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Research Output

2012

Exponential-edge transmission line pulsing for snap-back device characterization

Thomson, N., Jack, N. & Rosenbaum, E., 2012, 2012 IEEE International Reliability Physics Symposium, IRPS 2012. 6241820

Research output: Chapter in Book/Report/Conference proceedingConference contribution

FEC-based 4 Gb/s backplane transceiver in 90nm CMOS

Faust, A. C., Narasimha, R. L., Bhatia, K., Srivastava, A., Kong, C., Bae, H. M., Rosenbaum, E. & Shanbhag, N. R., Nov 26 2012, Proceedings of the IEEE 2012 Custom Integrated Circuits Conference, CICC 2012. 6330665. (Proceedings of the Custom Integrated Circuits Conference).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Layout sensitivities of transient external latchup

Kripanidhi, A. & Rosenbaum, E., Sep 28 2012, 2012 IEEE International Reliability Physics Symposium, IRPS 2012. 6241821. (IEEE International Reliability Physics Symposium Proceedings).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

The need for transient I-V measurement of device ESD response

Meng, K. H. & Rosenbaum, E., Nov 27 2012, Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2012, EOS/ESD 2012. 6333318. (Electrical Overstress/Electrostatic Discharge Symposium Proceedings).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2011

CDM-ESD induced damage in components using stacked-die packaging

Olson, N., Jack, N., Shukla, V. & Rosenbaum, E., Nov 9 2011, 2011 IEEE Custom Integrated Circuits Conference, CICC 2011. 6055359. (Proceedings of the Custom Integrated Circuits Conference).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Comparison of wafer-level with package-level CDM stress facilitated by real-time probing

Jack, N., Shukla, V. & Rosenbaum, E., Dec 1 2011, In : IEEE Transactions on Device and Materials Reliability. 11, 4, p. 522-530 9 p., 6006519.

Research output: Contribution to journalArticle

Effect of on-chip ESD protection on 10 Gb/s receivers

Faust, A. C., Srivastava, A. & Rosenbaum, E., Nov 10 2011, Electrical Overstress/Electrostatic Discharge Symposium Proceedings - 2011, EOS/ESD 2011. 6045578. (Electrical Overstress/Electrostatic Discharge Symposium Proceedings).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

ESD protection networks for 3D integrated circuits

Rosenbaum, E., Shukla, V. & Keel, M. S., Dec 1 2011, 2011 IEEE International 3D Systems Integration Conference, 3DIC 2011. 6262965. (2011 IEEE International 3D Systems Integration Conference, 3DIC 2011).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Modeling and understanding of external latchup in CMOS technologies-part I: Modeling latchup trigger current

Farbiz, F. & Rosenbaum, E., Sep 1 2011, In : IEEE Transactions on Device and Materials Reliability. 11, 3, p. 417-425 9 p., 5875872.

Research output: Contribution to journalArticle

Test chip design for study of CDM related failures in SoC designs

Olson, N., Shukla, V. & Rosenbaum, E., Jun 23 2011, 2011 International Reliability Physics Symposium, IRPS 2011. 5784566. (IEEE International Reliability Physics Symposium Proceedings).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Voltage monitor circuit for ESD diagnosis

Jack, N. & Rosenbaum, E., Nov 10 2011, Electrical Overstress/Electrostatic Discharge Symposium Proceedings - 2011, EOS/ESD 2011. 6045614. (Electrical Overstress/Electrostatic Discharge Symposium Proceedings).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

WCDM2 - Wafer-level charged device model testing with high repeatability

Jack, N., Maloney, T. J., Chou, B. & Rosenbaum, E., Jun 23 2011, 2011 International Reliability Physics Symposium, IRPS 2011. 5784509. (IEEE International Reliability Physics Symposium Proceedings).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2010

A novel TCAD-based methodology to minimize the impact of parasitic structures on ESD performance

Olson, N., Boselli, G., Salman, A. & Rosenbaum, E., Oct 20 2010, 2010 IEEE International Reliability Physics Symposium, IRPS 2010. p. 474-479 6 p. 5488784. (IEEE International Reliability Physics Symposium Proceedings).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Application of the latency insertion method (LIM) to the modeling of CDM ESD events

Klokotov, D., Shukla, V., Schutt-Ainé, J. & Rosenbaum, E., Aug 9 2010, 2010 Proceedings 60th Electronic Components and Technology Conference, ECTC 2010. p. 652-656 5 p. 5490800. (Proceedings - Electronic Components and Technology Conference).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

A scalable SCR compact model for ESD circuit simulation

Di Sarro, J. P. & Rosenbaum, E., Dec 1 2010, In : IEEE Transactions on Electron Devices. 57, 12, p. 3275-3286 12 p., 5610716.

Research output: Contribution to journalArticle

CDM simulation study of a system-in-package

Shukla, V. & Rosenbaum, E., 2010, Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2010, EOS/ESD 2010. 5623710

Research output: Chapter in Book/Report/Conference proceedingConference contribution

ESD protection for high-speed receiver circuits

Jack, N. & Rosenbaum, E., Oct 20 2010, 2010 IEEE International Reliability Physics Symposium, IRPS 2010. p. 835-840 6 p. 5488722. (IEEE International Reliability Physics Symposium Proceedings).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Investigation of current flow during wafer-level CDM using real-time probing

Jack, N., Shukla, V. & Rosenbaum, E., Dec 24 2010, Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2010, EOS/ESD 2010. 5623758. (Electrical Overstress/Electrostatic Discharge Symposium Proceedings).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Predictive simulation of CDM events to study effects of package, substrate resistivity and placement of ESD protection circuits on reliability of integrated circuits

Shukla, V., Jack, N. & Rosenbaum, E., Oct 20 2010, 2010 IEEE International Reliability Physics Symposium, IRPS 2010. p. 485-493 9 p. 5488782. (IEEE International Reliability Physics Symposium Proceedings).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Understanding transient latchup hazards and the impact of guard rings

Farbiz, F. & Rosenbaum, E., Oct 20 2010, 2010 IEEE International Reliability Physics Symposium, IRPS 2010. p. 466-473 8 p. 5488787. (IEEE International Reliability Physics Symposium Proceedings).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2009

A new compact model for external latchup

Farbiz, F. & Rosenbaum, E., Dec 1 2009, In : Microelectronics Reliability. 49, 12, p. 1447-1454 8 p.

Research output: Contribution to journalArticle

ESD time-domain characterization of high-k gate dielectric in a 32 nm CMOS technology

Di Sarro, J., Yang, Y., Chatty, K., Gauthier, R., Ille, A., Mitra, S., Li, J., Russ, C., Rosenbaum, E. & Ioannou, D., Dec 1 2009, Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2009, EOS/ESD 2009. 5340124. (Electrical Overstress/Electrostatic Discharge Symposium Proceedings).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

HBM cross power domain failure due to secondary tester pulse

Jack, N., Davis, J., Chaine, M. & Rosenbaum, E., Dec 1 2009, Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2009, EOS/ESD 2009. 5340113. (Electrical Overstress/Electrostatic Discharge Symposium Proceedings).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Layout optimization of ESD protection diodes for high-frequency I/Os

Bhatia, K., Jack, N. & Rosenbaum, E., Sep 1 2009, In : IEEE Transactions on Device and Materials Reliability. 9, 3, p. 465-475 11 p., 5153318.

Research output: Contribution to journalArticle

Moving signals on and off chip

Rosenbaum, E., Bae, H. M., Bhatia, K. S. & Faust, A. C., Dec 1 2009, 2009 IEEE Custom Integrated Circuits Conference, CICC '09. p. 585-592 8 p. 5280774. (Proceedings of the Custom Integrated Circuits Conference).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Oscillatory transmission line pulsing for characterization of device transient response

Di Sarro, J. P. & Rosenbaum, E., Jan 1 2009, In : IEEE Electron Device Letters. 30, 2, p. 168-170 3 p.

Research output: Contribution to journalArticle

2008

A dual-base triggered SCR with very low leakage current and adjustable trigger voltage

Sarro, J. D., Vashchenko, V., Rosenbaum, E. & Hopper, P., Dec 1 2008, In : Electrical Overstress/Electrostatic Discharge Symposium Proceedings. p. 242-248 7 p., 4772140.

Research output: Contribution to journalConference article

A scalable SCR compact model for ESD circuit simulation

Di Sarro, J. & Rosenbaum, E., Sep 17 2008, 46th Annual 2008 IEEE International Reliability Physics Symposium Proceedings, IRPS. p. 254-261 8 p. 4558895. (IEEE International Reliability Physics Symposium Proceedings).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Guard ring interactions and their effect on CMOS latchup resilience

Farbiz, F. & Rosenbaum, E., Dec 1 2008, 2008 IEEE International Electron Devices Meeting, IEDM 2008. 4796690. (Technical Digest - International Electron Devices Meeting, IEDM).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Modeling of majority and minority carrier triggered external latchup

Farbiz, F. & Rosenbaum, E., Sep 17 2008, 46th Annual 2008 IEEE International Reliability Physics Symposium Proceedings, IRPS. p. 270-277 8 p. 4558897. (IEEE International Reliability Physics Symposium Proceedings).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Small footprint trigger voltage control circuit for mixed-voltage applications

Olson, N., Vashchenko, V., Rosenbaum, E. & Hopper, P., Dec 1 2008, In : Electrical Overstress/Electrostatic Discharge Symposium Proceedings. p. 196-203 8 p., 4772134.

Research output: Contribution to journalConference article

UVeriESD: An ESD verification tool for SoC design

Kelvin Hsueh, K., Ke, S. H., Lee, J. & Rosenbaum, E., Dec 1 2008, Proceedings of APCCAS 2008 - 2008 IEEE Asia Pacific Conference on Circuits and Systems. p. 53-56 4 p. 4745958. (IEEE Asia-Pacific Conference on Circuits and Systems, Proceedings, APCCAS).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Voltage clamping requirements for ESD protection of inputs in 90nm CMOS technology

Lee, J. & Rosenbaum, E., Dec 1 2008, In : Electrical Overstress/Electrostatic Discharge Symposium Proceedings. p. 50-58 9 p., 4772114.

