1989 …2019
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Research Output 1989 2019

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Conference contribution
2019

Decomposition Method for Event-Detection State Vector Simulation of Switched-Mode Power Supplies

Reiman, C. & Rosenbaum, E., Jun 2019, 2019 IEEE 20th Workshop on Control and Modeling for Power Electronics, COMPEL 2019. Institute of Electrical and Electronics Engineers Inc., 8769654. (2019 IEEE 20th Workshop on Control and Modeling for Power Electronics, COMPEL 2019).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Switched mode power supplies
Event Detection
Decomposition Method
Decomposition
Feedback control

Discrete-Time Large-Signal Modeling and Numerical Methods for Flyback Converters

Reiman, C., Das, D. & Rosenbaum, E., Apr 24 2019, 2019 IEEE Power and Energy Conference at Illinois, PECI 2019. Institute of Electrical and Electronics Engineers Inc., 8698921. (2019 IEEE Power and Energy Conference at Illinois, PECI 2019).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Numerical methods
Decomposition

Guilty As Charged: Computational Reliability Threats Posed by Electrostatic Discharge-induced Soft Errors

Feng, K., Vora, S., Jiang, R., Rosenbaum, E. & Vasudevan, S., May 14 2019, Proceedings of the 2019 Design, Automation and Test in Europe Conference and Exhibition, DATE 2019. Institute of Electrical and Electronics Engineers Inc., p. 156-161 6 p. 8715149. (Proceedings of the 2019 Design, Automation and Test in Europe Conference and Exhibition, DATE 2019).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Soft Error
Electrostatic discharge
Electrostatics
Chip
Microcontroller
2018

Enhanced IC modeling methodology for system-level ESD simulation

Xiong, J., Chen, Z., Xiu, Y., Mu, Z., Raginsky, M. & Rosenbaum, E., Oct 25 2018, Electrical Overstress/Electrostatic Discharge Symposium Proceedings, EOS/ESD 2018. ESD Association, (Electrical Overstress/Electrostatic Discharge Symposium Proceedings; vol. 2018-September).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Recurrent neural networks
Circuit simulation
Networks (circuits)

Hardware and software combined detection of system-level ESD-induced soft failures

Vora, S., Jiang, R., Vijayaraj, P. M., Feng, K., Xiu, Y., Vasudevan, S. & Rosenbaum, E., Oct 25 2018, Electrical Overstress/Electrostatic Discharge Symposium Proceedings, EOS/ESD 2018. ESD Association, (Electrical Overstress/Electrostatic Discharge Symposium Proceedings; vol. 2018-September).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Microcontrollers
Computer hardware
Hardware
Data storage equipment
Electric potential

Latch-up model of non-collinear PNPN structures

Reiman, C., Jack, N. & Rosenbaum, E., Oct 25 2018, Electrical Overstress/Electrostatic Discharge Symposium Proceedings, EOS/ESD 2018. ESD Association, Vol. 2018-September.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Circuit simulation
Thyristors
Electric potential
FinFET

Stochastic modeling of air electrostatic discharge parameters

Xiu, Y., Sagan, S., Battini, A., Ma, X., Raginsky, M. & Rosenbaum, E., May 25 2018, 2018 IEEE International Reliability Physics Symposium, IRPS 2018. Institute of Electrical and Electronics Engineers Inc., Vol. 2018-March. p. 2C.21-2C.210

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Electrostatic discharge
Atmospheric humidity
Electric potential
Air
Discharge (fluid mechanics)

Verilog-A compatible recurrent neural network model for transient circuit simulation

Chen, Z., Raginsky, M. & Rosenbaum, E., Apr 2 2018, 2017 IEEE 26th Conference on Electrical Performance of Electronic Packaging and Systems, EPEPS 2017. Institute of Electrical and Electronics Engineers Inc., Vol. 2018-January. p. 1-3 3 p.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Computer hardware description languages
Recurrent neural networks
Circuit simulation
Networks (circuits)
Simulators
2017

Chip-level ESD-induced noise on internally and externally regulated power supplies

Xiu, Y., Thomson, N., Mertens, R., Reiman, C. & Rosenbaum, E., Oct 18 2017, Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2017, EOS/ESD 2017. ESD Association, (Electrical Overstress/Electrostatic Discharge Symposium Proceedings).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Voltage regulators
Voltage control
Capacitors

On-chip monitors of supply noise generated by system-level ESD

Thomson, N., Reiman, C., Xiu, Y. & Rosenbaum, E., Oct 18 2017, Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2017, EOS/ESD 2017. ESD Association, (Electrical Overstress/Electrostatic Discharge Symposium Proceedings).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Networks (circuits)
Electric potential
2016

Application level investigation of system-level ESD-induced soft failures

Vora, S., Jiang, R., Vasudevan, S. & Rosenbaum, E., Oct 14 2016, Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2016, EOS/ESD 2016. ESD Association, 7592565. (Electrical Overstress/Electrostatic Discharge Symposium Proceedings; vol. 2016-October).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Program processors
Hardware

Case study of DPI robustness of a MOS-SCR structure for automotive applications

Xiu, Y., Farbiz, F., Salman, A., Zu, Y., Dissegna, M., Boselli, G. & Rosenbaum, E., Oct 14 2016, Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2016, EOS/ESD 2016. ESD Association, Vol. 2016-October. 7592538

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Thyristors
Networks (circuits)

Experimental study of supply voltage stability during ESD

Xiu, Y., Mertens, R., Thomson, N. & Rosenbaum, E., Sep 22 2016, 2016 International Reliability Physics Symposium, IRPS 2016. Institute of Electrical and Electronics Engineers Inc., p. 6A61-6A66 7574560. (IEEE International Reliability Physics Symposium Proceedings; vol. 2016-September).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Clamping devices
Voltage control
Rails
Inductance
Capacitance

Improving the long pulse width failure current of NPN in BiCMOS technology

Xiu, Y., Appaswamy, A., Chen, Z., Salman, A., Dissegna, M., Boselli, G. & Rosenbaum, E., Sep 22 2016, 2016 International Reliability Physics Symposium, IRPS 2016. Institute of Electrical and Electronics Engineers Inc., Vol. 2016-September. p. EL51-EL54 7574606

Research output: Chapter in Book/Report/Conference proceedingConference contribution

BiCMOS technology
2015

CDM-reliable T-coil techniques for high-speed wireline receivers

Keel, M. S. & Rosenbaum, E., Oct 30 2015, Electrical Overstress/Electrostatic Discharge Symposium Proceedings, EOS/ESD 2015. ESD Association, (Electrical Overstress/Electrostatic Discharge Symposium Proceedings; vol. 2015-October).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Magnetic couplings
Inductance
Hazards
Bandwidth
Degradation

Current challenges in component-level and system-level ESD simulation

Rosenbaum, E., Meng, K. H., Xiu, Y. & Thomson, N., Aug 3 2015, 2015 Asia-Pacific International Symposium on Electromagnetic Compatibility, APEMC 2015. Institute of Electrical and Electronics Engineers Inc., p. 333-336 4 p. 7175328. (2015 Asia-Pacific International Symposium on Electromagnetic Compatibility, APEMC 2015).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

beds
Computational efficiency
simulation
test stands
qualifications

Fast circuit simulator for transient analysis of CDM ESD

Meng, K. H. & Rosenbaum, E., Oct 30 2015, Electrical Overstress/Electrostatic Discharge Symposium Proceedings, EOS/ESD 2015. ESD Association, (Electrical Overstress/Electrostatic Discharge Symposium Proceedings; vol. 2015-October).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Cluster computing
Transient analysis
Simulators
Engines
Networks (circuits)

Improved GGSCR layout for overshoot reduction

Chen, Z., Mertens, R., Reiman, C. & Rosenbaum, E., May 26 2015, 2015 IEEE International Reliability Physics Symposium, IRPS 2015. Institute of Electrical and Electronics Engineers Inc., p. 3F21-3F28 7112720. (IEEE International Reliability Physics Symposium Proceedings; vol. 2015-May).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Electric potential
Anodes
Cathodes

Practical methodology for the extraction of SEED models

Reiman, C., Thomson, N., Xiu, Y., Mertens, R. & Rosenbaum, E., Oct 30 2015, Electrical Overstress/Electrostatic Discharge Symposium Proceedings, EOS/ESD 2015. ESD Association, (Electrical Overstress/Electrostatic Discharge Symposium Proceedings; vol. 2015-October).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Integrated circuits

S-parameter based modeling of system-level ESD test bed

Xiu, Y., Thomson, N., Mertens, R. & Rosenbaum, E., Oct 30 2015, Electrical Overstress/Electrostatic Discharge Symposium Proceedings, EOS/ESD 2015. ESD Association, (Electrical Overstress/Electrostatic Discharge Symposium Proceedings; vol. 2015-October).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Scattering parameters
Networks (circuits)
2013

A physics-based compact model for SCR devices used in ESD protection circuits

Mertens, R. & Rosenbaum, E., Aug 7 2013, 2013 IEEE International Reliability Physics Symposium, IRPS 2013. 6531947. (IEEE International Reliability Physics Symposium Proceedings).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Thyristors
Physics
Networks (circuits)
Transistors
Circuit simulation

ESD-resilient active biasing scheme for high-speed SSTL I/Os

Keel, M. S., Jack, N. & Rosenbaum, E., Oct 16 2013, Electrical Overstress/Electrostatic Discharge Symposium Proceedings, EOS/ESD 2013. 6635906. (Electrical Overstress/Electrostatic Discharge Symposium Proceedings).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Networks (circuits)
Transistors
Oxides
Electric potential

Investigation of product burn-in failures due to powered NPN bipolar latching of active MOSFET rail clamps

Ruth, S., Miller, J. W., Gerdemann, A., Stockinger, M., Etherton, M., Moosa, M., Dobbin, A., Mertens, R., Meng, K. H., Rosenbaum, E., Colombo, P., Cordoni, M. & Guitard, N., Oct 16 2013, Electrical Overstress/Electrostatic Discharge Symposium Proceedings, EOS/ESD 2013. 6635940. (Electrical Overstress/Electrostatic Discharge Symposium Proceedings).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Clamping devices
Rails

Layout-aware, distributed, compact model for multi-finger MOSFETs operating under ESD conditions

Meng, K. H. & Rosenbaum, E., Oct 16 2013, Electrical Overstress/Electrostatic Discharge Symposium Proceedings, EOS/ESD 2013. 6635912. (Electrical Overstress/Electrostatic Discharge Symposium Proceedings).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Parameter extraction
Electric lines
Geometry
Electric potential

Predictive modeling of peak discharge current during charged device model test of microelectronic components

Shukla, V., Boselli, G., Dissegna, M., Duvvury, C., Sankaralingam, R. & Rosenbaum, E., Oct 16 2013, Electrical Overstress/Electrostatic Discharge Symposium Proceedings, EOS/ESD 2013. 6635951. (Electrical Overstress/Electrostatic Discharge Symposium Proceedings).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Microelectronics
Electric potential

Separating SCR and trigger circuit related overshoot in SCR-based ESD protection circuits

Mertens, R. & Rosenbaum, E., Oct 16 2013, Electrical Overstress/Electrostatic Discharge Symposium Proceedings, EOS/ESD 2013. 6635915. (Electrical Overstress/Electrostatic Discharge Symposium Proceedings).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Trigger circuits
Thyristors
Networks (circuits)
Circuit simulation
Electric potential
2012

A flexible simulation model for system level ESD stresses with application to ESD design and troubleshooting

Mertens, R., Kunz, H., Salman, A., Boselli, G. & Rosenbaum, E., Nov 27 2012, Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2012, EOS/ESD 2012. 6333331. (Electrical Overstress/Electrostatic Discharge Symposium Proceedings).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Integrated circuit testing
Specifications

Comparing FICDM and wafer-level CDM test methods: Apples to oranges?

