1989 …2019
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Research Output 1989 2019

2019

Data-driven reliability for datacenter hard disk drives

Yang, A., Ghassami, A. E., Rosenbaum, E. & Kiyavash, N., May 2019, In : Electronic Device Failure Analysis. 21, 2, p. 18-20 3 p.

Research output: Contribution to journalComment/debate

Hard disk storage

Decomposition Method for Event-Detection State Vector Simulation of Switched-Mode Power Supplies

Reiman, C. & Rosenbaum, E., Jun 2019, 2019 IEEE 20th Workshop on Control and Modeling for Power Electronics, COMPEL 2019. Institute of Electrical and Electronics Engineers Inc., 8769654. (2019 IEEE 20th Workshop on Control and Modeling for Power Electronics, COMPEL 2019).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Switched mode power supplies
Event Detection
Decomposition Method
Decomposition
Feedback control

Discrete-Time Large-Signal Modeling and Numerical Methods for Flyback Converters

Reiman, C., Das, D. & Rosenbaum, E., Apr 24 2019, 2019 IEEE Power and Energy Conference at Illinois, PECI 2019. Institute of Electrical and Electronics Engineers Inc., 8698921. (2019 IEEE Power and Energy Conference at Illinois, PECI 2019).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Numerical methods
Decomposition

Guilty As Charged: Computational Reliability Threats Posed by Electrostatic Discharge-induced Soft Errors

Feng, K., Vora, S., Jiang, R., Rosenbaum, E. & Vasudevan, S., May 14 2019, Proceedings of the 2019 Design, Automation and Test in Europe Conference and Exhibition, DATE 2019. Institute of Electrical and Electronics Engineers Inc., p. 156-161 6 p. 8715149. (Proceedings of the 2019 Design, Automation and Test in Europe Conference and Exhibition, DATE 2019).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Soft Error
Electrostatic discharge
Electrostatics
Chip
Microcontroller

Measurement and simulation of on-chip supply noise induced by system-level ESD

Xiu, Y., Thomson, N. & Rosenbaum, E., Mar 2019, In : IEEE Transactions on Device and Materials Reliability. 19, 1, p. 211-220 10 p., 8640259.

Research output: Contribution to journalArticle

Networks (circuits)
Circuit simulation
Electric potential
Flip flop circuits

Special Issue on Reliability

Mahapatra, S., Chen, K. J., Kaczer, B., Pancheri, L., Rosenbaum, E., Mouli, C., Wong, H., Kerber, A., Monzio Compagnoni, C., Koval, R., Meneghesso, G., Sheridan, D., Ramey, S., Wang, R. & Stathis, J., Nov 2019, In : IEEE Transactions on Electron Devices. 66, 11, p. 4497-4503 7 p., 8886623.

Research output: Contribution to journalEditorial

2018

Enhanced IC modeling methodology for system-level ESD simulation

Xiong, J., Chen, Z., Xiu, Y., Mu, Z., Raginsky, M. & Rosenbaum, E., Oct 25 2018, Electrical Overstress/Electrostatic Discharge Symposium Proceedings, EOS/ESD 2018. ESD Association, (Electrical Overstress/Electrostatic Discharge Symposium Proceedings; vol. 2018-September).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Recurrent neural networks
Circuit simulation
Networks (circuits)

Hardware and software combined detection of system-level ESD-induced soft failures

Vora, S., Jiang, R., Vijayaraj, P. M., Feng, K., Xiu, Y., Vasudevan, S. & Rosenbaum, E., Oct 25 2018, Electrical Overstress/Electrostatic Discharge Symposium Proceedings, EOS/ESD 2018. ESD Association, (Electrical Overstress/Electrostatic Discharge Symposium Proceedings; vol. 2018-September).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Microcontrollers
Computer hardware
Hardware
Data storage equipment
Electric potential

Latch-up model of non-collinear PNPN structures

Reiman, C., Jack, N. & Rosenbaum, E., Oct 25 2018, Electrical Overstress/Electrostatic Discharge Symposium Proceedings, EOS/ESD 2018. ESD Association, Vol. 2018-September.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Circuit simulation
Thyristors
Electric potential
FinFET

Preface

Rosenbaum, E., May 25 2018, In : IEEE International Reliability Physics Symposium Proceedings. 2018-March, 1 p.