Research output: Contribution to journalConference article

2007

A compact, ESD-protected, SiGe BiCMOS LNA for ultra-wideband applications

Bhatia, K., Hyvonen, S. & Rosenbaum, E., May 1 2007, In : IEEE Journal of Solid-State Circuits. 42, 5, p. 1121-1130 10 p.

Research output: Contribution to journalArticle

A Kelvin transmission line pulsing system with optimized oscilloscope ranging

Gerdemann, A., Bhatia, K. & Rosenbaum, E., Dec 1 2007, 2007 29th Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD. 4401735. (Electrical Overstress/Electrostatic Discharge Symposium Proceedings).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Analytical modeling of external latchup

Farbiz, F. & Rosenbaum, E., Jan 1 2007, 2007 29th Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD. ESD Association, p. 6A.21-6A.29 4401772. (Electrical Overstress/Electrostatic Discharge Symposium Proceedings).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

An investigation of external latchup

Farbiz, F. & Rosenbaum, E., 2007, 2007 IEEE International Reliability Physics Symposium Proceedings, 45th Annual. p. 600-601 2 p. 4227711

Research output: Chapter in Book/Report/Conference proceedingConference contribution

A novel testing approach for full-chip CDM characterization

Gerdemann, A., Rosenbaum, E. & Stockinger, M., Dec 1 2007, 2007 29th Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD. 4401765. (Electrical Overstress/Electrostatic Discharge Symposium Proceedings).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Evaluation of SCR-based ESD protection devices in 90nm and 65nm CMOS technologies

Di Sarro, J., Chatty, K., Gauthier, R. & Rosenbaum, E., Sep 25 2007, 2007 IEEE International Reliability Physics Symposium Proceedings, 45th Annual. p. 348-357 10 p. 4227655. (Annual Proceedings - Reliability Physics (Symposium)).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Layout guidelines for optimized ESD protection diodes

Bhatia, K. & Rosenbaum, E., Dec 1 2007, 2007 29th Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD. 4401727. (Electrical Overstress/Electrostatic Discharge Symposium Proceedings).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Mixed device-circuit solution for ESD protection of high-voltage fast pins

Vashchenko, V. A., Olson, N., Farrenkopf, D., Kuznetsov, V., Hopper, P. & Rosenbaum, E., Sep 25 2007, 2007 IEEE International Reliability Physics Symposium Proceedings, 45th Annual. p. 602-603 2 p. 4227712. (Annual Proceedings - Reliability Physics (Symposium)).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2006

An 8-mW, ESD-protected, CMOS LNA for ultra-wideband applications

Bhatia, K., Hyvonen, S. & Rosenbaum, E., Dec 1 2006, Proceedings of the IEEE 2006 Custom Integrated Circuits Conference, CICC 2006. p. 385-388 4 p. 4114985. (Proceedings of the Custom Integrated Circuits Conference).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

An automated and efficient substrate noise analysis tool

Li, H., Zemke, C. E., Manetas, G., Okhmatovski, V. I. & Rosenbaum, E., Mar 1 2006, In : IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 25, 3, p. 454-468 15 p.

Research output: Contribution to journalArticle

Compact modeling of on-chip ESD protection devices using Verilog-A

Li, J., Joshi, S., Barnes, R. & Rosenbaum, E., Jun 2006, In : IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 25, 6, p. 1047-1063 17 p.

Research output: Contribution to journalArticle

Double-gate FET technology for RF applications: Device characteristics and low noise amplifier design

Bhatia, K., Kim, K., Chuang, C. T., Rosenbaum, E., Plouchart, J. O. & Floyd, B. A., Jan 1 2006, 2006 IEEE international SOI Conference Proceedings. Institute of Electrical and Electronics Engineers Inc., p. 75-76 2 p. 4062888. (Proceedings - IEEE International SOI Conference).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

On-chip ESD protection for RFICs

Rosenbaum, E. & Hyvonen, S., Jan 1 2006, Radio Design in Nanometer Technologies. Kluwer Academic Publishers, p. 173-192 20 p. (Radio Design in Nanometer Technologies).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

SOI poly-defined diode for ESD protection in high speed I/Os

Chen, V., Salman, A., Beebe, S., Rosenbaum, E., Mitra, S., Putnam, C. & Gauthier, R., Dec 1 2006, 2006 IEEE International Reliability Physics Symposium Proceedings, 44th Annual. p. 635-636 2 p. 4017240. (IEEE International Reliability Physics Symposium Proceedings).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Study of design factors affecting turn-on time of silicon controlled rectifiers (SCRs) in 90 and 65NM bulk CMOS technologies

Sarro, J. D., Chatty, K., Gauthier, R. & Rosenbaum, E., Dec 1 2006, 2006 IEEE International Reliability Physics Symposium Proceedings, 44th Annual. p. 163-168 6 p. 4017151. (IEEE International Reliability Physics Symposium Proceedings).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2005