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Elyse Rosenbaum

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  • 2013

    Layout-aware, distributed, compact model for multi-finger MOSFETs operating under ESD conditions

    Meng, K. H. & Rosenbaum, E., Oct 16 2013, Electrical Overstress/Electrostatic Discharge Symposium Proceedings, EOS/ESD 2013. 6635912. (Electrical Overstress/Electrostatic Discharge Symposium Proceedings).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

  • Predictive modeling of peak discharge current during charged device model test of microelectronic components

    Shukla, V., Boselli, G., Dissegna, M., Duvvury, C., Sankaralingam, R. & Rosenbaum, E., Oct 16 2013, Electrical Overstress/Electrostatic Discharge Symposium Proceedings, EOS/ESD 2013. 6635951. (Electrical Overstress/Electrostatic Discharge Symposium Proceedings).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

  • Separating SCR and trigger circuit related overshoot in SCR-based ESD protection circuits

    Mertens, R. & Rosenbaum, E., Oct 16 2013, Electrical Overstress/Electrostatic Discharge Symposium Proceedings, EOS/ESD 2013. 6635915. (Electrical Overstress/Electrostatic Discharge Symposium Proceedings).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

  • 2012

    A flexible simulation model for system level ESD stresses with application to ESD design and troubleshooting

    Mertens, R., Kunz, H., Salman, A., Boselli, G. & Rosenbaum, E., 2012, Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2012, EOS/ESD 2012. 6333331. (Electrical Overstress/Electrostatic Discharge Symposium Proceedings).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

  • Comparing FICDM and wafer-level CDM test methods: Apples to oranges?

    Jack, N. & Rosenbaum, E., 2012, Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2012, EOS/ESD 2012. 6333309. (Electrical Overstress/Electrostatic Discharge Symposium Proceedings).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

  • Exponential-edge transmission line pulsing for snap-back device characterization

    Thomson, N., Jack, N. & Rosenbaum, E., 2012, 2012 IEEE International Reliability Physics Symposium, IRPS 2012. p. 3E.2.1-3E.2.6 6241820. (IEEE International Reliability Physics Symposium Proceedings).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

  • FEC-based 4 Gb/s backplane transceiver in 90nm CMOS

    Faust, A. C., Narasimha, R. L., Bhatia, K., Srivastava, A., Kong, C., Bae, H. M., Rosenbaum, E. & Shanbhag, N., 2012, Proceedings of the IEEE 2012 Custom Integrated Circuits Conference, CICC 2012. 6330665. (Proceedings of the Custom Integrated Circuits Conference).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

  • Layout sensitivities of transient external latchup

    Kripanidhi, A. & Rosenbaum, E., 2012, 2012 IEEE International Reliability Physics Symposium, IRPS 2012. p. 3E.3.1-3E.3.6 6241821. (IEEE International Reliability Physics Symposium Proceedings).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

  • The need for transient I-V measurement of device ESD response

    Meng, K. H. & Rosenbaum, E., 2012, Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2012, EOS/ESD 2012. 6333318. (Electrical Overstress/Electrostatic Discharge Symposium Proceedings).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

  • 2011

    CDM-ESD induced damage in components using stacked-die packaging

    Olson, N., Jack, N., Shukla, V. & Rosenbaum, E., 2011, 2011 IEEE Custom Integrated Circuits Conference, CICC 2011. 6055359. (Proceedings of the Custom Integrated Circuits Conference).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

  • Effect of on-chip ESD protection on 10 Gb/s receivers

    Faust, A. C., Srivastava, A. & Rosenbaum, E., 2011, Electrical Overstress/Electrostatic Discharge Symposium Proceedings - 2011, EOS/ESD 2011. 6045578. (Electrical Overstress/Electrostatic Discharge Symposium Proceedings).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

  • ESD protection networks for 3D integrated circuits

    Rosenbaum, E., Shukla, V. & Keel, M. S., 2011, 2011 IEEE International 3D Systems Integration Conference, 3DIC 2011. 6262965. (2011 IEEE International 3D Systems Integration Conference, 3DIC 2011).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

