1989 …2019
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Research Output 1989 2019

Conference contribution

Improving the long pulse width failure current of NPN in BiCMOS technology

Xiu, Y., Appaswamy, A., Chen, Z., Salman, A., Dissegna, M., Boselli, G. & Rosenbaum, E., Sep 22 2016, 2016 International Reliability Physics Symposium, IRPS 2016. Institute of Electrical and Electronics Engineers Inc., p. EL51-EL54 7574606. (IEEE International Reliability Physics Symposium Proceedings; vol. 2016-September).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

BiCMOS technology

Investigation of current flow during wafer-level CDM using real-time probing

Jack, N., Shukla, V. & Rosenbaum, E., Dec 24 2010, Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2010, EOS/ESD 2010. 5623758. (Electrical Overstress/Electrostatic Discharge Symposium Proceedings).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Circuit simulation
Induced currents
Electric potential

Investigation of product burn-in failures due to powered NPN bipolar latching of active MOSFET rail clamps

Ruth, S., Miller, J. W., Gerdemann, A., Stockinger, M., Etherton, M., Moosa, M., Dobbin, A., Mertens, R., Meng, K. H., Rosenbaum, E., Colombo, P., Cordoni, M. & Guitard, N., Oct 16 2013, Electrical Overstress/Electrostatic Discharge Symposium Proceedings, EOS/ESD 2013. 6635940. (Electrical Overstress/Electrostatic Discharge Symposium Proceedings).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Clamping devices
Rails

Latch-up model of non-collinear PNPN structures

Reiman, C., Jack, N. & Rosenbaum, E., Oct 25 2018, Electrical Overstress/Electrostatic Discharge Symposium Proceedings, EOS/ESD 2018. ESD Association, Vol. 2018-September.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Circuit simulation
Thyristors
Electric potential
FinFET

Layout-aware, distributed, compact model for multi-finger MOSFETs operating under ESD conditions

Meng, K. H. & Rosenbaum, E., Oct 16 2013, Electrical Overstress/Electrostatic Discharge Symposium Proceedings, EOS/ESD 2013. 6635912. (Electrical Overstress/Electrostatic Discharge Symposium Proceedings).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Parameter extraction
Electric lines
Geometry
Electric potential

Layout guidelines for optimized ESD protection diodes

Bhatia, K. & Rosenbaum, E., Dec 1 2007, 2007 29th Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD. 4401727. (Electrical Overstress/Electrostatic Discharge Symposium Proceedings).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

layouts
diodes
junction diodes
figure of merit
geometry

Layout sensitivities of transient external latchup

Kripanidhi, A. & Rosenbaum, E., Sep 28 2012, 2012 IEEE International Reliability Physics Symposium, IRPS 2012. 6241821. (IEEE International Reliability Physics Symposium Proceedings).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Physics

Mixed device-circuit solution for ESD protection of high-voltage fast pins

Vashchenko, V. A., Olson, N., Farrenkopf, D., Kuznetsov, V., Hopper, P. & Rosenbaum, E., Sep 25 2007, 2007 IEEE International Reliability Physics Symposium Proceedings, 45th Annual. p. 602-603 2 p. 4227712. (Annual Proceedings - Reliability Physics (Symposium)).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Voltage regulators
Analog circuits
Thyristors
Networks (circuits)
Electric potential

Modeling of majority and minority carrier triggered external latchup

Farbiz, F. & Rosenbaum, E., Sep 17 2008, 46th Annual 2008 IEEE International Reliability Physics Symposium Proceedings, IRPS. p. 270-277 8 p. 4558897. (IEEE International Reliability Physics Symposium Proceedings).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Networks (circuits)
Testing
Substrates

Moving signals on and off chip

Rosenbaum, E., Bae, H. M., Bhatia, K. S. & Faust, A. C., Dec 1 2009, 2009 IEEE Custom Integrated Circuits Conference, CICC '09. p. 585-592 8 p. 5280774. (Proceedings of the Custom Integrated Circuits Conference).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Networks (circuits)

Multiple Output Domino Logic (MODL) in SOI

Kanj, R. & Rosenbaum, E., 2001, IEEE International SOI Conference. p. 59-60 2 p.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Silicon
Logic design
Logic gates

On-chip ESD protection for RFICs

Rosenbaum, E. & Hyvonen, S., Jan 1 2006, Radio Design in Nanometer Technologies. Kluwer Academic Publishers, p. 173-192 20 p. (Radio Design in Nanometer Technologies).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

chips

On-chip monitors of supply noise generated by system-level ESD

Thomson, N., Reiman, C., Xiu, Y. & Rosenbaum, E., Oct 18 2017, Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2017, EOS/ESD 2017. ESD Association, (Electrical Overstress/Electrostatic Discharge Symposium Proceedings).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Networks (circuits)
Electric potential

