1989 …2019
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Research Output 1989 2019

A Bidirectional NMOSFET Current Reduction Model for Simulation of Hot-Carrier-Induced Circuit Degradation

Quader, K. N., Li, C. C., Tu, R., Rosenbaum, E., Ko, P. K. & Hu, C., Dec 1993, In : IEEE Transactions on Electron Devices. 40, 12, p. 2245-2254 10 p.

Research output: Contribution to journalArticle

Hot carriers
Drain current
Degradation
Networks (circuits)
Parameter extraction

Accelerated testing of SiC>2 reliability

Rosenbaum, E., King, J. C. & Hu, C., Dec 1 1996, In : IEEE Transactions on Electron Devices. 43, 1, p. 70-80 11 p.

Research output: Contribution to journalArticle

Electric breakdown
Defects
Testing
Charge trapping
Oxides
Level measurement
Electrostatic discharge
Electric lines

A compact, ESD-protected, SiGe BiCMOS LNA for ultra-wideband applications

Bhatia, K., Hyvonen, S. & Rosenbaum, E., May 1 2007, In : IEEE Journal of Solid-State Circuits. 42, 5, p. 1121-1130 10 p.

Research output: Contribution to journalArticle

Low noise amplifiers
Ultra-wideband (UWB)
Noise figure
Broadband amplifiers
Heterojunction bipolar transistors

A compact, timed-shutoff, MOSFET-based power clamp for on-chip ESD protection

Li, J., Gauthier, R. & Rosenbaum, E., Dec 1 2004, 2004 Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD '04. 5272597. (Electrical Overstress/Electrostatic Discharge Symposium Proceedings).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Clamping devices
Feedback
Trigger circuits
Capacitors

A comparative study of the effect of dynamic stressing on high-field endurance and stability of reoxidized-nitrided, fluorinated and conventional oxides

Liu, Z. H., Rosenbaum, E., Ko, P. K., Hu, C., Cheng, Y. C., Sodini, C. G., Gross, B. J. & Ma, T. P., Jan 1 1991, International Electron Devices Meeting 1991, IEDM 1991. Institute of Electrical and Electronics Engineers Inc., p. 723-726 4 p. 235321. (Technical Digest - International Electron Devices Meeting, IEDM; vol. 1991-January).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

endurance
Oxides
Durability
oxides
Electric breakdown

A co-optimization methodology on ESD robustness and functionality for pad-ring circuitry

Meng, K. H., Gerdemann, A., Miller, J. W. & Rosenbaum, E., Nov 26 2014, In : Electrical Overstress/Electrostatic Discharge Symposium Proceedings. 2014-November, November

Research output: Contribution to journalConference article

Logic gates

A dual-base triggered SCR with very low leakage current and adjustable trigger voltage

Sarro, J. D., Vashchenko, V., Rosenbaum, E. & Hopper, P., Dec 1 2008, In : Electrical Overstress/Electrostatic Discharge Symposium Proceedings. p. 242-248 7 p., 4772140.

Research output: Contribution to journalConference article

Trigger circuits
Thyristors
Leakage currents
Electric potential

A flexible simulation model for system level ESD stresses with application to ESD design and troubleshooting

Mertens, R., Kunz, H., Salman, A., Boselli, G. & Rosenbaum, E., Nov 27 2012, Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2012, EOS/ESD 2012. 6333331. (Electrical Overstress/Electrostatic Discharge Symposium Proceedings).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Integrated circuit testing
Specifications

A Kelvin transmission line pulsing system with optimized oscilloscope ranging

Gerdemann, A., Bhatia, K. & Rosenbaum, E., Dec 1 2007, 2007 29th Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD. 4401735. (Electrical Overstress/Electrostatic Discharge Symposium Proceedings).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

laboratory equipment
oscilloscopes
shelves
transmission lines
curves

A mechanism for logic upset induced by power-on ESD

Xiu, Y., Thomson, N., Mertens, R. & Rosenbaum, E., Nov 26 2014, In : Electrical Overstress/Electrostatic Discharge Symposium Proceedings. 2014-November, November

Research output: Contribution to journalConference article

Transistors

An 8-mW, ESD-protected, CMOS LNA for ultra-wideband applications

Bhatia, K., Hyvonen, S. & Rosenbaum, E., Dec 1 2006, Proceedings of the IEEE 2006 Custom Integrated Circuits Conference, CICC 2006. p. 385-388 4 p. 4114985. (Proceedings of the Custom Integrated Circuits Conference).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Noise figure
Transconductance
Ultra-wideband (UWB)
Networks (circuits)

Analysis of active-clamp response to power-on ESD: Power supply integrity and performance tradeoffs

Mertens, R., Thomson, N., Xiu, Y. & Rosenbaum, E., Sep 1 2015, In : IEEE Transactions on Device and Materials Reliability. 15, 3, p. 263-271 9 p., 7177068.