  • Test chip design for study of CDM related failures in SoC designs

    Olson, N., Shukla, V. & Rosenbaum, E., 2011, 2011 International Reliability Physics Symposium, IRPS 2011. p. EL.3.1-EL.3.6 5784566. (IEEE International Reliability Physics Symposium Proceedings).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

  • Voltage monitor circuit for ESD diagnosis

    Jack, N. & Rosenbaum, E., 2011, Electrical Overstress/Electrostatic Discharge Symposium Proceedings - 2011, EOS/ESD 2011. 6045614. (Electrical Overstress/Electrostatic Discharge Symposium Proceedings).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

  • WCDM2 - Wafer-level charged device model testing with high repeatability

    Jack, N., Maloney, T. J., Chou, B. & Rosenbaum, E., 2011, 2011 International Reliability Physics Symposium, IRPS 2011. p. 4C.5.1-4C.5.8 5784509. (IEEE International Reliability Physics Symposium Proceedings).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

  • 2010

    A novel TCAD-based methodology to minimize the impact of parasitic structures on ESD performance

    Olson, N., Boselli, G., Salman, A. & Rosenbaum, E., 2010, 2010 IEEE International Reliability Physics Symposium, IRPS 2010. p. 474-479 6 p. 5488784. (IEEE International Reliability Physics Symposium Proceedings).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

  • Application of the latency insertion method (LIM) to the modeling of CDM ESD events

    Klokotov, D., Shukla, V., Schutt-Ainé, J. & Rosenbaum, E., 2010, 2010 Proceedings 60th Electronic Components and Technology Conference, ECTC 2010. p. 652-656 5 p. 5490800. (Proceedings - Electronic Components and Technology Conference).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

  • CDM simulation study of a system-in-package

    Shukla, V. & Rosenbaum, E., 2010, Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2010, EOS/ESD 2010. 5623710. (Electrical Overstress/Electrostatic Discharge Symposium Proceedings).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

  • ESD protection for high-speed receiver circuits

    Jack, N. & Rosenbaum, E., 2010, 2010 IEEE International Reliability Physics Symposium, IRPS 2010. p. 835-840 6 p. 5488722. (IEEE International Reliability Physics Symposium Proceedings).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

  • Investigation of current flow during wafer-level CDM using real-time probing

    Jack, N., Shukla, V. & Rosenbaum, E., 2010, Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2010, EOS/ESD 2010. 5623758. (Electrical Overstress/Electrostatic Discharge Symposium Proceedings).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

  • Predictive simulation of CDM events to study effects of package, substrate resistivity and placement of ESD protection circuits on reliability of integrated circuits

    Shukla, V., Jack, N. & Rosenbaum, E., 2010, 2010 IEEE International Reliability Physics Symposium, IRPS 2010. p. 485-493 9 p. 5488782. (IEEE International Reliability Physics Symposium Proceedings).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

  • Understanding transient latchup hazards and the impact of guard rings

    Farbiz, F. & Rosenbaum, E., 2010, 2010 IEEE International Reliability Physics Symposium, IRPS 2010. p. 466-473 8 p. 5488787. (IEEE International Reliability Physics Symposium Proceedings).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

  • 2009

    ESD time-domain characterization of high-k gate dielectric in a 32 nm CMOS technology

    Di Sarro, J., Yang, Y., Chatty, K., Gauthier, R., Ille, A., Mitra, S., Li, J., Russ, C., Rosenbaum, E. & Ioannou, D., 2009, Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2009, EOS/ESD 2009. 5340124. (Electrical Overstress/Electrostatic Discharge Symposium Proceedings).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

  • HBM cross power domain failure due to secondary tester pulse

    Jack, N., Davis, J., Chaine, M. & Rosenbaum, E., 2009, Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2009, EOS/ESD 2009. 5340113. (Electrical Overstress/Electrostatic Discharge Symposium Proceedings).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

  • Moving signals on and off chip

    Rosenbaum, E., Bae, H. M., Bhatia, K. S. & Faust, A. C., 2009, 2009 IEEE Custom Integrated Circuits Conference, CICC '09. p. 585-592 8 p. 5280774. (Proceedings of the Custom Integrated Circuits Conference).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

