1989 …2019
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Research Output 1989 2019

2005

Combined TLP/RF testing system for detection of ESD failures in RF circuits

Hyvonen, S., Joshi, S. & Rosenbaum, E., Jul 1 2005, In : IEEE Transactions on Electronics Packaging Manufacturing. 28, 3, p. 224-230 7 p.

Research output: Contribution to journalArticle

Electrostatic discharge
Leakage currents
Electric lines
Electric current measurement
Networks (circuits)

Comprehensive ESD protection for RF inputs

Hyvonen, S., Joshi, S. & Rosenbaum, E., Feb 1 2005, In : Microelectronics Reliability. 45, 2, p. 245-254 10 p.

Research output: Contribution to journalArticle

Networks (circuits)
circuit protection
human body
figure of merit
narrowband

Comprehensive study of drain breakdown in MOSFETs

Li, J., Li, H., Barnes, R. & Rosenbaum, E., Jun 1 2005, In : IEEE Transactions on Electron Devices. 52, 6, p. 1180-1186 7 p.

Research output: Contribution to journalArticle

Electric breakdown
Electric potential
Substrates

Diode-based tuned ESD protection for 5.25-GHz CMOS LNAs

Hyvonen, S. & Rosenbaum, E., Dec 1 2005, 2005 Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD 2005. 5271825. (Electrical Overstress/Electrostatic Discharge Symposium Proceedings).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Diodes
Networks (circuits)

High-Q electrostatic discharge (ESD) protection devices for use at radio frequency (RF) and broad-band I/O pins

Joshi, S., Hyvonen, S. & Rosenbaum, E., Jul 1 2005, In : IEEE Transactions on Electron Devices. 52, 7, p. 1484-1488 5 p.

Research output: Contribution to journalArticle

Electrostatic discharge
Capacitance
Trigger circuits
Matched filters
Resonators

On-Chip ESD protection for RF I/Os: Devices, circuits and models

Rosenbaum, E. & Hyvonen, S., Dec 1 2005, In : Proceedings - IEEE International Symposium on Circuits and Systems. p. 1202-1205 4 p., 1464809.

Research output: Contribution to journalConference article

Networks (circuits)
2004

A compact, timed-shutoff, MOSFET-based power clamp for on-chip ESD protection

Li, J., Gauthier, R. & Rosenbaum, E., Dec 1 2004, 2004 Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD '04. 5272597. (Electrical Overstress/Electrostatic Discharge Symposium Proceedings).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Clamping devices
Feedback
Trigger circuits
Capacitors

Critical evaluation of SOI design guidelines

Kanj, R. & Rosenbaum, E., Sep 1 2004, In : IEEE Transactions on Very Large Scale Integration (VLSI) Systems. 12, 9, p. 885-894 10 p.

Research output: Contribution to journalArticle

Silicon
Silicon on insulator technology
Logic design
Networks (circuits)
Adders

Design and optimization of vertical SiGe thyristors for on-chip BSD protection

Joshi, S., Ida, R. & Rosenbaum, E., Dec 1 2004, In : IEEE Transactions on Device and Materials Reliability. 4, 4, p. 586-593 8 p.

Research output: Contribution to journalArticle

Thyristors
Integrated circuits
Anodes
Geometry
Experiments

Gate oxide reliability under ESD-like pulse stress

Wu, J. & Rosenbaum, E., Sep 1 2004, In : IEEE Transactions on Electron Devices. 51, 9, p. 1528-1532 5 p.

Research output: Contribution to journalArticle

Oxides
Electrostatic discharge
Electric breakdown
Heating

Gate oxide reliability under ESD-like pulse stress

Wu, J. & Rosenbaum, E., Jul 1 2004, In : IEEE Transactions on Electron Devices. 51, 7, p. 1192-1196 5 p.

Research output: Contribution to journalArticle

Oxides
Electrostatic discharge
Electric breakdown
Heating

Improved wafer-level VFTLP system and investigation of device turn-on effects

Li, J., Hyvonen, S. & Rosenbaum, E., Dec 1 2004, 2004 Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD '04. 5272590. (Electrical Overstress/Electrostatic Discharge Symposium Proceedings).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Diodes
Electric potential

Noise characterization of static CMOS gates

Kanj, R., Lehner, T., Agrawal, B. & Rosenbaum, E., Sep 20 2004, In : Proceedings - Design Automation Conference. p. 888-893 6 p.

