1989 …2019

Research output per year

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Research Output

2005

Combined TLP/RF testing system for detection of ESD failures in RF circuits

Hyvonen, S., Joshi, S. & Rosenbaum, E., Jul 1 2005, In : IEEE Transactions on Electronics Packaging Manufacturing. 28, 3, p. 224-230 7 p.

Research output: Contribution to journalArticle

Comprehensive ESD protection for RF inputs

Hyvonen, S., Joshi, S. & Rosenbaum, E., Feb 1 2005, In : Microelectronics Reliability. 45, 2, p. 245-254 10 p.

Research output: Contribution to journalArticle

Comprehensive study of drain breakdown in MOSFETs

Li, J., Li, H., Barnes, R. & Rosenbaum, E., Jun 1 2005, In : IEEE Transactions on Electron Devices. 52, 6, p. 1180-1186 7 p.

Research output: Contribution to journalArticle

Diode-based tuned ESD protection for 5.25-GHz CMOS LNAs

Hyvonen, S. & Rosenbaum, E., Dec 1 2005, 2005 Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD 2005. 5271825. (Electrical Overstress/Electrostatic Discharge Symposium Proceedings).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

High-Q electrostatic discharge (ESD) protection devices for use at radio frequency (RF) and broad-band I/O pins

Joshi, S., Hyvonen, S. & Rosenbaum, E., Jul 1 2005, In : IEEE Transactions on Electron Devices. 52, 7, p. 1484-1488 5 p.

Research output: Contribution to journalArticle

On-Chip ESD protection for RF I/Os: Devices, circuits and models

Rosenbaum, E. & Hyvonen, S., Dec 1 2005, In : Proceedings - IEEE International Symposium on Circuits and Systems. p. 1202-1205 4 p., 1464809.

Research output: Contribution to journalConference article

2004

A compact, timed-shutoff, MOSFET-based power clamp for on-chip ESD protection

Li, J., Gauthier, R. & Rosenbaum, E., Dec 1 2004, 2004 Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD '04. 5272597. (Electrical Overstress/Electrostatic Discharge Symposium Proceedings).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Critical evaluation of SOI design guidelines

Kanj, R. & Rosenbaum, E., Sep 1 2004, In : IEEE Transactions on Very Large Scale Integration (VLSI) Systems. 12, 9, p. 885-894 10 p.

Research output: Contribution to journalArticle

Design and optimization of vertical SiGe thyristors for on-chip BSD protection

Joshi, S., Ida, R. & Rosenbaum, E., Dec 1 2004, In : IEEE Transactions on Device and Materials Reliability. 4, 4, p. 586-593 8 p.

Research output: Contribution to journalArticle

Gate oxide reliability under ESD-like pulse stress

Wu, J. & Rosenbaum, E., Jul 1 2004, In : IEEE Transactions on Electron Devices. 51, 7, p. 1192-1196 5 p.

Research output: Contribution to journalArticle

Gate oxide reliability under ESD-like pulse stress

Wu, J. & Rosenbaum, E., Sep 1 2004, In : IEEE Transactions on Electron Devices. 51, 9, p. 1528-1532 5 p.

Research output: Contribution to journalArticle

Improved wafer-level VFTLP system and investigation of device turn-on effects

Li, J., Hyvonen, S. & Rosenbaum, E., Dec 1 2004, 2004 Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD '04. 5272590. (Electrical Overstress/Electrostatic Discharge Symposium Proceedings).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Noise characterization of static CMOS gates

Kanj, R., Lehner, T., Agrawal, B. & Rosenbaum, E., Sep 20 2004, In : Proceedings - Design Automation Conference. p. 888-893 6 p.

Research output: Contribution to journalConference article

2003

A study of vertical SiGe thyristor design and optimization

Joshi, S., Ida, R. & Rosenbaum, E., Jan 1 2003, 2003 Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD 2003. ESD Association, 5272020. (Electrical Overstress/Electrostatic Discharge Symposium Proceedings; vol. 2003-January).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

A Verilog-A compact model for ESD protection NMOSTs

Li, J., Joshi, S. & Rosenbaum, E., Nov 19 2003, In : Proceedings of the Custom Integrated Circuits Conference. p. 253-256 4 p.

Research output: Contribution to journalConference article

Cancellation technique to provide ESD protection for multi-GHz RF inputs

Hyvonen, S., Joshi, S. & Rosenbaum, E., Feb 6 2003, In : Electronics Letters. 39, 3, p. 284-286 3 p.