  • 2008

    A scalable SCR compact model for ESD circuit simulation

    Di Sarro, J. & Rosenbaum, E., 2008, 46th Annual 2008 IEEE International Reliability Physics Symposium Proceedings, IRPS. p. 254-261 8 p. 4558895. (IEEE International Reliability Physics Symposium Proceedings).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

  • Guard ring interactions and their effect on CMOS latchup resilience

    Farbiz, F. & Rosenbaum, E., 2008, 2008 IEEE International Electron Devices Meeting, IEDM 2008. 4796690. (Technical Digest - International Electron Devices Meeting, IEDM).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

  • Modeling of majority and minority carrier triggered external latchup

    Farbiz, F. & Rosenbaum, E., 2008, 46th Annual 2008 IEEE International Reliability Physics Symposium Proceedings, IRPS. p. 270-277 8 p. 4558897. (IEEE International Reliability Physics Symposium Proceedings).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

  • UVeriESD: An ESD verification tool for SoC design

    Kelvin Hsueh, K., Ke, S. H., Lee, J. & Rosenbaum, E., 2008, Proceedings of APCCAS 2008 - 2008 IEEE Asia Pacific Conference on Circuits and Systems. p. 53-56 4 p. 4745958. (IEEE Asia-Pacific Conference on Circuits and Systems, Proceedings, APCCAS).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

  • 2007

    A Kelvin transmission line pulsing system with optimized oscilloscope ranging

    Gerdemann, A., Bhatia, K. & Rosenbaum, E., 2007, 2007 29th Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD. p. 2A.11-2A.19 4401735. (Electrical Overstress/Electrostatic Discharge Symposium Proceedings).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

  • Analytical modeling of external latchup

    Farbiz, F. & Rosenbaum, E., 2007, 2007 29th Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD. ESD Association, p. 6A.21-6A.29 4401772. (Electrical Overstress/Electrostatic Discharge Symposium Proceedings).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

  • An investigation of external latchup

    Farbiz, F. & Rosenbaum, E., 2007, 2007 IEEE International Reliability Physics Symposium Proceedings, 45th Annual. p. 600-601 2 p. 4227711. (Annual Proceedings - Reliability Physics (Symposium)).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

  • A novel testing approach for full-chip CDM characterization

    Gerdemann, A., Rosenbaum, E. & Stockinger, M., 2007, 2007 29th Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD. p. 5A.31-5A.38 4401765. (Electrical Overstress/Electrostatic Discharge Symposium Proceedings).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

  • Evaluation of SCR-based ESD protection devices in 90nm and 65nm CMOS technologies

    Di Sarro, J., Chatty, K., Gauthier, R. & Rosenbaum, E., 2007, 2007 IEEE International Reliability Physics Symposium Proceedings, 45th Annual. p. 348-357 10 p. 4227655. (Annual Proceedings - Reliability Physics (Symposium)).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

  • Layout guidelines for optimized ESD protection diodes

    Bhatia, K. & Rosenbaum, E., 2007, 2007 29th Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD. p. 1A.31-1A.39 4401727. (Electrical Overstress/Electrostatic Discharge Symposium Proceedings).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

  • Mixed device-circuit solution for ESD protection of high-voltage fast pins

    Vashchenko, V. A., Olson, N., Farrenkopf, D., Kuznetsov, V., Hopper, P. & Rosenbaum, E., 2007, 2007 IEEE International Reliability Physics Symposium Proceedings, 45th Annual. p. 602-603 2 p. 4227712. (Annual Proceedings - Reliability Physics (Symposium)).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

  • 2006

    An 8-mW, ESD-protected, CMOS LNA for ultra-wideband applications

    Bhatia, K., Hyvonen, S. & Rosenbaum, E., 2006, Proceedings of the IEEE 2006 Custom Integrated Circuits Conference, CICC 2006. p. 385-388 4 p. 4114985. (Proceedings of the Custom Integrated Circuits Conference).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

  • Double-gate FET technology for RF applications: Device characteristics and low noise amplifier design

