1989 …2019
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Research Output 1989 2019

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Article
2019

Measurement and simulation of on-chip supply noise induced by system-level ESD

Xiu, Y., Thomson, N. & Rosenbaum, E., Mar 2019, In : IEEE Transactions on Device and Materials Reliability. 19, 1, p. 211-220 10 p., 8640259.

Research output: Contribution to journalArticle

Networks (circuits)
Circuit simulation
Electric potential
Flip flop circuits
2017

ESD self-protection of high-speed transceivers using adaptive active bias conditioning

Keel, M. S. & Rosenbaum, E., Mar 2017, In : IEEE Transactions on Device and Materials Reliability. 17, 1, p. 113-120 8 p., 7744493.

Research output: Contribution to journalArticle

Electrostatic discharge
Transceivers
Failure analysis
Electric lines
Transistors

Soft-Failures Induced by System-Level ESD

Thomson, N. A., Xiu, Y. & Rosenbaum, E., Mar 2017, In : IEEE Transactions on Device and Materials Reliability. 17, 1, p. 90-98 9 p., 7851026.

Research output: Contribution to journalArticle

Magnetic couplings
Earth (planet)
Derivatives
Networks (circuits)
Substrates
2016

A Study of BER-Optimal ADC-Based Receiver for Serial Links

Lin, Y., Keel, M. S., Faust, A., Xu, A., Shanbhag, N. R., Rosenbaum, E. & Singer, A. C., May 2016, In : IEEE Transactions on Circuits and Systems I: Regular Papers. 63, 5, p. 693-704 12 p., 7486052.

Research output: Contribution to journalArticle

Digital to analog conversion
Bit error rate
Energy dissipation
Throughput

CDM-reliable T-coil techniques for a 25-Gb/s wireline receiver front-end

Keel, M. S. & Rosenbaum, E., Dec 2016, In : IEEE Transactions on Device and Materials Reliability. 16, 4, p. 513-520 8 p., 7523221.

Research output: Contribution to journalArticle

Electrostatic discharge
Magnetic couplings
Inductance
Networks (circuits)
Equalizers

Compact distributed multi-finger MOSFET model for circuit-level ESD simulation

Meng, K. H., Chen, Z. & Rosenbaum, E., Aug 1 2016, In : Microelectronics Reliability. 63, p. 11-21 11 p.

Research output: Contribution to journalArticle

field effect transistors
Networks (circuits)
simulation
Heating
Parameter extraction

Full-component modeling and simulation of charged device model ESD

Meng, K. H., Shukla, V. & Rosenbaum, E., Jul 2016, In : IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 35, 7, p. 1105-1113 9 p., 7308012.

Research output: Contribution to journalArticle

Electrostatic discharge
Circuit simulation
Equivalent circuits
Integrated circuits
Networks (circuits)

Physical basis for CMOS SCR compact models

Mertens, R. & Rosenbaum, E., Jan 1 2016, In : IEEE Transactions on Electron Devices. 63, 1, p. 296-302 7 p., 7365555.

Research output: Contribution to journalArticle

Thyristors
Bipolar transistors
Silicon
Physics
2015

Analysis of active-clamp response to power-on ESD: Power supply integrity and performance tradeoffs

Mertens, R., Thomson, N., Xiu, Y. & Rosenbaum, E., Sep 1 2015, In : IEEE Transactions on Device and Materials Reliability. 15, 3, p. 263-271 9 p., 7177068.

Research output: Contribution to journalArticle

Clamping devices
Rails
Networks (circuits)
Transient analysis

Charged Device Model Reliability of Three-Dimensional Integrated Circuits

Shukla, V. & Rosenbaum, E., Dec 2015, In : IEEE Transactions on Device and Materials Reliability. 15, 4, p. 559-566 8 p., 7299296.

Research output: Contribution to journalArticle

Clamping devices
Circuit simulation
Silicon
Electric power distribution
Integrated circuits

Piecewise-linear model with transient relaxation for circuit-level ESD simulation

Meng, K. H., Mertens, R. & Rosenbaum, E., Sep 1 2015, In : IEEE Transactions on Device and Materials Reliability. 15, 3, p. 464-466 3 p., 7214270.