Jack, N. & Rosenbaum, E., Nov 27 2012, Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2012, EOS/ESD 2012. 6333309. (Electrical Overstress/Electrostatic Discharge Symposium Proceedings).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Networks (circuits)
Electric potential

Exponential-edge transmission line pulsing for snap-back device characterization

Thomson, N., Jack, N. & Rosenbaum, E., 2012, 2012 IEEE International Reliability Physics Symposium, IRPS 2012. 6241820

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Electric lines
Testing

FEC-based 4 Gb/s backplane transceiver in 90nm CMOS

Faust, A. C., Narasimha, R. L., Bhatia, K., Srivastava, A., Kong, C., Bae, H. M., Rosenbaum, E. & Shanbhag, N. R., Nov 26 2012, Proceedings of the IEEE 2012 Custom Integrated Circuits Conference, CICC 2012. 6330665. (Proceedings of the Custom Integrated Circuits Conference).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Forward error correction
Transceivers
Jitter

Layout sensitivities of transient external latchup

Kripanidhi, A. & Rosenbaum, E., Sep 28 2012, 2012 IEEE International Reliability Physics Symposium, IRPS 2012. 6241821. (IEEE International Reliability Physics Symposium Proceedings).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Physics

The need for transient I-V measurement of device ESD response

Meng, K. H. & Rosenbaum, E., Nov 27 2012, Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2012, EOS/ESD 2012. 6333318. (Electrical Overstress/Electrostatic Discharge Symposium Proceedings).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Circuit simulation
Tuning
Testing
2011

CDM-ESD induced damage in components using stacked-die packaging

Olson, N., Jack, N., Shukla, V. & Rosenbaum, E., Nov 9 2011, 2011 IEEE Custom Integrated Circuits Conference, CICC 2011. 6055359. (Proceedings of the Custom Integrated Circuits Conference).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Packaging
Clamping devices

Effect of on-chip ESD protection on 10 Gb/s receivers

Faust, A. C., Srivastava, A. & Rosenbaum, E., Nov 10 2011, Electrical Overstress/Electrostatic Discharge Symposium Proceedings - 2011, EOS/ESD 2011. 6045578. (Electrical Overstress/Electrostatic Discharge Symposium Proceedings).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Capacitance
Bandwidth
Networks (circuits)

ESD protection networks for 3D integrated circuits

Rosenbaum, E., Shukla, V. & Keel, M. S., Dec 1 2011, 2011 IEEE International 3D Systems Integration Conference, 3DIC 2011. 6262965. (2011 IEEE International 3D Systems Integration Conference, 3DIC 2011).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Gate dielectrics
Clamping devices
Electric potential
Electric breakdown
Electric power distribution

Test chip design for study of CDM related failures in SoC designs

Olson, N., Shukla, V. & Rosenbaum, E., Jun 23 2011, 2011 International Reliability Physics Symposium, IRPS 2011. 5784566. (IEEE International Reliability Physics Symposium Proceedings).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Testing

Voltage monitor circuit for ESD diagnosis

Jack, N. & Rosenbaum, E., Nov 10 2011, Electrical Overstress/Electrostatic Discharge Symposium Proceedings - 2011, EOS/ESD 2011. 6045614. (Electrical Overstress/Electrostatic Discharge Symposium Proceedings).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Networks (circuits)
Electric potential

WCDM2 - Wafer-level charged device model testing with high repeatability

Jack, N., Maloney, T. J., Chou, B. & Rosenbaum, E., Jun 23 2011, 2011 International Reliability Physics Symposium, IRPS 2011. 5784509. (IEEE International Reliability Physics Symposium Proceedings).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Testing
2010

A novel TCAD-based methodology to minimize the impact of parasitic structures on ESD performance

Olson, N., Boselli, G., Salman, A. & Rosenbaum, E., Oct 20 2010, 2010 IEEE International Reliability Physics Symposium, IRPS 2010. p. 474-479 6 p. 5488784. (IEEE International Reliability Physics Symposium Proceedings).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Bipolar transistors