    Bhatia, K., Kim, K., Chuang, C. T., Rosenbaum, E., Plouchart, J. O. & Floyd, B. A., 2006, 2006 IEEE international SOI Conference Proceedings. Institute of Electrical and Electronics Engineers Inc., p. 75-76 2 p. 4062888. (Proceedings - IEEE International SOI Conference).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

  • On-chip ESD protection for RFICs

    Rosenbaum, E. & Hyvonen, S., 2006, Radio Design in Nanometer Technologies. Kluwer Academic Publishers, p. 173-192 20 p. (Radio Design in Nanometer Technologies).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

  • SOI poly-defined diode for ESD protection in high speed I/Os

    Chen, V., Salman, A., Beebe, S., Rosenbaum, E., Mitra, S., Putnam, C. & Gauthier, R., 2006, 2006 IEEE International Reliability Physics Symposium Proceedings, 44th Annual. p. 635-636 2 p. 4017240. (IEEE International Reliability Physics Symposium Proceedings).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

  • Study of design factors affecting turn-on time of silicon controlled rectifiers (SCRs) in 90 and 65NM bulk CMOS technologies

    Sarro, J. D., Chatty, K., Gauthier, R. & Rosenbaum, E., 2006, 2006 IEEE International Reliability Physics Symposium Proceedings, 44th Annual. p. 163-168 6 p. 4017151. (IEEE International Reliability Physics Symposium Proceedings).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

  • 2005

    Diode-based tuned ESD protection for 5.25-GHz CMOS LNAs

    Hyvonen, S. & Rosenbaum, E., 2005, 2005 Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD 2005. 5271825. (Electrical Overstress/Electrostatic Discharge Symposium Proceedings).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

  • 2004

    A compact, timed-shutoff, MOSFET-based power clamp for on-chip ESD protection

    Li, J., Gauthier, R. & Rosenbaum, E., 2004, 2004 Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD '04. 5272597. (Electrical Overstress/Electrostatic Discharge Symposium Proceedings).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

  • Improved wafer-level VFTLP system and investigation of device turn-on effects

    Li, J., Hyvonen, S. & Rosenbaum, E., 2004, 2004 Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD '04. 5272590. (Electrical Overstress/Electrostatic Discharge Symposium Proceedings).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

  • 2003

    A study of vertical SiGe thyristor design and optimization

    Joshi, S., Ida, R. & Rosenbaum, E., 2003, 2003 Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD 2003. ESD Association, 5272020. (Electrical Overstress/Electrostatic Discharge Symposium Proceedings; vol. 2003-January).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

  • Combined TLP/RF testing system for detection of ESD failures in RF circuits

    Hyvonen, S., Joshi, S. & Rosenbaum, E., 2003, 2003 Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD 2003. ESD Association, 5272004. (Electrical Overstress/Electrostatic Discharge Symposium Proceedings; vol. 2003-January).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

  • Comprehensive ESD protection for RF inputs

    Hyvonen, S., Joshi, S. & Rosenbaum, E., 2003, 2003 Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD 2003. ESD Association, 5272024. (Electrical Overstress/Electrostatic Discharge Symposium Proceedings; vol. 2003-January).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

  • Transmission line pulsed waveform shaping with microwave filters

    Joshi, S. & Rosenbaum, E., 2003, 2003 Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD 2003. ESD Association, 5272002. (Electrical Overstress/Electrostatic Discharge Symposium Proceedings; vol. 2003-January).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

  • 2002

    Compact modeling of vertical ESD protection NPN transistors for RF circuits

    Joshi, S. & Rosenbaum, E., 2002, Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD 2002 - Proceedings. ESD Association, p. 292-298 7 p. 5267008. (Electrical Overstress/Electrostatic Discharge Symposium Proceedings; vol. 2002-January).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

  • 2001

    An analysis of bipolar breakdown and its application to the design of ESD protection circuits

    Joshi, S., Ida, R., Givelin, P. & Rosenbaum, E., 2001, 2001 IEEE International Reliability Physics Symposium Proceedings - 39th Annual. Institute of Electrical and Electronics Engineers Inc., p. 240-245 6 p. 922908. (Annual Proceedings - Reliability Physics (Symposium)).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution