1989 …2019
If you made any changes in Pure, your changes will be visible here soon.

Research Output 1989 2019

Filter
Conference article
2014

A co-optimization methodology on ESD robustness and functionality for pad-ring circuitry

Meng, K. H., Gerdemann, A., Miller, J. W. & Rosenbaum, E., Nov 26 2014, In : Electrical Overstress/Electrostatic Discharge Symposium Proceedings. 2014-November, November

Research output: Contribution to journalConference article

A mechanism for logic upset induced by power-on ESD

Xiu, Y., Thomson, N., Mertens, R. & Rosenbaum, E., Nov 26 2014, In : Electrical Overstress/Electrostatic Discharge Symposium Proceedings. 2014-November, November

Research output: Contribution to journalConference article

Transistors

Custom test chip for system-level ESD investinvestigations

Thomson, N., Xiu, Y., Mertens, R., Keel, M. S. & Rosenbaum, E., Nov 26 2014, In : Electrical Overstress/Electrostatic Discharge Symposium Proceedings. 2014-November, November

Research output: Contribution to journalConference article

Logic circuits
Transmitters
Detectors
Monitoring
Testing

Theory of active clamp response to power-on ESD and implications for power supply integrity

Mertens, R., Thomson, N., Xiu, Y. & Rosenbaum, E., Nov 26 2014, In : Electrical Overstress/Electrostatic Discharge Symposium Proceedings. 2014-November, November

Research output: Contribution to journalConference article

Trigger circuits
Clamping devices
Bandwidth
Networks (circuits)
2008

A dual-base triggered SCR with very low leakage current and adjustable trigger voltage

Sarro, J. D., Vashchenko, V., Rosenbaum, E. & Hopper, P., Dec 1 2008, In : Electrical Overstress/Electrostatic Discharge Symposium Proceedings. p. 242-248 7 p., 4772140.

Research output: Contribution to journalConference article

Trigger circuits
Thyristors
Leakage currents
Electric potential

Small footprint trigger voltage control circuit for mixed-voltage applications

Olson, N., Vashchenko, V., Rosenbaum, E. & Hopper, P., Dec 1 2008, In : Electrical Overstress/Electrostatic Discharge Symposium Proceedings. p. 196-203 8 p., 4772134.

Research output: Contribution to journalConference article

Voltage control
Networks (circuits)
Electric potential

Voltage clamping requirements for ESD protection of inputs in 90nm CMOS technology

Lee, J. & Rosenbaum, E., Dec 1 2008, In : Electrical Overstress/Electrostatic Discharge Symposium Proceedings. p. 50-58 9 p., 4772114.

Research output: Contribution to journalConference article

Electric breakdown
Gate dielectrics
Electric potential
Transistors
Degradation
2005

On-Chip ESD protection for RF I/Os: Devices, circuits and models

Rosenbaum, E. & Hyvonen, S., Dec 1 2005, In : Proceedings - IEEE International Symposium on Circuits and Systems. p. 1202-1205 4 p., 1464809.

Research output: Contribution to journalConference article

Networks (circuits)
2004

Noise characterization of static CMOS gates

Kanj, R., Lehner, T., Agrawal, B. & Rosenbaum, E., Sep 20 2004, In : Proceedings - Design Automation Conference. p. 888-893 6 p.

Research output: Contribution to journalConference article

Logic gates
Equivalent circuits
Mathematical models
Networks (circuits)
2003

A Verilog-A compact model for ESD protection NMOSTs

Li, J., Joshi, S. & Rosenbaum, E., Nov 19 2003, In : Proceedings of the Custom Integrated Circuits Conference. p. 253-256 4 p.

Research output: Contribution to journalConference article

Computer hardware description languages
Simulators
Networks (circuits)
2002

Comprehensive frequency-dependent substrate noise analysis using boundary element methods

Li, H., Carballido, J., Yu, H. H., Okhmatovski, V. I., Rosenbaum, E. & Cangellaris, A. C., Dec 1 2002, In : IEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers. p. 2-9 8 p.

Research output: Contribution to journalConference article

Boundary element method
Substrates
Electrodynamics
Green's function
Doping (additives)
2001

A novel SCR macromodel for ESD circuit simulation

Juliano, P. A. & Rosenbaum, E., Dec 1 2001, In : Technical Digest - International Electron Devices Meeting. p. 319-322 4 p.

Research output: Contribution to journalConference article

silicon controlled rectifiers
Electrostatic discharge
Circuit simulation
Thyristors
electrostatics
2000

Breakdown and latent damage of ultra-thin gate oxides under ESD stress conditions

Wu, J., Juliano, P. & Rosenbaum, E., Dec 1 2000, In : Electrical Overstress/Electrostatic Discharge Symposium Proceedings. p. 287-295 9 p.

