, 14, 141102.

Research output: Contribution to journalArticle

communication
Glass
glass
Communication
Melting point

Comparison of n- and p-type InGaAs/InP quantum well infrared photodetectors

Sengupta, D. K., Malin, J. L., Jackson, S. I., Fang, W., Wu, W., Kuo, H. C., Rowe, C., Chuang, S. L., Hsieh, K. C., Tucker, J. R., Lyding, J. W., Feng, M., Stillman, G. E. & Liu, H. C., Dec 1 1996, In : Materials Research Society Symposium - Proceedings. 421, p. 203-208 6 p.

Research output: Contribution to journalConference article

Quantum well infrared photodetectors
quantum well infrared photodetectors
Molecular beams
molecular beams
Gases

Composition-dependent metallic glass alloys correlate atomic mobility with collective glass surface dynamics

Nguyen, D., Zhu, Z. G., Pringle, B., Lyding, J., Wang, W. H. & Gruebele, M., Jan 1 2016, In : Physical Chemistry Chemical Physics. 18, 25, p. 16856-16861 6 p.

Research output: Contribution to journalArticle

atomic mobilities
Metallic glass
metallic glasses
Glass
glass

Computer Automated Charge Transport Measurement System

Lyding, J. W., Marks, T. J., Marcy, H. O. & Kannewurf, C. R., Mar 1988, In : IEEE Transactions on Instrumentation and Measurement. 37, 1, p. 76-80 5 p.

Research output: Contribution to journalArticle

Hall effect
Magnetoresistance
Charge transfer
conductivity
configurations

Cryogenic UHV-STM study of hydrogen and deuterium desorption from Si(100)

Foley, E. T., Kam, A. F., Lyding, J. W. & Avouris, P., Jan 1 1998, In : Physical review letters. 80, 6, p. 1336-1339 4 p.

Research output: Contribution to journalArticle

cryogenics
deuterium
desorption
hydrogen
isotope effect

Cryogenic variable temperature ultrahigh vacuum scanning tunneling microscope

Foley, E. T., Kam, A. F. & Lyding, J. W., Sep 2000, In : Review of Scientific Instruments. 71, 9, p. 3428-3435 8 p.

Research output: Contribution to journalArticle

Ultrahigh vacuum
Cryogenics
ultrahigh vacuum
cryogenics
Microscopes

Current oscillations in charge-density-wave transport

Thorne, R. E., Lyons, W. G., Miller, J. H., Lyding, J. W. & Tucker, J. R., Jan 1 1986, In : Physical Review B. 34, 8, p. 5988-5991 4 p.

Research output: Contribution to journalArticle

Charge density waves
Crystal defects
Dislocations (crystals)
Electric fields
oscillations

Deposition and STM investigation of single-walled carbon nanotubes on GaAs(110)

Ruppalt, L. B., Albrecht, P. M. & Lyding, J. W., Dec 1 2004, 2004 4th IEEE Conference on Nanotechnology. p. 13-15 3 p. (2004 4th IEEE Conference on Nanotechnology).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Single-walled carbon nanotubes (SWCN)
Microscopes
Scanning
Energy gap
Substrates
scanning tunneling microscopy
Doping (additives)
Scanning tunneling microscopy
arsenic
ultrahigh vacuum

Design and operation of a variable temperature scanning tunnelling microscope

Lyding, J. W., Skala, S., Hubacek, J. S., Brockenbrough, R. & Gammie, G., 1988, In : Journal of Microscopy. 152, 2, p. 371-378 8 p.

Research output: Contribution to journalArticle

Temperature
Hot Temperature
Vibration