1989 …2019
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Research Output 1989 2019

Paper

Bipolar leakage modeling for switch-level simulators

Kanj, R., Rosenbaum, E. & Lehner, T., Jan 1 2002, p. 147-149. 3 p.

Research output: Contribution to conferencePaper

Simulators
Switches
Electric potential

Circuit-level electrothermal simulation techniques for designing output protection devices

Ramaswamy, S., Rosenbaum, E. & Kang, S. M., Dec 1 1994, p. 79-82. 4 p.

Research output: Contribution to conferencePaper

Networks (circuits)
Simulators
Integrated circuits
Computer aided design
Specifications

CMOS hot carrier lifetime improvement from deuterium anneal

Li, E., Rosenbaum, E., Tao, J. & Fang, P., Dec 1 1998, p. 22-23. 2 p.

Research output: Contribution to conferencePaper

Hot carriers
Carrier lifetime
Interface states
Deuterium
Hot electrons

Interconnect thermal modeling for determining design limits on current density

Chen, D., Li, E., Rosenbaum, E. & Kang, S. M., Jan 1 1999, p. 172-178. 7 p.

Research output: Contribution to conferencePaper

Current density
Geometry
Temperature
Finite element method
Substrates

New algorithm for circuit-level electrothermal simulation under EOS/ESD stress

Li, T., Tsai, C. H., Huh, Y. J., Rosenbaum, E. & Kang, S. M., Dec 1 1997, p. 130-131. 2 p.

Research output: Contribution to conferencePaper

Simulators
Networks (circuits)
Temperature
Editorial

Preface

Rosenbaum, E., May 25 2018, In : IEEE International Reliability Physics Symposium Proceedings. 2018-March, 1 p.

Research output: Contribution to journalEditorial

Special Issue on Reliability

Mahapatra, S., Chen, K. J., Kaczer, B., Pancheri, L., Rosenbaum, E., Mouli, C., Wong, H., Kerber, A., Monzio Compagnoni, C., Koval, R., Meneghesso, G., Sheridan, D., Ramey, S., Wang, R. & Stathis, J., Nov 2019, In : IEEE Transactions on Electron Devices. 66, 11, p. 4497-4503 7 p., 8886623.

Research output: Contribution to journalEditorial

Conference contribution

A compact, timed-shutoff, MOSFET-based power clamp for on-chip ESD protection

Li, J., Gauthier, R. & Rosenbaum, E., Dec 1 2004, 2004 Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD '04. 5272597. (Electrical Overstress/Electrostatic Discharge Symposium Proceedings).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Clamping devices
Feedback
Trigger circuits
Capacitors

A comparative study of the effect of dynamic stressing on high-field endurance and stability of reoxidized-nitrided, fluorinated and conventional oxides

Liu, Z. H., Rosenbaum, E., Ko, P. K., Hu, C., Cheng, Y. C., Sodini, C. G., Gross, B. J. & Ma, T. P., Jan 1 1991, International Electron Devices Meeting 1991, IEDM 1991. Institute of Electrical and Electronics Engineers Inc., p. 723-726 4 p. 235321. (Technical Digest - International Electron Devices Meeting, IEDM; vol. 1991-January).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

endurance
Oxides
Durability
oxides
Electric breakdown

A flexible simulation model for system level ESD stresses with application to ESD design and troubleshooting

Mertens, R., Kunz, H., Salman, A., Boselli, G. & Rosenbaum, E., Nov 27 2012, Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2012, EOS/ESD 2012. 6333331. (Electrical Overstress/Electrostatic Discharge Symposium Proceedings).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Integrated circuit testing
Specifications