Research output: Contribution to journalConference article

Logic gates
Equivalent circuits
Mathematical models
Networks (circuits)
2003

A study of vertical SiGe thyristor design and optimization

Joshi, S., Ida, R. & Rosenbaum, E., Jan 1 2003, 2003 Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD 2003. ESD Association, 5272020. (Electrical Overstress/Electrostatic Discharge Symposium Proceedings; vol. 2003-January).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Thyristors
Integrated circuits
Anodes
Geometry
Experiments

A Verilog-A compact model for ESD protection NMOSTs

Li, J., Joshi, S. & Rosenbaum, E., Nov 19 2003, In : Proceedings of the Custom Integrated Circuits Conference. p. 253-256 4 p.

Research output: Contribution to journalConference article

Computer hardware description languages
Simulators
Networks (circuits)

Cancellation technique to provide ESD protection for multi-GHz RF inputs

Hyvonen, S., Joshi, S. & Rosenbaum, E., Feb 6 2003, In : Electronics Letters. 39, 3, p. 284-286 3 p.

Research output: Contribution to journalArticle

Combined TLP/RF testing system for detection of ESD failures in RF circuits

Hyvonen, S., Joshi, S. & Rosenbaum, E., Jan 1 2003, 2003 Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD 2003. ESD Association, 5272004. (Electrical Overstress/Electrostatic Discharge Symposium Proceedings; vol. 2003-January).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Leakage currents
Electric current measurement
Networks (circuits)
Testing

Comprehensive ESD protection for RF inputs

Hyvonen, S., Joshi, S. & Rosenbaum, E., Jan 1 2003, 2003 Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD 2003. ESD Association, 5272024. (Electrical Overstress/Electrostatic Discharge Symposium Proceedings; vol. 2003-January).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Networks (circuits)

ESD protection for broadband ICs (DC-20 GHz and beyond)

Joshi, S. & Rosenbaum, E., Jun 12 2003, In : Electronics Letters. 39, 12, p. 906-908 3 p.

Research output: Contribution to journalArticle

Microwave filters
Cutoff frequency
Networks (circuits)

Simulator-independent compact modeling of vertical npn transistors for ESD and RF circuit simulation

Joshi, S. & Rosenbaum, E., Jul 1 2003, In : Microelectronics Reliability. 43, 7, p. 1021-1027 7 p.

Research output: Contribution to journalArticle

Circuit simulation
simulators
Transistors
transistors
Simulators

Transmission line pulsed waveform shaping with microwave filters

Joshi, S. & Rosenbaum, E., 2003, 2003 Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD 2003. ESD Association, Vol. 2003-January. 5272002

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Microwave filters
Electric lines
Passive filters
Matched filters
Low pass filters
2002
Logic gates

Bipolar leakage modeling for switch-level simulators

Kanj, R., Rosenbaum, E. & Lehner, T., Jan 1 2002, p. 147-149. 3 p.

Research output: Contribution to conferencePaper

Simulators
Switches
Electric potential

Compact modeling of vertical ESD protection NPN transistors for RF circuits

Joshi, S. & Rosenbaum, E., Jan 1 2002, Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD 2002 - Proceedings. ESD Association, p. 292-298 7 p. 5267008. (Electrical Overstress/Electrostatic Discharge Symposium Proceedings; vol. 2002-January).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Circuit simulation
Transistors
Networks (circuits)
Simulators
Silicon

Comprehensive frequency-dependent substrate noise analysis using boundary element methods

Li, H., Carballido, J., Yu, H. H., Okhmatovski, V. I., Rosenbaum, E. & Cangellaris, A. C., Jan 1 2002, In : IEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers. p. 2-9 8 p.

Research output: Contribution to journalArticle

Boundary element method
Substrates
Electrodynamics
Green's function
Doping (additives)

Comprehensive frequency-dependent substrate noise analysis using boundary element methods

Li, H., Carballido, J., Yu, H. H., Okhmatovski, V. I., Rosenbaum, E. & Cangellaris, A. C., Dec 1 2002, In : IEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers. p. 2-9 8 p.

