1989 …2019
If you made any changes in Pure, your changes will be visible here soon.

Research Output 1989 2019

2012

Exponential-edge transmission line pulsing for snap-back device characterization

Thomson, N., Jack, N. & Rosenbaum, E., 2012, 2012 IEEE International Reliability Physics Symposium, IRPS 2012. 6241820

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Electric lines
Testing

FEC-based 4 Gb/s backplane transceiver in 90nm CMOS

Faust, A. C., Narasimha, R. L., Bhatia, K., Srivastava, A., Kong, C., Bae, H. M., Rosenbaum, E. & Shanbhag, N. R., Nov 26 2012, Proceedings of the IEEE 2012 Custom Integrated Circuits Conference, CICC 2012. 6330665. (Proceedings of the Custom Integrated Circuits Conference).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Forward error correction
Transceivers
Jitter

Layout sensitivities of transient external latchup

Kripanidhi, A. & Rosenbaum, E., Sep 28 2012, 2012 IEEE International Reliability Physics Symposium, IRPS 2012. 6241821. (IEEE International Reliability Physics Symposium Proceedings).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Physics

The need for transient I-V measurement of device ESD response

Meng, K. H. & Rosenbaum, E., Nov 27 2012, Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2012, EOS/ESD 2012. 6333318. (Electrical Overstress/Electrostatic Discharge Symposium Proceedings).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Circuit simulation
Tuning
Testing
2011

CDM-ESD induced damage in components using stacked-die packaging

Olson, N., Jack, N., Shukla, V. & Rosenbaum, E., Nov 9 2011, 2011 IEEE Custom Integrated Circuits Conference, CICC 2011. 6055359. (Proceedings of the Custom Integrated Circuits Conference).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Packaging
Clamping devices

Comparison of wafer-level with package-level CDM stress facilitated by real-time probing

Jack, N., Shukla, V. & Rosenbaum, E., Dec 1 2011, In : IEEE Transactions on Device and Materials Reliability. 11, 4, p. 522-530 9 p., 6006519.

Research output: Contribution to journalArticle

Electrostatic discharge
Circuit simulation
Induced currents
Electric potential

Effect of on-chip ESD protection on 10 Gb/s receivers

Faust, A. C., Srivastava, A. & Rosenbaum, E., Nov 10 2011, Electrical Overstress/Electrostatic Discharge Symposium Proceedings - 2011, EOS/ESD 2011. 6045578. (Electrical Overstress/Electrostatic Discharge Symposium Proceedings).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Capacitance
Bandwidth
Networks (circuits)

ESD protection networks for 3D integrated circuits

Rosenbaum, E., Shukla, V. & Keel, M. S., Dec 1 2011, 2011 IEEE International 3D Systems Integration Conference, 3DIC 2011. 6262965. (2011 IEEE International 3D Systems Integration Conference, 3DIC 2011).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Gate dielectrics
Clamping devices
Electric potential
Electric breakdown
Electric power distribution

Modeling and understanding of external latchup in CMOS technologies-part I: Modeling latchup trigger current

Farbiz, F. & Rosenbaum, E., Sep 1 2011, In : IEEE Transactions on Device and Materials Reliability. 11, 3, p. 417-425 9 p., 5875872.

Research output: Contribution to journalArticle

Substrates
Networks (circuits)
Testing
Substrates
Electric potential
Temperature

Test chip design for study of CDM related failures in SoC designs

Olson, N., Shukla, V. & Rosenbaum, E., Jun 23 2011, 2011 International Reliability Physics Symposium, IRPS 2011. 5784566. (IEEE International Reliability Physics Symposium Proceedings).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Testing

Voltage monitor circuit for ESD diagnosis

Jack, N. & Rosenbaum, E., Nov 10 2011, Electrical Overstress/Electrostatic Discharge Symposium Proceedings - 2011, EOS/ESD 2011. 6045614. (Electrical Overstress/Electrostatic Discharge Symposium Proceedings).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Networks (circuits)
Electric potential

WCDM2 - Wafer-level charged device model testing with high repeatability

Jack, N., Maloney, T. J., Chou, B. & Rosenbaum, E., Jun 23 2011, 2011 International Reliability Physics Symposium, IRPS 2011. 5784509. (IEEE International Reliability Physics Symposium Proceedings).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Testing
2010

A novel TCAD-based methodology to minimize the impact of parasitic structures on ESD performance