A Kelvin transmission line pulsing system with optimized oscilloscope ranging

Gerdemann, A., Bhatia, K. & Rosenbaum, E., Dec 1 2007, 2007 29th Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD. 4401735. (Electrical Overstress/Electrostatic Discharge Symposium Proceedings).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

laboratory equipment
oscilloscopes
shelves
transmission lines
curves

An 8-mW, ESD-protected, CMOS LNA for ultra-wideband applications

Bhatia, K., Hyvonen, S. & Rosenbaum, E., Dec 1 2006, Proceedings of the IEEE 2006 Custom Integrated Circuits Conference, CICC 2006. p. 385-388 4 p. 4114985. (Proceedings of the Custom Integrated Circuits Conference).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Noise figure
Transconductance
Ultra-wideband (UWB)
Networks (circuits)

Analytical modeling of external latchup

Farbiz, F. & Rosenbaum, E., Jan 1 2007, 2007 29th Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD. ESD Association, p. 6A.21-6A.29 4401772. (Electrical Overstress/Electrostatic Discharge Symposium Proceedings).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

layouts
CMOS
spacing
electric potential
temperature

An analysis of bipolar breakdown and its application to the design of ESD protection circuits

Joshi, S., Ida, R., Givelin, P. & Rosenbaum, E., 2001, 2001 IEEE International Reliability Physics Symposium Proceedings - 39th Annual. Institute of Electrical and Electronics Engineers Inc., p. 240-245 6 p. 922908. (Annual Proceedings - Reliability Physics (Symposium)).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Networks (circuits)
Zener diodes
Electric breakdown

A new approach for simulation of circuit degradation due to hot-electron damage in NMOSFETs

Quader, K. N., Li, C., Tu, R., Rosenbaum, E., Ko, P. & Hu, C., Jan 1 1991, International Electron Devices Meeting 1991, IEDM 1991. Institute of Electrical and Electronics Engineers Inc., p. 337-340 4 p. 235384. (Technical Digest - International Electron Devices Meeting, IEDM; vol. 1991-January).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Hot electrons
hot electrons
degradation
damage
Degradation

An investigation of external latchup

Farbiz, F. & Rosenbaum, E., 2007, 2007 IEEE International Reliability Physics Symposium Proceedings, 45th Annual. p. 600-601 2 p. 4227711

Research output: Chapter in Book/Report/Conference proceedingConference contribution

A novel TCAD-based methodology to minimize the impact of parasitic structures on ESD performance

Olson, N., Boselli, G., Salman, A. & Rosenbaum, E., Oct 20 2010, 2010 IEEE International Reliability Physics Symposium, IRPS 2010. p. 474-479 6 p. 5488784. (IEEE International Reliability Physics Symposium Proceedings).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Bipolar transistors

A novel testing approach for full-chip CDM characterization

Gerdemann, A., Rosenbaum, E. & Stockinger, M., Dec 1 2007, 2007 29th Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD. 4401765. (Electrical Overstress/Electrostatic Discharge Symposium Proceedings).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

chips
waveforms
electric potential

A physics-based compact model for SCR devices used in ESD protection circuits

Mertens, R. & Rosenbaum, E., Aug 7 2013, 2013 IEEE International Reliability Physics Symposium, IRPS 2013. 6531947. (IEEE International Reliability Physics Symposium Proceedings).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Thyristors
Physics
Networks (circuits)
Transistors
Circuit simulation

Application level investigation of system-level ESD-induced soft failures

Vora, S., Jiang, R., Vasudevan, S. & Rosenbaum, E., Oct 14 2016, Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2016, EOS/ESD 2016. ESD Association, 7592565. (Electrical Overstress/Electrostatic Discharge Symposium Proceedings; vol. 2016-October).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Program processors
Hardware

Application of the latency insertion method (LIM) to the modeling of CDM ESD events

Klokotov, D., Shukla, V., Schutt-Ainé, J. & Rosenbaum, E., Aug 9 2010, 2010 Proceedings 60th Electronic Components and Technology Conference, ECTC 2010. p. 652-656 5 p. 5490800. (Proceedings - Electronic Components and Technology Conference).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Electrostatic discharge
Circuit simulation
Integrated circuits
Simulators