Research output: Contribution to journalConference article

breakdown
damage
oxides
pulse duration
traps

Electrostatic discharge characterization of epitaxial-base silicon-germanium heterojunction bipolar transistors

Voldman, S., Juliano, P., Schmidt, N., Johnson, R., Lanzerotti, L., Joseph, A., Brennan, C., Dunn, J., Harame, D., Rosenbaum, E. & Meyerson, B., Dec 1 2000, In : Electrical Overstress/Electrostatic Discharge Symposium Proceedings. p. 239-250 12 p.

Research output: Contribution to journalConference article

bipolar transistors
accumulators
heterojunctions
germanium
electrostatics

Electrothermal modeling of ESD diodes in bulk-Si and SOI technologies

Wang, Y., Juliano, P., Joshi, S. & Rosenbaum, E., Dec 1 2000, In : Electrical Overstress/Electrostatic Discharge Symposium Proceedings. p. 430-436 7 p.

Research output: Contribution to journalConference article

SOI (semiconductors)
diodes
simulators
high current
breakdown
1999

Substrate modeling and lumped substrate resistance extraction for CMOS ESD/latchup circuit simulation

Li, T., Tsai, C. H., Rosenbaum, E. & Kang, S. M., Jan 1 1999, In : Proceedings - Design Automation Conference. p. 549-554 6 p.

Research output: Contribution to journalConference article

Electrostatic discharge
Circuit simulation
Substrates
Networks (circuits)
Integrated circuit layout
1998

Modeling, extraction and simulation of CMOS I/O circuits under ESD stress

Li, T., Tsai, C. H., Rosenbaum, E. & Kang, S. M., Jan 1 1998, In : Proceedings - IEEE International Symposium on Circuits and Systems. 6, p. 389-392 4 p.

Research output: Contribution to journalConference article

Networks (circuits)
Computer aided design
Substrates
Simulators

Optimum design for a two-stage CMOS I/O ESD protection circuit

Li, T., Bendix, P., Suh, D., Huh, Y. J., Rosenbaum, E., Kapoor, A. & Kang, S. M., Jan 1 1998, In : Proceedings - IEEE International Symposium on Circuits and Systems. 2, p. 113-116 4 p.

Research output: Contribution to journalConference article

Resistors
Networks (circuits)
Optimum design
Industry
1997

Study of a CMOS I/O protection circuit using circuit-level simulation

Li, T., Suh, D., Ramaswamy, S., Bendix, P., Rosenbaum, E., Kapoor, A. & Kang, S. M., Jan 1 1997, In : Annual Proceedings - Reliability Physics (Symposium). p. 333-338 6 p.

Research output: Contribution to journalConference article

Networks (circuits)
Experiments
1996

Circuit-level simulation of CDM-ESD and EOS in submicron MOS devices

Ramaswamy, S., Li, E., Rosenbaum, E. & Kang, S. M., Dec 1 1996, In : Electrical Overstress/Electrostatic Discharge Symposium Proceedings. p. 316-321 6 p.

Research output: Contribution to journalConference article

simulation
breakdown
simulators
temperature

Hierarchical electromigration reliability diagnosis for VLSI interconnects

Teng, C. C., Cheng, Y. K., Rosenbaum, E. & Kang, S. M., Jan 1 1996, In : Proceedings - Design Automation Conference. p. 752-757 6 p.

Research output: Contribution to journalConference article

Electromigration
Computer aided design
Networks (circuits)

Improvement on chip-level electrothermal simulator - ILLIADS-T

Cheng, Y. K., Rosenbaum, E. & Kang, S. M., Jan 1 1996, In : Proceedings - IEEE International Symposium on Circuits and Systems. 4, p. 432-435 4 p.

Research output: Contribution to journalConference article

Simulators
Heat transfer
Networks (circuits)
Composite materials
1995

EOS/ESD protection circuit design for deep submicron SOI technology

Ramaswamy, S., Raha, P., Rosenbaum, E. & Kang, S. M., Dec 1 1995, In : Electrical Overstress/Electrostatic Discharge Symposium Proceedings. p. 212-217 6 p.

Research output: Contribution to journalConference article

circuit protection
insulators
silicon
failure modes
immunity

Fast timing simulation for submicron hot-carrier degradation

Sun, W., Rosenbaum, E. & Kang, S. M., Jan 1 1995, In : Annual Proceedings - Reliability Physics (Symposium). p. 65-71 7 p.

Research output: Contribution to journalConference article

Hot carriers
Transistors
CMOS integrated circuits
Degradation
Integrated circuits