Research output: Contribution to journalEditorial

Stochastic modeling of air electrostatic discharge parameters

Xiu, Y., Sagan, S., Battini, A., Ma, X., Raginsky, M. & Rosenbaum, E., May 25 2018, 2018 IEEE International Reliability Physics Symposium, IRPS 2018. Institute of Electrical and Electronics Engineers Inc., Vol. 2018-March. p. 2C.21-2C.210

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Electrostatic discharge
Atmospheric humidity
Electric potential
Air
Discharge (fluid mechanics)

Verilog-A compatible recurrent neural network model for transient circuit simulation

Chen, Z., Raginsky, M. & Rosenbaum, E., Apr 2 2018, 2017 IEEE 26th Conference on Electrical Performance of Electronic Packaging and Systems, EPEPS 2017. Institute of Electrical and Electronics Engineers Inc., Vol. 2018-January. p. 1-3 3 p.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Computer hardware description languages
Recurrent neural networks
Circuit simulation
Networks (circuits)
Simulators
2017

Chip-level ESD-induced noise on internally and externally regulated power supplies

Xiu, Y., Thomson, N., Mertens, R., Reiman, C. & Rosenbaum, E., Oct 18 2017, Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2017, EOS/ESD 2017. ESD Association, (Electrical Overstress/Electrostatic Discharge Symposium Proceedings).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Voltage regulators
Voltage control
Capacitors

ESD self-protection of high-speed transceivers using adaptive active bias conditioning

Keel, M. S. & Rosenbaum, E., Mar 2017, In : IEEE Transactions on Device and Materials Reliability. 17, 1, p. 113-120 8 p., 7744493.

Research output: Contribution to journalArticle

Electrostatic discharge
Transceivers
Failure analysis
Electric lines
Transistors

On-chip monitors of supply noise generated by system-level ESD

Thomson, N., Reiman, C., Xiu, Y. & Rosenbaum, E., Oct 18 2017, Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2017, EOS/ESD 2017. ESD Association, (Electrical Overstress/Electrostatic Discharge Symposium Proceedings).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Networks (circuits)
Electric potential

Soft-Failures Induced by System-Level ESD

Thomson, N. A., Xiu, Y. & Rosenbaum, E., Mar 2017, In : IEEE Transactions on Device and Materials Reliability. 17, 1, p. 90-98 9 p., 7851026.

Research output: Contribution to journalArticle

Magnetic couplings
Earth (planet)
Derivatives
Networks (circuits)
Substrates
2016

Application level investigation of system-level ESD-induced soft failures

Vora, S., Jiang, R., Vasudevan, S. & Rosenbaum, E., Oct 14 2016, Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2016, EOS/ESD 2016. ESD Association, 7592565. (Electrical Overstress/Electrostatic Discharge Symposium Proceedings; vol. 2016-October).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Program processors
Hardware

A Study of BER-Optimal ADC-Based Receiver for Serial Links

Lin, Y., Keel, M. S., Faust, A., Xu, A., Shanbhag, N. R., Rosenbaum, E. & Singer, A. C., May 2016, In : IEEE Transactions on Circuits and Systems I: Regular Papers. 63, 5, p. 693-704 12 p., 7486052.

Research output: Contribution to journalArticle

Digital to analog conversion
Bit error rate
Energy dissipation
Throughput

Case study of DPI robustness of a MOS-SCR structure for automotive applications

Xiu, Y., Farbiz, F., Salman, A., Zu, Y., Dissegna, M., Boselli, G. & Rosenbaum, E., Oct 14 2016, Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2016, EOS/ESD 2016. ESD Association, Vol. 2016-October. 7592538

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Thyristors
Networks (circuits)

CDM-reliable T-coil techniques for a 25-Gb/s wireline receiver front-end

Keel, M. S. & Rosenbaum, E., Dec 2016, In : IEEE Transactions on Device and Materials Reliability. 16, 4, p. 513-520 8 p., 7523221.