Practical methodology for the extraction of SEED models

Reiman, C., Thomson, N., Xiu, Y., Mertens, R. & Rosenbaum, E., Oct 30 2015, Electrical Overstress/Electrostatic Discharge Symposium Proceedings, EOS/ESD 2015. ESD Association, (Electrical Overstress/Electrostatic Discharge Symposium Proceedings; vol. 2015-October).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Integrated circuits

Predictive modeling of peak discharge current during charged device model test of microelectronic components

Shukla, V., Boselli, G., Dissegna, M., Duvvury, C., Sankaralingam, R. & Rosenbaum, E., Oct 16 2013, Electrical Overstress/Electrostatic Discharge Symposium Proceedings, EOS/ESD 2013. 6635951. (Electrical Overstress/Electrostatic Discharge Symposium Proceedings).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Microelectronics
Electric potential

Predictive simulation of CDM events to study effects of package, substrate resistivity and placement of ESD protection circuits on reliability of integrated circuits

Shukla, V., Jack, N. & Rosenbaum, E., Oct 20 2010, 2010 IEEE International Reliability Physics Symposium, IRPS 2010. p. 485-493 9 p. 5488782. (IEEE International Reliability Physics Symposium Proceedings).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Integrated circuits
Networks (circuits)
Substrates
Clamping devices
Diodes

Present understanding of gate oxide wearout

Rosenbaum, E. & Wu, J., Jan 1 2000, ESSDERC 2000 - Proceedings of the 30th European Solid-State Device Research Conference. Grunbacher, H., Crean, G. M., Lane, W. A. & McCabe, F. A. (eds.). IEEE Computer Society, p. 54-59 6 p. 1503647. (European Solid-State Device Research Conference).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Lead oxide
Electron traps
Oxides
Electron tunneling
Conduction bands

Separating SCR and trigger circuit related overshoot in SCR-based ESD protection circuits

Mertens, R. & Rosenbaum, E., Oct 16 2013, Electrical Overstress/Electrostatic Discharge Symposium Proceedings, EOS/ESD 2013. 6635915. (Electrical Overstress/Electrostatic Discharge Symposium Proceedings).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Trigger circuits
Thyristors
Networks (circuits)
Circuit simulation
Electric potential

SOI poly-defined diode for ESD protection in high speed I/Os

Chen, V., Salman, A., Beebe, S., Rosenbaum, E., Mitra, S., Putnam, C. & Gauthier, R., Dec 1 2006, 2006 IEEE International Reliability Physics Symposium Proceedings, 44th Annual. p. 635-636 2 p. 4017240. (IEEE International Reliability Physics Symposium Proceedings).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Diodes

S-parameter based modeling of system-level ESD test bed

Xiu, Y., Thomson, N., Mertens, R. & Rosenbaum, E., Oct 30 2015, Electrical Overstress/Electrostatic Discharge Symposium Proceedings, EOS/ESD 2015. ESD Association, (Electrical Overstress/Electrostatic Discharge Symposium Proceedings; vol. 2015-October).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Scattering parameters
Networks (circuits)

Stochastic modeling of air electrostatic discharge parameters

Xiu, Y., Sagan, S., Battini, A., Ma, X., Raginsky, M. & Rosenbaum, E., May 25 2018, 2018 IEEE International Reliability Physics Symposium, IRPS 2018. Institute of Electrical and Electronics Engineers Inc., p. 2C.21-2C.210 (IEEE International Reliability Physics Symposium Proceedings; vol. 2018-March).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Electrostatic discharge
Atmospheric humidity
Electric potential
Air
Discharge (fluid mechanics)

Study of design factors affecting turn-on time of silicon controlled rectifiers (SCRs) in 90 and 65NM bulk CMOS technologies

Sarro, J. D., Chatty, K., Gauthier, R. & Rosenbaum, E., Dec 1 2006, 2006 IEEE International Reliability Physics Symposium Proceedings, 44th Annual. p. 163-168 6 p. 4017151. (IEEE International Reliability Physics Symposium Proceedings).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Thyristors
Electric lines

Test chip design for study of CDM related failures in SoC designs

Olson, N., Shukla, V. & Rosenbaum, E., Jun 23 2011, 2011 International Reliability Physics Symposium, IRPS 2011. 5784566. (IEEE International Reliability Physics Symposium Proceedings).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Testing

The effects of oxide stress waveform on MOSFET performance

Rosenbaum, E., Liu, Z. & Hu, C., Jan 1 1991, International Electron Devices Meeting 1991, IEDM 1991. Institute of Electrical and Electronics Engineers Inc., p. 719-722 4 p. 235322. (Technical Digest - International Electron Devices Meeting, IEDM; vol. 1991-January).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Oxides
waveforms
field effect transistors
oxides
Degradation

The need for transient I-V measurement of device ESD response

Meng, K. H. & Rosenbaum, E., Nov 27 2012, Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2012, EOS/ESD 2012. 6333318. (Electrical Overstress/Electrostatic Discharge Symposium Proceedings).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Circuit simulation
Tuning
Testing