Research output: Contribution to journalArticle

Combined TLP/RF testing system for detection of ESD failures in RF circuits

Hyvonen, S., Joshi, S. & Rosenbaum, E., Jan 1 2003, 2003 Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD 2003. ESD Association, 5272004. (Electrical Overstress/Electrostatic Discharge Symposium Proceedings; vol. 2003-January).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Comprehensive ESD protection for RF inputs

Hyvonen, S., Joshi, S. & Rosenbaum, E., Jan 1 2003, 2003 Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD 2003. ESD Association, 5272024. (Electrical Overstress/Electrostatic Discharge Symposium Proceedings; vol. 2003-January).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

ESD protection for broadband ICs (DC-20 GHz and beyond)

Joshi, S. & Rosenbaum, E., Jun 12 2003, In : Electronics Letters. 39, 12, p. 906-908 3 p.

Research output: Contribution to journalArticle

Simulator-independent compact modeling of vertical npn transistors for ESD and RF circuit simulation

Joshi, S. & Rosenbaum, E., Jul 1 2003, In : Microelectronics Reliability. 43, 7, p. 1021-1027 7 p.

Research output: Contribution to journalArticle

Transmission line pulsed waveform shaping with microwave filters

Joshi, S. & Rosenbaum, E., 2003, 2003 Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD 2003. ESD Association, Vol. 2003-January. 5272002

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2002

Bipolar leakage modeling for switch-level simulators

Kanj, R., Rosenbaum, E. & Lehner, T., Jan 1 2002, p. 147-149. 3 p.

Research output: Contribution to conferencePaper

Compact modeling of vertical ESD protection NPN transistors for RF circuits

Joshi, S. & Rosenbaum, E., Jan 1 2002, Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD 2002 - Proceedings. ESD Association, p. 292-298 7 p. 5267008. (Electrical Overstress/Electrostatic Discharge Symposium Proceedings; vol. 2002-January).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Comprehensive frequency-dependent substrate noise analysis using boundary element methods

Li, H., Carballido, J., Yu, H. H., Okhmatovski, V. I., Rosenbaum, E. & Cangellaris, A. C., Dec 1 2002, In : IEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers. p. 2-9 8 p.

Research output: Contribution to journalConference article

Comprehensive frequency-dependent substrate noise analysis using boundary element methods

Li, H., Carballido, J., Yu, H. H., Okhmatovski, V. I., Rosenbaum, E. & Cangellaris, A. C., Jan 1 2002, In : IEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers. p. 2-9 8 p.

Research output: Contribution to journalArticle

2001

An analysis of bipolar breakdown and its application to the design of ESD protection circuits

Joshi, S., Ida, R., Givelin, P. & Rosenbaum, E., 2001, 2001 IEEE International Reliability Physics Symposium Proceedings - 39th Annual. Institute of Electrical and Electronics Engineers Inc., p. 240-245 6 p. 922908. (Annual Proceedings - Reliability Physics (Symposium)).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

A novel SCR macromodel for ESD circuit simulation

Juliano, P. A. & Rosenbaum, E., Dec 1 2001, In : Technical Digest - International Electron Devices Meeting. p. 319-322 4 p.

Research output: Contribution to journalConference article

Breakdown and latent damage of ultra-thin gate oxides under ESD stress conditions

Wu, J., Juliano, P. & Rosenbaum, E., Nov 1 2001, In : Microelectronics Reliability. 41, 11, p. 1771-1779 9 p.

Research output: Contribution to journalArticle

Electrothermal model for simulation of bulk-Si and SOI diodes in ESD protection circuits

Wang, Y., Juliano, P., Joshi, S. & Rosenbaum, E., Nov 1 2001, In : Microelectronics Reliability. 41, 11, p. 1781-1787 7 p.

Research output: Contribution to journalArticle

Multiple Output Domino Logic (MODL) in SOI

Kanj, R. & Rosenbaum, E., 2001, IEEE International SOI Conference. p. 59-60 2 p.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Projecting lifetime of deep submicron MOSFETs

Li, E., Rosenbaum, E., Tao, J. & Fang, P., Apr 1 2001, In : IEEE Transactions on Electron Devices. 48, 4, p. 671-678 8 p.

Research output: Contribution to journalArticle

Trap generation and breakdown processes in very thin gate oxides

Rosenbaum, E. & Wu, J., May 2001, In : Microelectronics Reliability. 41, 5, p. 625-632 8 p.

Research output: Contribution to journalArticle

2000

Anode hole injection versus hydrogen release: The mechanism for gate oxide breakdown

Wu, J., Rosenbaum, E., MacDonald, B., Li, E., Tao, J., Tracy, B. & Fang, P., Jan 1 2000, In : Annual Proceedings - Reliability Physics (Symposium). p. 27-32 6 p.

Research output: Contribution to journalArticle

Breakdown and latent damage of ultra-thin gate oxides under ESD stress conditions

Wu, J., Juliano, P. & Rosenbaum, E., Dec 1 2000, In : Electrical Overstress/Electrostatic Discharge Symposium Proceedings. p. 287-295 9 p.