Research output: Contribution to journalArticle

Electrostatic discharge
Magnetic couplings
Inductance
Networks (circuits)
Equalizers

Compact distributed multi-finger MOSFET model for circuit-level ESD simulation

Meng, K. H., Chen, Z. & Rosenbaum, E., Aug 1 2016, In : Microelectronics Reliability. 63, p. 11-21 11 p.

Research output: Contribution to journalArticle

field effect transistors
Networks (circuits)
simulation
Heating
Parameter extraction

Experimental study of supply voltage stability during ESD

Xiu, Y., Mertens, R., Thomson, N. & Rosenbaum, E., Sep 22 2016, 2016 International Reliability Physics Symposium, IRPS 2016. Institute of Electrical and Electronics Engineers Inc., p. 6A61-6A66 7574560. (IEEE International Reliability Physics Symposium Proceedings; vol. 2016-September).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Clamping devices
Voltage control
Rails
Inductance
Capacitance

Full-component modeling and simulation of charged device model ESD

Meng, K. H., Shukla, V. & Rosenbaum, E., Jul 2016, In : IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 35, 7, p. 1105-1113 9 p., 7308012.

Research output: Contribution to journalArticle

Electrostatic discharge
Circuit simulation
Equivalent circuits
Integrated circuits
Networks (circuits)

Improving the long pulse width failure current of NPN in BiCMOS technology

Xiu, Y., Appaswamy, A., Chen, Z., Salman, A., Dissegna, M., Boselli, G. & Rosenbaum, E., Sep 22 2016, 2016 International Reliability Physics Symposium, IRPS 2016. Institute of Electrical and Electronics Engineers Inc., Vol. 2016-September. p. EL51-EL54 7574606

Research output: Chapter in Book/Report/Conference proceedingConference contribution

BiCMOS technology

Physical basis for CMOS SCR compact models

Mertens, R. & Rosenbaum, E., Jan 1 2016, In : IEEE Transactions on Electron Devices. 63, 1, p. 296-302 7 p., 7365555.

Research output: Contribution to journalArticle

Thyristors
Bipolar transistors
Silicon
Physics
2015

Analysis of active-clamp response to power-on ESD: Power supply integrity and performance tradeoffs

Mertens, R., Thomson, N., Xiu, Y. & Rosenbaum, E., Sep 1 2015, In : IEEE Transactions on Device and Materials Reliability. 15, 3, p. 263-271 9 p., 7177068.

Research output: Contribution to journalArticle

Clamping devices
Rails
Networks (circuits)
Transient analysis

CDM-reliable T-coil techniques for high-speed wireline receivers

Keel, M. S. & Rosenbaum, E., Oct 30 2015, Electrical Overstress/Electrostatic Discharge Symposium Proceedings, EOS/ESD 2015. ESD Association, (Electrical Overstress/Electrostatic Discharge Symposium Proceedings; vol. 2015-October).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Magnetic couplings
Inductance
Hazards
Bandwidth
Degradation

Charged Device Model Reliability of Three-Dimensional Integrated Circuits

Shukla, V. & Rosenbaum, E., Dec 2015, In : IEEE Transactions on Device and Materials Reliability. 15, 4, p. 559-566 8 p., 7299296.