A scalable SCR compact model for ESD circuit simulation

Di Sarro, J. & Rosenbaum, E., Sep 17 2008, 46th Annual 2008 IEEE International Reliability Physics Symposium Proceedings, IRPS. p. 254-261 8 p. 4558895. (IEEE International Reliability Physics Symposium Proceedings).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Circuit simulation
Thyristors
Electric potential
Heating

A study of vertical SiGe thyristor design and optimization

Joshi, S., Ida, R. & Rosenbaum, E., Jan 1 2003, 2003 Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD 2003. ESD Association, 5272020. (Electrical Overstress/Electrostatic Discharge Symposium Proceedings; vol. 2003-January).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Thyristors
Integrated circuits
Anodes
Geometry
Experiments

Case study of DPI robustness of a MOS-SCR structure for automotive applications

Xiu, Y., Farbiz, F., Salman, A., Zu, Y., Dissegna, M., Boselli, G. & Rosenbaum, E., Oct 14 2016, Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2016, EOS/ESD 2016. ESD Association, 7592538. (Electrical Overstress/Electrostatic Discharge Symposium Proceedings; vol. 2016-October).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Thyristors
Networks (circuits)

CDM-ESD induced damage in components using stacked-die packaging

Olson, N., Jack, N., Shukla, V. & Rosenbaum, E., Nov 9 2011, 2011 IEEE Custom Integrated Circuits Conference, CICC 2011. 6055359. (Proceedings of the Custom Integrated Circuits Conference).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Packaging
Clamping devices

CDM-reliable T-coil techniques for high-speed wireline receivers

Keel, M. S. & Rosenbaum, E., Oct 30 2015, Electrical Overstress/Electrostatic Discharge Symposium Proceedings, EOS/ESD 2015. ESD Association, (Electrical Overstress/Electrostatic Discharge Symposium Proceedings; vol. 2015-October).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Magnetic couplings
Inductance
Hazards
Bandwidth
Degradation

CDM simulation study of a system-in-package

Shukla, V. & Rosenbaum, E., 2010, Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2010, EOS/ESD 2010. 5623710

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Networks (circuits)
Circuit simulation
System-in-package
Electric potential

Chip-level ESD-induced noise on internally and externally regulated power supplies

Xiu, Y., Thomson, N., Mertens, R., Reiman, C. & Rosenbaum, E., Oct 18 2017, Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2017, EOS/ESD 2017. ESD Association, (Electrical Overstress/Electrostatic Discharge Symposium Proceedings).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Voltage regulators
Voltage control
Capacitors

Combined TLP/RF testing system for detection of ESD failures in RF circuits

Hyvonen, S., Joshi, S. & Rosenbaum, E., Jan 1 2003, 2003 Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD 2003. ESD Association, 5272004. (Electrical Overstress/Electrostatic Discharge Symposium Proceedings; vol. 2003-January).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Leakage currents
Electric current measurement
Networks (circuits)
Testing

Compact modeling of vertical ESD protection NPN transistors for RF circuits

Joshi, S. & Rosenbaum, E., Jan 1 2002, Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD 2002 - Proceedings. ESD Association, p. 292-298 7 p. 5267008. (Electrical Overstress/Electrostatic Discharge Symposium Proceedings; vol. 2002-January).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Circuit simulation
Transistors
Networks (circuits)
Simulators
Silicon

Comparing FICDM and wafer-level CDM test methods: Apples to oranges?

Jack, N. & Rosenbaum, E., Nov 27 2012, Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2012, EOS/ESD 2012. 6333309. (Electrical Overstress/Electrostatic Discharge Symposium Proceedings).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Networks (circuits)
Electric potential

Comprehensive ESD protection for RF inputs

Hyvonen, S., Joshi, S. & Rosenbaum, E., Jan 1 2003, 2003 Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD 2003. ESD Association, 5272024. (Electrical Overstress/Electrostatic Discharge Symposium Proceedings; vol. 2003-January).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Networks (circuits)

Current challenges in component-level and system-level ESD simulation

Rosenbaum, E., Meng, K. H., Xiu, Y. & Thomson, N., Aug 3 2015, 2015 Asia-Pacific International Symposium on Electromagnetic Compatibility, APEMC 2015. Institute of Electrical and Electronics Engineers Inc., p. 333-336 4 p. 7175328. (2015 Asia-Pacific International Symposium on Electromagnetic Compatibility, APEMC 2015).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

beds
Computational efficiency
simulation
test stands
qualifications

Decomposition Method for Event-Detection State Vector Simulation of Switched-Mode Power Supplies

Reiman, C. & Rosenbaum, E., Jun 2019, 2019 IEEE 20th Workshop on Control and Modeling for Power Electronics, COMPEL 2019. Institute of Electrical and Electronics Engineers Inc., 8769654. (2019 IEEE 20th Workshop on Control and Modeling for Power Electronics, COMPEL 2019).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Switched mode power supplies
Event Detection
Decomposition Method
Decomposition
Feedback control

Diode-based tuned ESD protection for 5.25-GHz CMOS LNAs

Hyvonen, S. & Rosenbaum, E., Dec 1 2005, 2005 Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD 2005. 5271825. (Electrical Overstress/Electrostatic Discharge Symposium Proceedings).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Diodes
Networks (circuits)

Discrete-Time Large-Signal Modeling and Numerical Methods for Flyback Converters

Reiman, C., Das, D. & Rosenbaum, E., Apr 24 2019, 2019 IEEE Power and Energy Conference at Illinois, PECI 2019. Institute of Electrical and Electronics Engineers Inc., 8698921. (2019 IEEE Power and Energy Conference at Illinois, PECI 2019).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Numerical methods
Decomposition

Double-gate FET technology for RF applications: Device characteristics and low noise amplifier design

Bhatia, K., Kim, K., Chuang, C. T., Rosenbaum, E., Plouchart, J. O. & Floyd, B. A., Jan 1 2006, 2006 IEEE international SOI Conference Proceedings. Institute of Electrical and Electronics Engineers Inc., p. 75-76 2 p. 4062888. (Proceedings - IEEE International SOI Conference).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Effect of on-chip ESD protection on 10 Gb/s receivers

Faust, A. C., Srivastava, A. & Rosenbaum, E., Nov 10 2011, Electrical Overstress/Electrostatic Discharge Symposium Proceedings - 2011, EOS/ESD 2011. 6045578. (Electrical Overstress/Electrostatic Discharge Symposium Proceedings).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Capacitance
Bandwidth
Networks (circuits)

Enhanced IC modeling methodology for system-level ESD simulation

Xiong, J., Chen, Z., Xiu, Y., Mu, Z., Raginsky, M. & Rosenbaum, E., Oct 25 2018, Electrical Overstress/Electrostatic Discharge Symposium Proceedings, EOS/ESD 2018. ESD Association, (Electrical Overstress/Electrostatic Discharge Symposium Proceedings; vol. 2018-September).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Recurrent neural networks
Circuit simulation
Networks (circuits)

ESD protection for high-speed receiver circuits

Jack, N. & Rosenbaum, E., Oct 20 2010, 2010 IEEE International Reliability Physics Symposium, IRPS 2010. p. 835-840 6 p. 5488722. (IEEE International Reliability Physics Symposium Proceedings).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Networks (circuits)
Electric breakdown
Transistors
Diodes
Oxides

ESD protection networks for 3D integrated circuits

Rosenbaum, E., Shukla, V. & Keel, M. S., Dec 1 2011, 2011 IEEE International 3D Systems Integration Conference, 3DIC 2011. 6262965. (2011 IEEE International 3D Systems Integration Conference, 3DIC 2011).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Gate dielectrics
Clamping devices
Electric potential
Electric breakdown
Electric power distribution