Research output: Contribution to journalConference article

Boundary element method
Substrates
Electrodynamics
Green's function
Doping (additives)
2001
Level measurement
Electrostatic discharge
Electric lines

An analysis of bipolar breakdown and its application to the design of ESD protection circuits

Joshi, S., Ida, R., Givelin, P. & Rosenbaum, E., 2001, 2001 IEEE International Reliability Physics Symposium Proceedings - 39th Annual. Institute of Electrical and Electronics Engineers Inc., p. 240-245 6 p. 922908. (Annual Proceedings - Reliability Physics (Symposium)).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Networks (circuits)
Zener diodes
Electric breakdown

A novel SCR macromodel for ESD circuit simulation

Juliano, P. A. & Rosenbaum, E., Dec 1 2001, In : Technical Digest - International Electron Devices Meeting. p. 319-322 4 p.

Research output: Contribution to journalConference article

silicon controlled rectifiers
Electrostatic discharge
Circuit simulation
Thyristors
electrostatics

Breakdown and latent damage of ultra-thin gate oxides under ESD stress conditions

Wu, J., Juliano, P. & Rosenbaum, E., Nov 1 2001, In : Microelectronics Reliability. 41, 11, p. 1771-1779 9 p.

Research output: Contribution to journalArticle

Oxides
breakdown
damage
oxides
Electric potential

Electrothermal model for simulation of bulk-Si and SOI diodes in ESD protection circuits

Wang, Y., Juliano, P., Joshi, S. & Rosenbaum, E., Nov 1 2001, In : Microelectronics Reliability. 41, 11, p. 1781-1787 7 p.

Research output: Contribution to journalArticle

circuit protection
SOI (semiconductors)
Diodes
diodes
Networks (circuits)

Multiple Output Domino Logic (MODL) in SOI

Kanj, R. & Rosenbaum, E., 2001, IEEE International SOI Conference. p. 59-60 2 p.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Silicon
Logic design
Logic gates

Projecting lifetime of deep submicron MOSFETs

Li, E., Rosenbaum, E., Tao, J. & Fang, P., Apr 1 2001, In : IEEE Transactions on Electron Devices. 48, 4, p. 671-678 8 p.

Research output: Contribution to journalArticle

Degradation
Hot carriers
Deuterium
Electric potential
Metallizing

Trap generation and breakdown processes in very thin gate oxides

Rosenbaum, E. & Wu, J., May 2001, In : Microelectronics Reliability. 41, 5, p. 625-632 8 p.

Research output: Contribution to journalArticle

Oxides
breakdown
traps
Leakage currents
oxides
2000

Anode hole injection versus hydrogen release: The mechanism for gate oxide breakdown

Wu, J., Rosenbaum, E., MacDonald, B., Li, E., Tao, J., Tracy, B. & Fang, P., Jan 1 2000, In : Annual Proceedings - Reliability Physics (Symposium). p. 27-32 6 p.

Research output: Contribution to journalArticle

Deuterium
Anodes
Hydrogen
Oxides
Metallizing

Breakdown and latent damage of ultra-thin gate oxides under ESD stress conditions

Wu, J., Juliano, P. & Rosenbaum, E., Dec 1 2000, In : Electrical Overstress/Electrostatic Discharge Symposium Proceedings. p. 287-295 9 p.

Research output: Contribution to journalConference article

breakdown
damage
oxides
pulse duration
traps

Electrostatic discharge and high current pulse characterization of epitaxial-base silicon-germanium heterojunction bipolar transistors

Voldman, S., Juliano, P., Johnson, R., Schmidt, N., Joseph, A., Furkay, S., Rosenbaum, E., Dunn, J., Harame, D. & Meyerson, B., Jan 1 2000, In : Annual Proceedings - Reliability Physics (Symposium). p. 310-316 7 p.

Research output: Contribution to journalArticle

Electrostatic discharge
Heterojunction bipolar transistors
Germanium
Silicon
Failure analysis

Electrostatic discharge characterization of epitaxial-base silicon-germanium heterojunction bipolar transistors

Voldman, S., Juliano, P., Schmidt, N., Johnson, R., Lanzerotti, L., Joseph, A., Brennan, C., Dunn, J., Harame, D., Rosenbaum, E. & Meyerson, B., Dec 1 2000, In : Electrical Overstress/Electrostatic Discharge Symposium Proceedings. p. 239-250 12 p.

Research output: Contribution to journalConference article

bipolar transistors
accumulators
heterojunctions
germanium
electrostatics

Electrothermal modeling of ESD diodes in bulk-Si and SOI technologies

Wang, Y., Juliano, P., Joshi, S. & Rosenbaum, E., Dec 1 2000, In : Electrical Overstress/Electrostatic Discharge Symposium Proceedings. p. 430-436 7 p.