Research output: Contribution to journalArticle

Clamping devices
Circuit simulation
Silicon
Electric power distribution
Integrated circuits

Current challenges in component-level and system-level ESD simulation

Rosenbaum, E., Meng, K. H., Xiu, Y. & Thomson, N., Aug 3 2015, 2015 Asia-Pacific International Symposium on Electromagnetic Compatibility, APEMC 2015. Institute of Electrical and Electronics Engineers Inc., p. 333-336 4 p. 7175328. (2015 Asia-Pacific International Symposium on Electromagnetic Compatibility, APEMC 2015).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

beds
Computational efficiency
simulation
test stands
qualifications

Fast circuit simulator for transient analysis of CDM ESD

Meng, K. H. & Rosenbaum, E., Oct 30 2015, Electrical Overstress/Electrostatic Discharge Symposium Proceedings, EOS/ESD 2015. ESD Association, (Electrical Overstress/Electrostatic Discharge Symposium Proceedings; vol. 2015-October).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Cluster computing
Transient analysis
Simulators
Engines
Networks (circuits)

Improved GGSCR layout for overshoot reduction

Chen, Z., Mertens, R., Reiman, C. & Rosenbaum, E., May 26 2015, 2015 IEEE International Reliability Physics Symposium, IRPS 2015. Institute of Electrical and Electronics Engineers Inc., p. 3F21-3F28 7112720. (IEEE International Reliability Physics Symposium Proceedings; vol. 2015-May).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Electric potential
Anodes
Cathodes

Piecewise-linear model with transient relaxation for circuit-level ESD simulation

Meng, K. H., Mertens, R. & Rosenbaum, E., Sep 1 2015, In : IEEE Transactions on Device and Materials Reliability. 15, 3, p. 464-466 3 p., 7214270.

Research output: Contribution to journalArticle

Electrostatic discharge
Networks (circuits)
Finite automata

Practical methodology for the extraction of SEED models

Reiman, C., Thomson, N., Xiu, Y., Mertens, R. & Rosenbaum, E., Oct 30 2015, Electrical Overstress/Electrostatic Discharge Symposium Proceedings, EOS/ESD 2015. ESD Association, (Electrical Overstress/Electrostatic Discharge Symposium Proceedings; vol. 2015-October).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Integrated circuits

S-parameter based modeling of system-level ESD test bed

Xiu, Y., Thomson, N., Mertens, R. & Rosenbaum, E., Oct 30 2015, Electrical Overstress/Electrostatic Discharge Symposium Proceedings, EOS/ESD 2015. ESD Association, (Electrical Overstress/Electrostatic Discharge Symposium Proceedings; vol. 2015-October).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Scattering parameters
Networks (circuits)
2014

A co-optimization methodology on ESD robustness and functionality for pad-ring circuitry

Meng, K. H., Gerdemann, A., Miller, J. W. & Rosenbaum, E., Nov 26 2014, In : Electrical Overstress/Electrostatic Discharge Symposium Proceedings. 2014-November, November

Research output: Contribution to journalConference article

A mechanism for logic upset induced by power-on ESD

Xiu, Y., Thomson, N., Mertens, R. & Rosenbaum, E., Nov 26 2014, In : Electrical Overstress/Electrostatic Discharge Symposium Proceedings. 2014-November, November

Research output: Contribution to journalConference article

Transistors

Custom test chip for system-level ESD investinvestigations

Thomson, N., Xiu, Y., Mertens, R., Keel, M. S. & Rosenbaum, E., Nov 26 2014, In : Electrical Overstress/Electrostatic Discharge Symposium Proceedings. 2014-November, November

Research output: Contribution to journalConference article

Logic circuits
Transmitters
Detectors
Monitoring
Testing

Prediction of charged device model peak discharge current for microelectronic components

Shukla, V., Boselli, G., Dissegna, M., Duvvury, C., Sankaralingam, R. & Rosenbaum, E., Sep 1 2014, In : IEEE Transactions on Device and Materials Reliability. 14, 3, p. 801-809 9 p., 6862855.