Olson, N., Boselli, G., Salman, A. & Rosenbaum, E., Oct 20 2010, 2010 IEEE International Reliability Physics Symposium, IRPS 2010. p. 474-479 6 p. 5488784. (IEEE International Reliability Physics Symposium Proceedings).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Bipolar transistors

Application of the latency insertion method (LIM) to the modeling of CDM ESD events

Klokotov, D., Shukla, V., Schutt-Ainé, J. & Rosenbaum, E., Aug 9 2010, 2010 Proceedings 60th Electronic Components and Technology Conference, ECTC 2010. p. 652-656 5 p. 5490800. (Proceedings - Electronic Components and Technology Conference).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Electrostatic discharge
Circuit simulation
Integrated circuits
Simulators

A scalable SCR compact model for ESD circuit simulation

Di Sarro, J. P. & Rosenbaum, E., Dec 1 2010, In : IEEE Transactions on Electron Devices. 57, 12, p. 3275-3286 12 p., 5610716.

Research output: Contribution to journalArticle

Electrostatic discharge
Circuit simulation
Thyristors
Electric potential
Heating

CDM simulation study of a system-in-package

Shukla, V. & Rosenbaum, E., 2010, Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2010, EOS/ESD 2010. 5623710

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Networks (circuits)
Circuit simulation
System-in-package
Electric potential

ESD protection for high-speed receiver circuits

Jack, N. & Rosenbaum, E., Oct 20 2010, 2010 IEEE International Reliability Physics Symposium, IRPS 2010. p. 835-840 6 p. 5488722. (IEEE International Reliability Physics Symposium Proceedings).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Networks (circuits)
Electric breakdown
Transistors
Diodes
Oxides

Investigation of current flow during wafer-level CDM using real-time probing

Jack, N., Shukla, V. & Rosenbaum, E., Dec 24 2010, Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2010, EOS/ESD 2010. 5623758. (Electrical Overstress/Electrostatic Discharge Symposium Proceedings).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Circuit simulation
Induced currents
Electric potential

Predictive simulation of CDM events to study effects of package, substrate resistivity and placement of ESD protection circuits on reliability of integrated circuits

Shukla, V., Jack, N. & Rosenbaum, E., Oct 20 2010, 2010 IEEE International Reliability Physics Symposium, IRPS 2010. p. 485-493 9 p. 5488782. (IEEE International Reliability Physics Symposium Proceedings).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Integrated circuits
Networks (circuits)
Substrates
Clamping devices
Diodes

Understanding transient latchup hazards and the impact of guard rings

Farbiz, F. & Rosenbaum, E., Oct 20 2010, 2010 IEEE International Reliability Physics Symposium, IRPS 2010. p. 466-473 8 p. 5488787. (IEEE International Reliability Physics Symposium Proceedings).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Hazards
Testing
2009

A new compact model for external latchup

Farbiz, F. & Rosenbaum, E., Dec 1 2009, In : Microelectronics Reliability. 49, 12, p. 1447-1454 8 p.

Research output: Contribution to journalArticle

layouts
CMOS
spacing
Electric potential
electric potential

ESD time-domain characterization of high-k gate dielectric in a 32 nm CMOS technology

Di Sarro, J., Yang, Y., Chatty, K., Gauthier, R., Ille, A., Mitra, S., Li, J., Russ, C., Rosenbaum, E. & Ioannou, D., Dec 1 2009, Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2009, EOS/ESD 2009. 5340124. (Electrical Overstress/Electrostatic Discharge Symposium Proceedings).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Gate dielectrics
Transistors
Electric breakdown
Polysilicon
Metals

HBM cross power domain failure due to secondary tester pulse

Jack, N., Davis, J., Chaine, M. & Rosenbaum, E., Dec 1 2009, Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2009, EOS/ESD 2009. 5340113. (Electrical Overstress/Electrostatic Discharge Symposium Proceedings).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Layout optimization of ESD protection diodes for high-frequency I/Os

Bhatia, K., Jack, N. & Rosenbaum, E., Sep 1 2009, In : IEEE Transactions on Device and Materials Reliability. 9, 3, p. 465-475 11 p., 5153318.

Research output: Contribution to journalArticle

Diodes
Metals
Geometry
Experiments

Moving signals on and off chip

Rosenbaum, E., Bae, H. M., Bhatia, K. S. & Faust, A. C., Dec 1 2009, 2009 IEEE Custom Integrated Circuits Conference, CICC '09. p. 585-592 8 p. 5280774. (Proceedings of the Custom Integrated Circuits Conference).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Networks (circuits)

Oscillatory transmission line pulsing for characterization of device transient response

Di Sarro, J. P. & Rosenbaum, E., Jan 1 2009, In : IEEE Electron Device Letters. 30, 2, p. 168-170 3 p.

Research output: Contribution to journalArticle

Electrostatic discharge
Transient analysis
Electric lines
Thyristors
Electric potential
2008

A dual-base triggered SCR with very low leakage current and adjustable trigger voltage

Sarro, J. D., Vashchenko, V., Rosenbaum, E. & Hopper, P., Dec 1 2008, In : Electrical Overstress/Electrostatic Discharge Symposium Proceedings. p. 242-248 7 p., 4772140.

Research output: Contribution to journalConference article

Trigger circuits
Thyristors
Leakage currents
Electric potential

A scalable SCR compact model for ESD circuit simulation

Di Sarro, J. & Rosenbaum, E., Sep 17 2008, 46th Annual 2008 IEEE International Reliability Physics Symposium Proceedings, IRPS. p. 254-261 8 p. 4558895. (IEEE International Reliability Physics Symposium Proceedings).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Circuit simulation
Thyristors
Electric potential
Heating

Guard ring interactions and their effect on CMOS latchup resilience

Farbiz, F. & Rosenbaum, E., Dec 1 2008, 2008 IEEE International Electron Devices Meeting, IEDM 2008. 4796690. (Technical Digest - International Electron Devices Meeting, IEDM).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

resilience
CMOS
rings
taps
minority carriers

Modeling of majority and minority carrier triggered external latchup

Farbiz, F. & Rosenbaum, E., Sep 17 2008, 46th Annual 2008 IEEE International Reliability Physics Symposium Proceedings, IRPS. p. 270-277 8 p. 4558897. (IEEE International Reliability Physics Symposium Proceedings).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Networks (circuits)
Testing
Substrates

Small footprint trigger voltage control circuit for mixed-voltage applications

Olson, N., Vashchenko, V., Rosenbaum, E. & Hopper, P., Dec 1 2008, In : Electrical Overstress/Electrostatic Discharge Symposium Proceedings. p. 196-203 8 p., 4772134.

Research output: Contribution to journalConference article

Voltage control
Networks (circuits)
Electric potential

UVeriESD: An ESD verification tool for SoC design

Kelvin Hsueh, K., Ke, S. H., Lee, J. & Rosenbaum, E., Dec 1 2008, Proceedings of APCCAS 2008 - 2008 IEEE Asia Pacific Conference on Circuits and Systems. p. 53-56 4 p. 4745958. (IEEE Asia-Pacific Conference on Circuits and Systems, Proceedings, APCCAS).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Hazards
Planning
Defects
System-on-chip
Voltage drop

Voltage clamping requirements for ESD protection of inputs in 90nm CMOS technology

Lee, J. & Rosenbaum, E., Dec 1 2008, In : Electrical Overstress/Electrostatic Discharge Symposium Proceedings. p. 50-58 9 p., 4772114.

Research output: Contribution to journalConference article

Electric breakdown
Gate dielectrics
Electric potential
Transistors
Degradation
2007

A compact, ESD-protected, SiGe BiCMOS LNA for ultra-wideband applications

Bhatia, K., Hyvonen, S. & Rosenbaum, E., May 1 2007, In : IEEE Journal of Solid-State Circuits. 42, 5, p. 1121-1130 10 p.

Research output: Contribution to journalArticle

Low noise amplifiers
Ultra-wideband (UWB)
Noise figure
Broadband amplifiers
Heterojunction bipolar transistors

A Kelvin transmission line pulsing system with optimized oscilloscope ranging

Gerdemann, A., Bhatia, K. & Rosenbaum, E., Dec 1 2007, 2007 29th Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD. 4401735. (Electrical Overstress/Electrostatic Discharge Symposium Proceedings).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

laboratory equipment
oscilloscopes
shelves
transmission lines
curves

Analytical modeling of external latchup

Farbiz, F. & Rosenbaum, E., Jan 1 2007, 2007 29th Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD. ESD Association, p. 6A.21-6A.29 4401772. (Electrical Overstress/Electrostatic Discharge Symposium Proceedings).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

layouts
CMOS
spacing
electric potential
temperature

An investigation of external latchup

Farbiz, F. & Rosenbaum, E., 2007, 2007 IEEE International Reliability Physics Symposium Proceedings, 45th Annual. p. 600-601 2 p. 4227711