Research output: Contribution to journalConference article

Electrostatic discharge and high current pulse characterization of epitaxial-base silicon-germanium heterojunction bipolar transistors

Voldman, S., Juliano, P., Johnson, R., Schmidt, N., Joseph, A., Furkay, S., Rosenbaum, E., Dunn, J., Harame, D. & Meyerson, B., Jan 1 2000, In : Annual Proceedings - Reliability Physics (Symposium). p. 310-316 7 p.

Research output: Contribution to journalArticle

Electrostatic discharge characterization of epitaxial-base silicon-germanium heterojunction bipolar transistors

Voldman, S., Juliano, P., Schmidt, N., Johnson, R., Lanzerotti, L., Joseph, A., Brennan, C., Dunn, J., Harame, D., Rosenbaum, E. & Meyerson, B., Dec 1 2000, In : Electrical Overstress/Electrostatic Discharge Symposium Proceedings. p. 239-250 12 p.

Research output: Contribution to journalConference article

Electrothermal modeling of ESD diodes in bulk-Si and SOI technologies

Wang, Y., Juliano, P., Joshi, S. & Rosenbaum, E., Dec 1 2000, In : Electrical Overstress/Electrostatic Discharge Symposium Proceedings. p. 430-436 7 p.

Research output: Contribution to journalConference article

Hot carrier induced degradation in deep submicron MOSFETs at 100 °C

Li, E., Rosenbaum, E., Register, L. F., Tao, J. & Fang, P., 2000, In : Annual Proceedings - Reliability Physics (Symposium). p. 103-107 5 p.

Research output: Contribution to journalArticle

Interconnect thermal modeling for accurate simulation of circuit timing and reliability

Chen, D., Li, E., Rosenbaum, E. & Kang, S. M., Jan 1 2000, In : IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 19, 2, p. 197-205 9 p.

Research output: Contribution to journalArticle

On the mechanism for interface trap generation in MOS transistors due to channel hot carrier stressing

Chen, Z., Hess, K., Lee, J., Lyding, J. W., Rosenbaum, E., Kizilyalli, I., Chetlur, S. & Huang, R., Jan 1 2000, In : IEEE Electron Device Letters. 21, 1, p. 24-26 3 p.

Research output: Contribution to journalArticle

Present understanding of gate oxide wearout

Rosenbaum, E. & Wu, J., Jan 1 2000, ESSDERC 2000 - Proceedings of the 30th European Solid-State Device Research Conference. Grunbacher, H., Crean, G. M., Lane, W. A. & McCabe, F. A. (eds.). IEEE Computer Society, p. 54-59 6 p. 1503647. (European Solid-State Device Research Conference).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1999

Analytic model for direct tunneling current in polycrystalline silicon-gate metal-oxide-semiconductor devices

Register, L. F., Rosenbaum, E. & Yang, K., Jan 18 1999, In : Applied Physics Letters. 74, 3, p. 457-459 3 p.

Research output: Contribution to journalArticle

EOS/ESD reliability of partially depleted SOI technology

Raha, P., Diaz, C., Rosenbaum, E., Cao, M., Vandevoorde, P. & Greene, W., Dec 1 1999, In : IEEE Transactions on Electron Devices. 46, 2, p. 429-431 3 p.

Research output: Contribution to journalArticle

Hot carrier effects in nMOSFETs in 0.1μm CMOS technology

Li, E., Rosenbaum, E., Tao, J., Yeap, G. C. F., Lin, M. R. & Fang, P., Jan 1 1999, Annual Proceedings - Reliability Physics (Symposium). Institute of Electrical and Electronics Engineers Inc., p. 253-258 6 p. (Annual Proceedings - Reliability Physics (Symposium)).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Interconnect thermal modeling for determining design limits on current density

Chen, D., Li, E., Rosenbaum, E. & Kang, S. M., Jan 1 1999, p. 172-178. 7 p.

Research output: Contribution to conferencePaper

Mechanism for hot-carrier-induced interface trap generation in MOS transistors

Chen, Z., Hess, K., Lee, J., Lyding, J. W., Rosenbaum, E., Kizilyalli, I. & Chetlur, S., Dec 1 1999, In : Technical Digest - International Electron Devices Meeting. p. 85-88 4 p.

Research output: Contribution to journalConference article

Substrate modeling and lumped substrate resistance extraction for CMOS ESD/latchup circuit simulation

Li, T., Tsai, C. H., Rosenbaum, E. & Kang, S. M., Jan 1 1999, In : Proceedings - Design Automation Conference. p. 549-554 6 p.

Research output: Contribution to journalConference article

Trap-assisted tunneling current through ultra-thin oxide

Wu, J., Register, L. F. & Rosenbaum, E., Jan 1 1999, Annual Proceedings - Reliability Physics (Symposium). IEEE, p. 389-395 7 p. (Annual Proceedings - Reliability Physics (Symposium)).

Research output: Chapter in Book/Report/Conference proceedingConference contribution