Research output: Contribution to journalArticle

Clamping devices
Rails
Networks (circuits)
Transient analysis

Analytical modeling of external latchup

Farbiz, F. & Rosenbaum, E., Jan 1 2007, 2007 29th Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD. ESD Association, p. 6A.21-6A.29 4401772. (Electrical Overstress/Electrostatic Discharge Symposium Proceedings).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

layouts
CMOS
spacing
electric potential
temperature

Analytic model for direct tunneling current in polycrystalline silicon-gate metal-oxide-semiconductor devices

Register, L. F., Rosenbaum, E. & Yang, K., Jan 18 1999, In : Applied Physics Letters. 74, 3, p. 457-459 3 p.

Research output: Contribution to journalArticle

semiconductor devices
metal oxide semiconductors
Wentzel-Kramer-Brillouin method
silicon
electron impact

An analysis of bipolar breakdown and its application to the design of ESD protection circuits

Joshi, S., Ida, R., Givelin, P. & Rosenbaum, E., 2001, 2001 IEEE International Reliability Physics Symposium Proceedings - 39th Annual. Institute of Electrical and Electronics Engineers Inc., p. 240-245 6 p. 922908. (Annual Proceedings - Reliability Physics (Symposium)).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Networks (circuits)
Zener diodes
Electric breakdown

An automated and efficient substrate noise analysis tool

Li, H., Zemke, C. E., Manetas, G., Okhmatovski, V. I. & Rosenbaum, E., Mar 1 2006, In : IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 25, 3, p. 454-468 15 p.

Research output: Contribution to journalArticle

Circuit simulation
Substrates
Boundary element method
Green's function
Electric potential
Resonators

A new approach for simulation of circuit degradation due to hot-electron damage in NMOSFETs

Quader, K. N., Li, C., Tu, R., Rosenbaum, E., Ko, P. & Hu, C., Jan 1 1991, International Electron Devices Meeting 1991, IEDM 1991. Institute of Electrical and Electronics Engineers Inc., p. 337-340 4 p. 235384. (Technical Digest - International Electron Devices Meeting, IEDM; vol. 1991-January).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Hot electrons
hot electrons
degradation
damage
Degradation

A new compact model for external latchup

Farbiz, F. & Rosenbaum, E., Dec 1 2009, In : Microelectronics Reliability. 49, 12, p. 1447-1454 8 p.

Research output: Contribution to journalArticle

layouts
CMOS
spacing
Electric potential
electric potential

An investigation of external latchup

Farbiz, F. & Rosenbaum, E., 2007, 2007 IEEE International Reliability Physics Symposium Proceedings, 45th Annual. p. 600-601 2 p. 4227711

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Anode hole injection versus hydrogen release: The mechanism for gate oxide breakdown

Wu, J., Rosenbaum, E., MacDonald, B., Li, E., Tao, J., Tracy, B. & Fang, P., Jan 1 2000, In : Annual Proceedings - Reliability Physics (Symposium). p. 27-32 6 p.

Research output: Contribution to journalArticle

Deuterium
Anodes
Hydrogen
Oxides
Metallizing

A novel SCR macromodel for ESD circuit simulation

Juliano, P. A. & Rosenbaum, E., Dec 1 2001, In : Technical Digest - International Electron Devices Meeting. p. 319-322 4 p.

Research output: Contribution to journalConference article

silicon controlled rectifiers
Electrostatic discharge
Circuit simulation
Thyristors
electrostatics

A novel TCAD-based methodology to minimize the impact of parasitic structures on ESD performance

Olson, N., Boselli, G., Salman, A. & Rosenbaum, E., Oct 20 2010, 2010 IEEE International Reliability Physics Symposium, IRPS 2010. p. 474-479 6 p. 5488784. (IEEE International Reliability Physics Symposium Proceedings).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Bipolar transistors

A novel testing approach for full-chip CDM characterization

Gerdemann, A., Rosenbaum, E. & Stockinger, M., Dec 1 2007, 2007 29th Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD. 4401765. (Electrical Overstress/Electrostatic Discharge Symposium Proceedings).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

chips
waveforms
electric potential

A physics-based compact model for SCR devices used in ESD protection circuits

Mertens, R. & Rosenbaum, E., Aug 7 2013, 2013 IEEE International Reliability Physics Symposium, IRPS 2013. 6531947. (IEEE International Reliability Physics Symposium Proceedings).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Thyristors
Physics
Networks (circuits)
Transistors
Circuit simulation

Application level investigation of system-level ESD-induced soft failures

Vora, S., Jiang, R., Vasudevan, S. & Rosenbaum, E., Oct 14 2016, Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2016, EOS/ESD 2016. ESD Association, 7592565. (Electrical Overstress/Electrostatic Discharge Symposium Proceedings; vol. 2016-October).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Program processors
Hardware

Application of the latency insertion method (LIM) to the modeling of CDM ESD events

Klokotov, D., Shukla, V., Schutt-Ainé, J. & Rosenbaum, E., Aug 9 2010, 2010 Proceedings 60th Electronic Components and Technology Conference, ECTC 2010. p. 652-656 5 p. 5490800. (Proceedings - Electronic Components and Technology Conference).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Electrostatic discharge
Circuit simulation
Integrated circuits
Simulators

A scalable SCR compact model for ESD circuit simulation

Di Sarro, J. P. & Rosenbaum, E., Dec 1 2010, In : IEEE Transactions on Electron Devices. 57, 12, p. 3275-3286 12 p., 5610716.

Research output: Contribution to journalArticle

Electrostatic discharge
Circuit simulation
Thyristors
Electric potential
Heating

A scalable SCR compact model for ESD circuit simulation

Di Sarro, J. & Rosenbaum, E., Sep 17 2008, 46th Annual 2008 IEEE International Reliability Physics Symposium Proceedings, IRPS. p. 254-261 8 p. 4558895. (IEEE International Reliability Physics Symposium Proceedings).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Circuit simulation
Thyristors
Electric potential
Heating

A Study of BER-Optimal ADC-Based Receiver for Serial Links

Lin, Y., Keel, M. S., Faust, A., Xu, A., Shanbhag, N. R., Rosenbaum, E. & Singer, A. C., May 2016, In : IEEE Transactions on Circuits and Systems I: Regular Papers. 63, 5, p. 693-704 12 p., 7486052.

Research output: Contribution to journalArticle

Digital to analog conversion
Bit error rate
Energy dissipation
Throughput

A study of vertical SiGe thyristor design and optimization

Joshi, S., Ida, R. & Rosenbaum, E., Jan 1 2003, 2003 Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD 2003. ESD Association, 5272020. (Electrical Overstress/Electrostatic Discharge Symposium Proceedings; vol. 2003-January).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Thyristors
Integrated circuits
Anodes
Geometry
Experiments

A Verilog-A compact model for ESD protection NMOSTs

Li, J., Joshi, S. & Rosenbaum, E., Nov 19 2003, In : Proceedings of the Custom Integrated Circuits Conference. p. 253-256 4 p.

Research output: Contribution to journalConference article

Computer hardware description languages
Simulators
Networks (circuits)

Berkeley Reliability Tools-BERT

Tu, R. H., Rosenbaum, E., Chan, W. Y., Li, C. C., Minami, E., Quader, K., Keung Ko, P. & Hu, C., Oct 1993, In : IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 12, 10, p. 1524-1534 11 p.

Research output: Contribution to journalArticle

Networks (circuits)
SPICE
Simulators
Degradation
Electromigration

Bipolar leakage modeling for switch-level simulators

Kanj, R., Rosenbaum, E. & Lehner, T., Jan 1 2002, p. 147-149. 3 p.

Research output: Contribution to conferencePaper

Simulators
Switches
Electric potential

Breakdown and latent damage of ultra-thin gate oxides under ESD stress conditions

Wu, J., Juliano, P. & Rosenbaum, E., Dec 1 2000, In : Electrical Overstress/Electrostatic Discharge Symposium Proceedings. p. 287-295 9 p.

Research output: Contribution to journalConference article

breakdown
damage
oxides
pulse duration
traps

Breakdown and latent damage of ultra-thin gate oxides under ESD stress conditions

Wu, J., Juliano, P. & Rosenbaum, E., Nov 1 2001, In : Microelectronics Reliability. 41, 11, p. 1771-1779 9 p.