Research output: Chapter in Book/Report/Conference proceedingConference contribution

A novel testing approach for full-chip CDM characterization

Gerdemann, A., Rosenbaum, E. & Stockinger, M., Dec 1 2007, 2007 29th Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD. 4401765. (Electrical Overstress/Electrostatic Discharge Symposium Proceedings).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

chips
waveforms
electric potential

Evaluation of SCR-based ESD protection devices in 90nm and 65nm CMOS technologies

Di Sarro, J., Chatty, K., Gauthier, R. & Rosenbaum, E., Sep 25 2007, 2007 IEEE International Reliability Physics Symposium Proceedings, 45th Annual. p. 348-357 10 p. 4227655. (Annual Proceedings - Reliability Physics (Symposium)).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Thyristors
Leakage currents
Electric potential

Layout guidelines for optimized ESD protection diodes

Bhatia, K. & Rosenbaum, E., Dec 1 2007, 2007 29th Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD. 4401727. (Electrical Overstress/Electrostatic Discharge Symposium Proceedings).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

layouts
diodes
junction diodes
figure of merit
geometry

Mixed device-circuit solution for ESD protection of high-voltage fast pins

Vashchenko, V. A., Olson, N., Farrenkopf, D., Kuznetsov, V., Hopper, P. & Rosenbaum, E., Sep 25 2007, 2007 IEEE International Reliability Physics Symposium Proceedings, 45th Annual. p. 602-603 2 p. 4227712. (Annual Proceedings - Reliability Physics (Symposium)).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Voltage regulators
Analog circuits
Thyristors
Networks (circuits)
Electric potential
2006

An 8-mW, ESD-protected, CMOS LNA for ultra-wideband applications

Bhatia, K., Hyvonen, S. & Rosenbaum, E., Dec 1 2006, Proceedings of the IEEE 2006 Custom Integrated Circuits Conference, CICC 2006. p. 385-388 4 p. 4114985. (Proceedings of the Custom Integrated Circuits Conference).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Noise figure
Transconductance
Ultra-wideband (UWB)
Networks (circuits)

An automated and efficient substrate noise analysis tool

Li, H., Zemke, C. E., Manetas, G., Okhmatovski, V. I. & Rosenbaum, E., Mar 1 2006, In : IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 25, 3, p. 454-468 15 p.

Research output: Contribution to journalArticle

Circuit simulation
Substrates
Boundary element method
Green's function

Compact modeling of on-chip ESD protection devices using Verilog-A

Li, J., Joshi, S., Barnes, R. & Rosenbaum, E., Jun 1 2006, In : IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 25, 6, p. 1047-1063 17 p.

Research output: Contribution to journalArticle

Computer hardware description languages
Electrostatic discharge
Transistors
Resistors
Diodes

Double-gate FET technology for RF applications: Device characteristics and low noise amplifier design

Bhatia, K., Kim, K., Chuang, C. T., Rosenbaum, E., Plouchart, J. O. & Floyd, B. A., Jan 1 2006, 2006 IEEE international SOI Conference Proceedings. Institute of Electrical and Electronics Engineers Inc., p. 75-76 2 p. 4062888. (Proceedings - IEEE International SOI Conference).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

On-chip ESD protection for RFICs

Rosenbaum, E. & Hyvonen, S., Jan 1 2006, Radio Design in Nanometer Technologies. Kluwer Academic Publishers, p. 173-192 20 p. (Radio Design in Nanometer Technologies).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

chips

SOI poly-defined diode for ESD protection in high speed I/Os

Chen, V., Salman, A., Beebe, S., Rosenbaum, E., Mitra, S., Putnam, C. & Gauthier, R., Dec 1 2006, 2006 IEEE International Reliability Physics Symposium Proceedings, 44th Annual. p. 635-636 2 p. 4017240. (IEEE International Reliability Physics Symposium Proceedings).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Diodes

Study of design factors affecting turn-on time of silicon controlled rectifiers (SCRs) in 90 and 65NM bulk CMOS technologies

Sarro, J. D., Chatty, K., Gauthier, R. & Rosenbaum, E., Dec 1 2006, 2006 IEEE International Reliability Physics Symposium Proceedings, 44th Annual. p. 163-168 6 p. 4017151. (IEEE International Reliability Physics Symposium Proceedings).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Thyristors
Electric lines
2005
Electric potential
Resonators