Transmission line pulsed waveform shaping with microwave filters

Joshi, S. & Rosenbaum, E., 2003, 2003 Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD 2003. ESD Association, Vol. 2003-January. 5272002

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Microwave filters
Electric lines
Passive filters
Matched filters
Low pass filters

Trap-assisted tunneling current through ultra-thin oxide

Wu, J., Register, L. F. & Rosenbaum, E., Jan 1 1999, Annual Proceedings - Reliability Physics (Symposium). IEEE, p. 389-395 7 p. (Annual Proceedings - Reliability Physics (Symposium)).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Electron tunneling
Conduction bands
Leakage currents
Cathodes
Oxides

Understanding transient latchup hazards and the impact of guard rings

Farbiz, F. & Rosenbaum, E., Oct 20 2010, 2010 IEEE International Reliability Physics Symposium, IRPS 2010. p. 466-473 8 p. 5488787. (IEEE International Reliability Physics Symposium Proceedings).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Hazards
Testing

UVeriESD: An ESD verification tool for SoC design

Kelvin Hsueh, K., Ke, S. H., Lee, J. & Rosenbaum, E., Dec 1 2008, Proceedings of APCCAS 2008 - 2008 IEEE Asia Pacific Conference on Circuits and Systems. p. 53-56 4 p. 4745958. (IEEE Asia-Pacific Conference on Circuits and Systems, Proceedings, APCCAS).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Hazards
Planning
Defects
System-on-chip
Voltage drop

Verilog-A compatible recurrent neural network model for transient circuit simulation

Chen, Z., Raginsky, M. & Rosenbaum, E., Apr 2 2018, 2017 IEEE 26th Conference on Electrical Performance of Electronic Packaging and Systems, EPEPS 2017. Institute of Electrical and Electronics Engineers Inc., p. 1-3 3 p. (2017 IEEE 26th Conference on Electrical Performance of Electronic Packaging and Systems, EPEPS 2017; vol. 2018-January).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Computer hardware description languages
Recurrent neural networks
Circuit simulation
Networks (circuits)
Simulators

Voltage monitor circuit for ESD diagnosis

Jack, N. & Rosenbaum, E., Nov 10 2011, Electrical Overstress/Electrostatic Discharge Symposium Proceedings - 2011, EOS/ESD 2011. 6045614. (Electrical Overstress/Electrostatic Discharge Symposium Proceedings).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Networks (circuits)
Electric potential

WCDM2 - Wafer-level charged device model testing with high repeatability

Jack, N., Maloney, T. J., Chou, B. & Rosenbaum, E., Jun 23 2011, 2011 International Reliability Physics Symposium, IRPS 2011. 5784509. (IEEE International Reliability Physics Symposium Proceedings).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Testing
Editorial

Preface

Rosenbaum, E., May 25 2018, In : IEEE International Reliability Physics Symposium Proceedings. 2018-March, 1 p.

Research output: Contribution to journalEditorial

Special Issue on Reliability

Mahapatra, S., Chen, K. J., Kaczer, B., Pancheri, L., Rosenbaum, E., Mouli, C., Wong, H., Kerber, A., Monzio Compagnoni, C., Koval, R., Meneghesso, G., Sheridan, D., Ramey, S., Wang, R. & Stathis, J., Nov 2019, In : IEEE Transactions on Electron Devices. 66, 11, p. 4497-4503 7 p., 8886623.

Research output: Contribution to journalEditorial

Paper

Bipolar leakage modeling for switch-level simulators

Kanj, R., Rosenbaum, E. & Lehner, T., Jan 1 2002, p. 147-149. 3 p.

Research output: Contribution to conferencePaper

Simulators
Switches
Electric potential

Circuit-level electrothermal simulation techniques for designing output protection devices

Ramaswamy, S., Rosenbaum, E. & Kang, S. M., Dec 1 1994, p. 79-82. 4 p.

Research output: Contribution to conferencePaper

Networks (circuits)
Simulators
Integrated circuits
Computer aided design
Specifications

CMOS hot carrier lifetime improvement from deuterium anneal

Li, E., Rosenbaum, E., Tao, J. & Fang, P., Dec 1 1998, p. 22-23. 2 p.

Research output: Contribution to conferencePaper

Hot carriers
Carrier lifetime
Interface states
Deuterium
Hot electrons

Interconnect thermal modeling for determining design limits on current density

Chen, D., Li, E., Rosenbaum, E. & Kang, S. M., Jan 1 1999, p. 172-178. 7 p.

Research output: Contribution to conferencePaper

Current density
Geometry
Temperature
Finite element method
Substrates

New algorithm for circuit-level electrothermal simulation under EOS/ESD stress

Li, T., Tsai, C. H., Huh, Y. J., Rosenbaum, E. & Kang, S. M., Dec 1 1997, p. 130-131. 2 p.

Research output: Contribution to conferencePaper

Simulators
Networks (circuits)
Temperature