Research output: Contribution to journalConference article

SOI (semiconductors)
diodes
simulators
high current
breakdown

Hot carrier induced degradation in deep submicron MOSFETs at 100 °C

Li, E., Rosenbaum, E., Register, L. F., Tao, J. & Fang, P., 2000, In : Annual Proceedings - Reliability Physics (Symposium). p. 103-107 5 p.

Research output: Contribution to journalArticle

Hot carriers
Degradation
Networks (circuits)
Testing
Temperature

Interconnect thermal modeling for accurate simulation of circuit timing and reliability

Chen, D., Li, E., Rosenbaum, E. & Kang, S. M., Jan 1 2000, In : IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 19, 2, p. 197-205 9 p.

Research output: Contribution to journalArticle

Timing circuits
Geometry
Temperature
Computer aided design
Current density

On the mechanism for interface trap generation in MOS transistors due to channel hot carrier stressing

Chen, Z., Hess, K., Lee, J., Lyding, J. W., Rosenbaum, E., Kizilyalli, I., Chetlur, S. & Huang, R., Jan 1 2000, In : IEEE Electron Device Letters. 21, 1, p. 24-26 3 p.

Research output: Contribution to journalArticle

Hot carriers
MOSFET devices
Isotopes
Hot electrons
Oxides

Present understanding of gate oxide wearout

Rosenbaum, E. & Wu, J., Jan 1 2000, ESSDERC 2000 - Proceedings of the 30th European Solid-State Device Research Conference. Grunbacher, H., Crean, G. M., Lane, W. A. & McCabe, F. A. (eds.). IEEE Computer Society, p. 54-59 6 p. 1503647. (European Solid-State Device Research Conference).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Lead oxide
Electron traps
Oxides
Electron tunneling
Conduction bands
1999

Analytic model for direct tunneling current in polycrystalline silicon-gate metal-oxide-semiconductor devices

Register, L. F., Rosenbaum, E. & Yang, K., Jan 18 1999, In : Applied Physics Letters. 74, 3, p. 457-459 3 p.

Research output: Contribution to journalArticle

semiconductor devices
metal oxide semiconductors
Wentzel-Kramer-Brillouin method
silicon
electron impact

EOS/ESD reliability of partially depleted SOI technology

Raha, P., Diaz, C., Rosenbaum, E., Cao, M., Vandevoorde, P. & Greene, W., Dec 1 1999, In : IEEE Transactions on Electron Devices. 46, 2, p. 429-431 3 p.

Research output: Contribution to journalArticle

Electrostatic discharge
Diodes
Simulators
Networks (circuits)

Hot carrier effects in nMOSFETs in 0.1μm CMOS technology

Li, E., Rosenbaum, E., Tao, J., Yeap, G. C. F., Lin, M. R. & Fang, P., Jan 1 1999, Annual Proceedings - Reliability Physics (Symposium). Institute of Electrical and Electronics Engineers Inc., p. 253-258 6 p. (Annual Proceedings - Reliability Physics (Symposium)).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Hot carriers
Bias currents
Carrier lifetime
Deuterium
Metallizing

Interconnect thermal modeling for determining design limits on current density

Chen, D., Li, E., Rosenbaum, E. & Kang, S. M., Jan 1 1999, p. 172-178. 7 p.

Research output: Contribution to conferencePaper

Current density
Geometry
Temperature
Finite element method
Substrates

Mechanism for hot-carrier-induced interface trap generation in MOS transistors

Chen, Z., Hess, K., Lee, J., Lyding, J. W., Rosenbaum, E., Kizilyalli, I. & Chetlur, S., Dec 1 1999, In : Technical Digest - International Electron Devices Meeting. p. 85-88 4 p.

Research output: Contribution to journalConference article

Hot carriers
MOSFET devices
Isotopes
transistors
traps

Substrate modeling and lumped substrate resistance extraction for CMOS ESD/latchup circuit simulation

Li, T., Tsai, C. H., Rosenbaum, E. & Kang, S. M., Jan 1 1999, In : Proceedings - Design Automation Conference. p. 549-554 6 p.

Research output: Contribution to journalConference article

Electrostatic discharge
Circuit simulation
Substrates
Networks (circuits)
Integrated circuit layout