Application of the latency insertion method (LIM) to the modeling of CDM ESD events

Klokotov, D., Shukla, V., Schutt-Ainé, J. & Rosenbaum, E., Aug 9 2010, 2010 Proceedings 60th Electronic Components and Technology Conference, ECTC 2010. p. 652-656 5 p. 5490800. (Proceedings - Electronic Components and Technology Conference).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Electrostatic discharge
Circuit simulation
Integrated circuits
Simulators

CDM simulation study of a system-in-package

Shukla, V. & Rosenbaum, E., 2010, Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2010, EOS/ESD 2010. 5623710

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Networks (circuits)
Circuit simulation
System-in-package
Electric potential

ESD protection for high-speed receiver circuits

Jack, N. & Rosenbaum, E., Oct 20 2010, 2010 IEEE International Reliability Physics Symposium, IRPS 2010. p. 835-840 6 p. 5488722. (IEEE International Reliability Physics Symposium Proceedings).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Networks (circuits)
Electric breakdown
Transistors
Diodes
Oxides

Investigation of current flow during wafer-level CDM using real-time probing

Jack, N., Shukla, V. & Rosenbaum, E., Dec 24 2010, Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2010, EOS/ESD 2010. 5623758. (Electrical Overstress/Electrostatic Discharge Symposium Proceedings).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Circuit simulation
Induced currents
Electric potential

Predictive simulation of CDM events to study effects of package, substrate resistivity and placement of ESD protection circuits on reliability of integrated circuits

Shukla, V., Jack, N. & Rosenbaum, E., Oct 20 2010, 2010 IEEE International Reliability Physics Symposium, IRPS 2010. p. 485-493 9 p. 5488782. (IEEE International Reliability Physics Symposium Proceedings).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Integrated circuits
Networks (circuits)
Substrates
Clamping devices
Diodes

Understanding transient latchup hazards and the impact of guard rings

Farbiz, F. & Rosenbaum, E., Oct 20 2010, 2010 IEEE International Reliability Physics Symposium, IRPS 2010. p. 466-473 8 p. 5488787. (IEEE International Reliability Physics Symposium Proceedings).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Hazards
Testing
2009

ESD time-domain characterization of high-k gate dielectric in a 32 nm CMOS technology

Di Sarro, J., Yang, Y., Chatty, K., Gauthier, R., Ille, A., Mitra, S., Li, J., Russ, C., Rosenbaum, E. & Ioannou, D., Dec 1 2009, Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2009, EOS/ESD 2009. 5340124. (Electrical Overstress/Electrostatic Discharge Symposium Proceedings).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Gate dielectrics
Transistors
Electric breakdown
Polysilicon
Metals

HBM cross power domain failure due to secondary tester pulse

Jack, N., Davis, J., Chaine, M. & Rosenbaum, E., Dec 1 2009, Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2009, EOS/ESD 2009. 5340113. (Electrical Overstress/Electrostatic Discharge Symposium Proceedings).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Moving signals on and off chip

Rosenbaum, E., Bae, H. M., Bhatia, K. S. & Faust, A. C., Dec 1 2009, 2009 IEEE Custom Integrated Circuits Conference, CICC '09. p. 585-592 8 p. 5280774. (Proceedings of the Custom Integrated Circuits Conference).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Networks (circuits)
2008

A scalable SCR compact model for ESD circuit simulation

Di Sarro, J. & Rosenbaum, E., Sep 17 2008, 46th Annual 2008 IEEE International Reliability Physics Symposium Proceedings, IRPS. p. 254-261 8 p. 4558895. (IEEE International Reliability Physics Symposium Proceedings).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Circuit simulation
Thyristors
Electric potential
Heating

Guard ring interactions and their effect on CMOS latchup resilience

Farbiz, F. & Rosenbaum, E., Dec 1 2008, 2008 IEEE International Electron Devices Meeting, IEDM 2008. 4796690. (Technical Digest - International Electron Devices Meeting, IEDM).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

resilience
CMOS
rings
taps
minority carriers