Research output: Contribution to journalArticle

Electrostatic discharge
Networks (circuits)
Finite automata
2014

Prediction of charged device model peak discharge current for microelectronic components

Shukla, V., Boselli, G., Dissegna, M., Duvvury, C., Sankaralingam, R. & Rosenbaum, E., Sep 1 2014, In : IEEE Transactions on Device and Materials Reliability. 14, 3, p. 801-809 9 p., 6862855.

Research output: Contribution to journalArticle

Microelectronics
Electrostatic discharge
2013

Comparison of FICDM and wafer-level CDM test methods

Jack, N. & Rosenbaum, E., Jul 1 2013, In : IEEE Transactions on Device and Materials Reliability. 13, 2, p. 379-387 9 p., 6515361.

Research output: Contribution to journalArticle

Integrated circuits
Induced currents
Electric lines
Networks (circuits)
Electric potential

Verification of snapback model by transient I-V measurement for circuit simulation of ESD response

Meng, K. H. & Rosenbaum, E., Jul 1 2013, In : IEEE Transactions on Device and Materials Reliability. 13, 2, p. 371-378 8 p., 6504488.

Research output: Contribution to journalArticle

Electrostatic discharge
Circuit simulation
Relaxation oscillators
Testing
2012

Diode-triggered silicon-controlled rectifier with reduced voltage overshoot for CDM ESD protection

Chen, W. Y., Rosenbaum, E. & Ker, M. D., Mar 1 2012, In : IEEE Transactions on Device and Materials Reliability. 12, 1, p. 10-14 5 p., 6163575.

Research output: Contribution to journalArticle

Thyristors
Diodes
Electric potential
Electrostatic discharge
Leakage currents
2011

Comparison of wafer-level with package-level CDM stress facilitated by real-time probing

Jack, N., Shukla, V. & Rosenbaum, E., Dec 1 2011, In : IEEE Transactions on Device and Materials Reliability. 11, 4, p. 522-530 9 p., 6006519.

Research output: Contribution to journalArticle

Electrostatic discharge
Circuit simulation
Induced currents
Electric potential

Modeling and understanding of external latchup in CMOS technologies-part I: Modeling latchup trigger current

Farbiz, F. & Rosenbaum, E., Sep 1 2011, In : IEEE Transactions on Device and Materials Reliability. 11, 3, p. 417-425 9 p., 5875872.

Research output: Contribution to journalArticle

Substrates
Networks (circuits)
Testing
Substrates
Electric potential
Temperature
2010

A scalable SCR compact model for ESD circuit simulation

Di Sarro, J. P. & Rosenbaum, E., Dec 1 2010, In : IEEE Transactions on Electron Devices. 57, 12, p. 3275-3286 12 p., 5610716.

Research output: Contribution to journalArticle

Electrostatic discharge
Circuit simulation
Thyristors
Electric potential
Heating
2009

A new compact model for external latchup

Farbiz, F. & Rosenbaum, E., Dec 1 2009, In : Microelectronics Reliability. 49, 12, p. 1447-1454 8 p.

Research output: Contribution to journalArticle

layouts
CMOS
spacing
Electric potential
electric potential

Layout optimization of ESD protection diodes for high-frequency I/Os

Bhatia, K., Jack, N. & Rosenbaum, E., Sep 1 2009, In : IEEE Transactions on Device and Materials Reliability. 9, 3, p. 465-475 11 p., 5153318.

Research output: Contribution to journalArticle

Diodes
Metals
Geometry
Experiments

Oscillatory transmission line pulsing for characterization of device transient response

Di Sarro, J. P. & Rosenbaum, E., Jan 1 2009, In : IEEE Electron Device Letters. 30, 2, p. 168-170 3 p.

Research output: Contribution to journalArticle

Electrostatic discharge
Transient analysis
Electric lines
Thyristors
Electric potential
2007

A compact, ESD-protected, SiGe BiCMOS LNA for ultra-wideband applications

Bhatia, K., Hyvonen, S. & Rosenbaum, E., May 1 2007, In : IEEE Journal of Solid-State Circuits. 42, 5, p. 1121-1130 10 p.

Research output: Contribution to journalArticle

Low noise amplifiers
Ultra-wideband (UWB)
Noise figure
Broadband amplifiers
Heterojunction bipolar transistors
2006

An automated and efficient substrate noise analysis tool

Li, H., Zemke, C. E., Manetas, G., Okhmatovski, V. I. & Rosenbaum, E., Mar 1 2006, In : IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 25, 3, p. 454-468 15 p.

Research output: Contribution to journalArticle

Circuit simulation
Substrates
Boundary element method
Green's function

Compact modeling of on-chip ESD protection devices using Verilog-A

Li, J., Joshi, S., Barnes, R. & Rosenbaum, E., Jun 1 2006, In : IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 25, 6, p. 1047-1063 17 p.

Research output: Contribution to journalArticle

Computer hardware description languages
Electrostatic discharge
Transistors
Resistors
Diodes
2005
Electric potential
Resonators

Combined TLP/RF testing system for detection of ESD failures in RF circuits

Hyvonen, S., Joshi, S. & Rosenbaum, E., Jul 1 2005, In : IEEE Transactions on Electronics Packaging Manufacturing. 28, 3, p. 224-230 7 p.

Research output: Contribution to journalArticle

Electrostatic discharge
Leakage currents
Electric lines
Electric current measurement
Networks (circuits)

Comprehensive ESD protection for RF inputs

Hyvonen, S., Joshi, S. & Rosenbaum, E., Feb 1 2005, In : Microelectronics Reliability. 45, 2, p. 245-254 10 p.

Research output: Contribution to journalArticle

Networks (circuits)
circuit protection
human body
figure of merit
narrowband

Comprehensive study of drain breakdown in MOSFETs

Li, J., Li, H., Barnes, R. & Rosenbaum, E., Jun 1 2005, In : IEEE Transactions on Electron Devices. 52, 6, p. 1180-1186 7 p.

Research output: Contribution to journalArticle

Electric breakdown
Electric potential
Substrates

High-Q electrostatic discharge (ESD) protection devices for use at radio frequency (RF) and broad-band I/O pins

Joshi, S., Hyvonen, S. & Rosenbaum, E., Jul 1 2005, In : IEEE Transactions on Electron Devices. 52, 7, p. 1484-1488 5 p.

Research output: Contribution to journalArticle

Electrostatic discharge
Capacitance
Trigger circuits
Matched filters
Resonators
2004

Critical evaluation of SOI design guidelines

Kanj, R. & Rosenbaum, E., Sep 1 2004, In : IEEE Transactions on Very Large Scale Integration (VLSI) Systems. 12, 9, p. 885-894 10 p.

Research output: Contribution to journalArticle

Silicon
Silicon on insulator technology
Logic design
Networks (circuits)
Adders

Design and optimization of vertical SiGe thyristors for on-chip BSD protection

Joshi, S., Ida, R. & Rosenbaum, E., Dec 1 2004, In : IEEE Transactions on Device and Materials Reliability. 4, 4, p. 586-593 8 p.

Research output: Contribution to journalArticle

Thyristors
Integrated circuits
Anodes
Geometry
Experiments

Gate oxide reliability under ESD-like pulse stress

Wu, J. & Rosenbaum, E., Sep 1 2004, In : IEEE Transactions on Electron Devices. 51, 9, p. 1528-1532 5 p.

Research output: Contribution to journalArticle

Oxides
Electrostatic discharge
Electric breakdown
Heating

Gate oxide reliability under ESD-like pulse stress

Wu, J. & Rosenbaum, E., Jul 1 2004, In : IEEE Transactions on Electron Devices. 51, 7, p. 1192-1196 5 p.

Research output: Contribution to journalArticle

Oxides
Electrostatic discharge
Electric breakdown
Heating
2003

Cancellation technique to provide ESD protection for multi-GHz RF inputs

Hyvonen, S., Joshi, S. & Rosenbaum, E., Feb 6 2003, In : Electronics Letters. 39, 3, p. 284-286 3 p.

Research output: Contribution to journalArticle

ESD protection for broadband ICs (DC-20 GHz and beyond)

Joshi, S. & Rosenbaum, E., Jun 12 2003, In : Electronics Letters. 39, 12, p. 906-908 3 p.

Research output: Contribution to journalArticle

Microwave filters
Cutoff frequency
Networks (circuits)

Simulator-independent compact modeling of vertical npn transistors for ESD and RF circuit simulation

Joshi, S. & Rosenbaum, E., Jul 1 2003, In : Microelectronics Reliability. 43, 7, p. 1021-1027 7 p.