Research output: Contribution to journalArticle

Oxides
breakdown
damage
oxides
Electric potential

Cancellation technique to provide ESD protection for multi-GHz RF inputs

Hyvonen, S., Joshi, S. & Rosenbaum, E., Feb 6 2003, In : Electronics Letters. 39, 3, p. 284-286 3 p.

Research output: Contribution to journalArticle

Case study of DPI robustness of a MOS-SCR structure for automotive applications

Xiu, Y., Farbiz, F., Salman, A., Zu, Y., Dissegna, M., Boselli, G. & Rosenbaum, E., Oct 14 2016, Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2016, EOS/ESD 2016. ESD Association, 7592538. (Electrical Overstress/Electrostatic Discharge Symposium Proceedings; vol. 2016-October).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Thyristors
Networks (circuits)

CDM-ESD induced damage in components using stacked-die packaging

Olson, N., Jack, N., Shukla, V. & Rosenbaum, E., Nov 9 2011, 2011 IEEE Custom Integrated Circuits Conference, CICC 2011. 6055359. (Proceedings of the Custom Integrated Circuits Conference).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Packaging
Clamping devices

CDM-reliable T-coil techniques for a 25-Gb/s wireline receiver front-end

Keel, M. S. & Rosenbaum, E., Dec 2016, In : IEEE Transactions on Device and Materials Reliability. 16, 4, p. 513-520 8 p., 7523221.

Research output: Contribution to journalArticle

Electrostatic discharge
Magnetic couplings
Inductance
Networks (circuits)
Equalizers

CDM-reliable T-coil techniques for high-speed wireline receivers

Keel, M. S. & Rosenbaum, E., Oct 30 2015, Electrical Overstress/Electrostatic Discharge Symposium Proceedings, EOS/ESD 2015. ESD Association, (Electrical Overstress/Electrostatic Discharge Symposium Proceedings; vol. 2015-October).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Magnetic couplings
Inductance
Hazards
Bandwidth
Degradation

CDM simulation study of a system-in-package

Shukla, V. & Rosenbaum, E., 2010, Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2010, EOS/ESD 2010. 5623710

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Networks (circuits)
Circuit simulation
System-in-package
Electric potential

Charged Device Model Reliability of Three-Dimensional Integrated Circuits

Shukla, V. & Rosenbaum, E., Dec 2015, In : IEEE Transactions on Device and Materials Reliability. 15, 4, p. 559-566 8 p., 7299296.

Research output: Contribution to journalArticle

Clamping devices
Circuit simulation
Silicon
Electric power distribution
Integrated circuits

Chip-level electrothermal simulator for temperature profile estimation of CMOS VLSI chips

Cheng, Y. K., Teng, C. C., Dharchoudhury, A., Rosenbaum, E. & Kang, S. M., 1996, In : Proceedings - IEEE International Symposium on Circuits and Systems. 4, p. 580-583 4 p.

Research output: Contribution to journalArticle

Simulators
Packaging
Temperature
Networks (circuits)

Chip-level ESD-induced noise on internally and externally regulated power supplies

Xiu, Y., Thomson, N., Mertens, R., Reiman, C. & Rosenbaum, E., Oct 18 2017, Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2017, EOS/ESD 2017. ESD Association, (Electrical Overstress/Electrostatic Discharge Symposium Proceedings).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Voltage regulators
Voltage control
Capacitors

Circuit-level electrothermal simulation techniques for designing output protection devices

Ramaswamy, S., Rosenbaum, E. & Kang, S. M., Dec 1 1994, p. 79-82. 4 p.

Research output: Contribution to conferencePaper

Networks (circuits)
Simulators
Integrated circuits
Computer aided design
Specifications

Circuit-level simulation and layout optimization for deep submicron EOS/ESD output protection device

Li, T., Ramaswamy, S., Rosenbaum, E. & Kang, S. M., Jan 1 1997, In : Proceedings of the Custom Integrated Circuits Conference. p. 159-162 4 p.

Research output: Contribution to journalConference article

Networks (circuits)
Silicon
Hot Temperature

Circuit-level simulation of CDM-ESD and EOS in submicron MOS devices

Ramaswamy, S., Li, E., Rosenbaum, E. & Kang, S. M., Dec 1 1996, In : Electrical Overstress/Electrostatic Discharge Symposium Proceedings. p. 316-321 6 p.

Research output: Contribution to journalConference article

simulation
breakdown
simulators
temperature