ESD-resilient active biasing scheme for high-speed SSTL I/Os

Keel, M. S., Jack, N. & Rosenbaum, E., Oct 16 2013, Electrical Overstress/Electrostatic Discharge Symposium Proceedings, EOS/ESD 2013. 6635906. (Electrical Overstress/Electrostatic Discharge Symposium Proceedings).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Networks (circuits)
Transistors
Oxides
Electric potential

ESD time-domain characterization of high-k gate dielectric in a 32 nm CMOS technology

Di Sarro, J., Yang, Y., Chatty, K., Gauthier, R., Ille, A., Mitra, S., Li, J., Russ, C., Rosenbaum, E. & Ioannou, D., Dec 1 2009, Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2009, EOS/ESD 2009. 5340124. (Electrical Overstress/Electrostatic Discharge Symposium Proceedings).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Gate dielectrics
Transistors
Electric breakdown
Polysilicon
Metals

ETS-A: A new electrothermal simulator for CMOS VLSI circuits

Cheng, Y. K., Rosenbaum, E. & Kang, S. M., Mar 11 1996, Proceedings of the 1996 European Conference on Design and Test, EDTC 1996. Association for Computing Machinery, Inc, p. 566-570 5 p. 494357. (Proceedings of the 1996 European Conference on Design and Test, EDTC 1996).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

VLSI circuits
Simulators
Temperature
Integrated circuits

Evaluation of SCR-based ESD protection devices in 90nm and 65nm CMOS technologies

Di Sarro, J., Chatty, K., Gauthier, R. & Rosenbaum, E., Sep 25 2007, 2007 IEEE International Reliability Physics Symposium Proceedings, 45th Annual. p. 348-357 10 p. 4227655. (Annual Proceedings - Reliability Physics (Symposium)).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Thyristors
Leakage currents
Electric potential

Experimental study of supply voltage stability during ESD

Xiu, Y., Mertens, R., Thomson, N. & Rosenbaum, E., Sep 22 2016, 2016 International Reliability Physics Symposium, IRPS 2016. Institute of Electrical and Electronics Engineers Inc., p. 6A61-6A66 7574560. (IEEE International Reliability Physics Symposium Proceedings; vol. 2016-September).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Clamping devices
Voltage control
Rails
Inductance
Capacitance

Exponential-edge transmission line pulsing for snap-back device characterization

Thomson, N., Jack, N. & Rosenbaum, E., 2012, 2012 IEEE International Reliability Physics Symposium, IRPS 2012. 6241820

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Electric lines
Testing

Fast circuit simulator for transient analysis of CDM ESD

Meng, K. H. & Rosenbaum, E., Oct 30 2015, Electrical Overstress/Electrostatic Discharge Symposium Proceedings, EOS/ESD 2015. ESD Association, (Electrical Overstress/Electrostatic Discharge Symposium Proceedings; vol. 2015-October).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Cluster computing
Transient analysis
Simulators
Engines
Networks (circuits)

FEC-based 4 Gb/s backplane transceiver in 90nm CMOS

Faust, A. C., Narasimha, R. L., Bhatia, K., Srivastava, A., Kong, C., Bae, H. M., Rosenbaum, E. & Shanbhag, N. R., Nov 26 2012, Proceedings of the IEEE 2012 Custom Integrated Circuits Conference, CICC 2012. 6330665. (Proceedings of the Custom Integrated Circuits Conference).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Forward error correction
Transceivers
Jitter

Guard ring interactions and their effect on CMOS latchup resilience

Farbiz, F. & Rosenbaum, E., Dec 1 2008, 2008 IEEE International Electron Devices Meeting, IEDM 2008. 4796690. (Technical Digest - International Electron Devices Meeting, IEDM).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

resilience
CMOS
rings
taps
minority carriers