Research output: Contribution to journalArticle

Circuit simulation
simulators
Transistors
transistors
Simulators
2002
Logic gates

Comprehensive frequency-dependent substrate noise analysis using boundary element methods

Li, H., Carballido, J., Yu, H. H., Okhmatovski, V. I., Rosenbaum, E. & Cangellaris, A. C., Jan 1 2002, In : IEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers. p. 2-9 8 p.

Research output: Contribution to journalArticle

Boundary element method
Substrates
Electrodynamics
Green's function
Doping (additives)
2001
Level measurement
Electrostatic discharge
Electric lines

An analysis of bipolar breakdown and its application to the design of ESD protection circuits

Joshi, S., Ida, R., Givelin, P. & Rosenbaum, E., Jan 1 2001, In : Annual Proceedings - Reliability Physics (Symposium). p. 240-245 6 p.

Research output: Contribution to journalArticle

Networks (circuits)
Zener diodes
Electric breakdown

Breakdown and latent damage of ultra-thin gate oxides under ESD stress conditions

Wu, J., Juliano, P. & Rosenbaum, E., Nov 1 2001, In : Microelectronics Reliability. 41, 11, p. 1771-1779 9 p.

Research output: Contribution to journalArticle

Oxides
breakdown
damage
oxides
Electric potential

Electrothermal model for simulation of bulk-Si and SOI diodes in ESD protection circuits

Wang, Y., Juliano, P., Joshi, S. & Rosenbaum, E., Nov 1 2001, In : Microelectronics Reliability. 41, 11, p. 1781-1787 7 p.

Research output: Contribution to journalArticle

circuit protection
SOI (semiconductors)
Diodes
diodes
Networks (circuits)

Projecting lifetime of deep submicron MOSFETs

Li, E., Rosenbaum, E., Tao, J. & Fang, P., Apr 1 2001, In : IEEE Transactions on Electron Devices. 48, 4, p. 671-678 8 p.

Research output: Contribution to journalArticle

Degradation
Hot carriers
Deuterium
Electric potential
Metallizing

Trap generation and breakdown processes in very thin gate oxides

Rosenbaum, E. & Wu, J., May 2001, In : Microelectronics Reliability. 41, 5, p. 625-632 8 p.

Research output: Contribution to journalArticle

Oxides
breakdown
traps
Leakage currents
oxides
2000

Anode hole injection versus hydrogen release: The mechanism for gate oxide breakdown

Wu, J., Rosenbaum, E., MacDonald, B., Li, E., Tao, J., Tracy, B. & Fang, P., Jan 1 2000, In : Annual Proceedings - Reliability Physics (Symposium). p. 27-32 6 p.

Research output: Contribution to journalArticle

Deuterium
Anodes
Hydrogen
Oxides
Metallizing

Electrostatic discharge and high current pulse characterization of epitaxial-base silicon-germanium heterojunction bipolar transistors

Voldman, S., Juliano, P., Johnson, R., Schmidt, N., Joseph, A., Furkay, S., Rosenbaum, E., Dunn, J., Harame, D. & Meyerson, B., Jan 1 2000, In : Annual Proceedings - Reliability Physics (Symposium). p. 310-316 7 p.

Research output: Contribution to journalArticle

Electrostatic discharge
Heterojunction bipolar transistors
Germanium
Silicon
Failure analysis

Hot carrier induced degradation in deep submicron MOSFETs at 100 °C

Li, E., Rosenbaum, E., Register, L. F., Tao, J. & Fang, P., 2000, In : Annual Proceedings - Reliability Physics (Symposium). p. 103-107 5 p.

Research output: Contribution to journalArticle

Hot carriers
Degradation
Networks (circuits)
Testing
Temperature

Interconnect thermal modeling for accurate simulation of circuit timing and reliability

Chen, D., Li, E., Rosenbaum, E. & Kang, S. M., Jan 1 2000, In : IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 19, 2, p. 197-205 9 p.

Research output: Contribution to journalArticle

Timing circuits
Geometry
Temperature
Computer aided design
Current density

On the mechanism for interface trap generation in MOS transistors due to channel hot carrier stressing

Chen, Z., Hess, K., Lee, J., Lyding, J. W., Rosenbaum, E., Kizilyalli, I., Chetlur, S. & Huang, R., Jan 1 2000, In : IEEE Electron Device Letters. 21, 1, p. 24-26 3 p.

Research output: Contribution to journalArticle

Hot carriers
MOSFET devices
Isotopes
Hot electrons
Oxides