Research output: Contribution to journalArticle

Microelectronics
Electrostatic discharge

Theory of active clamp response to power-on ESD and implications for power supply integrity

Mertens, R., Thomson, N., Xiu, Y. & Rosenbaum, E., Nov 26 2014, In : Electrical Overstress/Electrostatic Discharge Symposium Proceedings. 2014-November, November

Research output: Contribution to journalConference article

Trigger circuits
Clamping devices
Bandwidth
Networks (circuits)
2013

A physics-based compact model for SCR devices used in ESD protection circuits

Mertens, R. & Rosenbaum, E., Aug 7 2013, 2013 IEEE International Reliability Physics Symposium, IRPS 2013. 6531947. (IEEE International Reliability Physics Symposium Proceedings).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Thyristors
Physics
Networks (circuits)
Transistors
Circuit simulation

Comparison of FICDM and wafer-level CDM test methods

Jack, N. & Rosenbaum, E., Jul 1 2013, In : IEEE Transactions on Device and Materials Reliability. 13, 2, p. 379-387 9 p., 6515361.

Research output: Contribution to journalArticle

Integrated circuits
Induced currents
Electric lines
Networks (circuits)
Electric potential

ESD-resilient active biasing scheme for high-speed SSTL I/Os

Keel, M. S., Jack, N. & Rosenbaum, E., Oct 16 2013, Electrical Overstress/Electrostatic Discharge Symposium Proceedings, EOS/ESD 2013. 6635906. (Electrical Overstress/Electrostatic Discharge Symposium Proceedings).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Networks (circuits)
Transistors
Oxides
Electric potential

Investigation of product burn-in failures due to powered NPN bipolar latching of active MOSFET rail clamps

Ruth, S., Miller, J. W., Gerdemann, A., Stockinger, M., Etherton, M., Moosa, M., Dobbin, A., Mertens, R., Meng, K. H., Rosenbaum, E., Colombo, P., Cordoni, M. & Guitard, N., Oct 16 2013, Electrical Overstress/Electrostatic Discharge Symposium Proceedings, EOS/ESD 2013. 6635940. (Electrical Overstress/Electrostatic Discharge Symposium Proceedings).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Clamping devices
Rails

Layout-aware, distributed, compact model for multi-finger MOSFETs operating under ESD conditions

Meng, K. H. & Rosenbaum, E., Oct 16 2013, Electrical Overstress/Electrostatic Discharge Symposium Proceedings, EOS/ESD 2013. 6635912. (Electrical Overstress/Electrostatic Discharge Symposium Proceedings).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Parameter extraction
Electric lines
Geometry
Electric potential

Predictive modeling of peak discharge current during charged device model test of microelectronic components

Shukla, V., Boselli, G., Dissegna, M., Duvvury, C., Sankaralingam, R. & Rosenbaum, E., Oct 16 2013, Electrical Overstress/Electrostatic Discharge Symposium Proceedings, EOS/ESD 2013. 6635951. (Electrical Overstress/Electrostatic Discharge Symposium Proceedings).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Microelectronics
Electric potential

Separating SCR and trigger circuit related overshoot in SCR-based ESD protection circuits

Mertens, R. & Rosenbaum, E., Oct 16 2013, Electrical Overstress/Electrostatic Discharge Symposium Proceedings, EOS/ESD 2013. 6635915. (Electrical Overstress/Electrostatic Discharge Symposium Proceedings).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Trigger circuits
Thyristors
Networks (circuits)
Circuit simulation
Electric potential

Verification of snapback model by transient I-V measurement for circuit simulation of ESD response

Meng, K. H. & Rosenbaum, E., Jul 1 2013, In : IEEE Transactions on Device and Materials Reliability. 13, 2, p. 371-378 8 p., 6504488.

Research output: Contribution to journalArticle

Electrostatic discharge
Circuit simulation
Relaxation oscillators
Testing
2012

A flexible simulation model for system level ESD stresses with application to ESD design and troubleshooting

Mertens, R., Kunz, H., Salman, A., Boselli, G. & Rosenbaum, E., Nov 27 2012, Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2012, EOS/ESD 2012. 6333331. (Electrical Overstress/Electrostatic Discharge Symposium Proceedings).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Integrated circuit testing
Specifications

Comparing FICDM and wafer-level CDM test methods: Apples to oranges?

Jack, N. & Rosenbaum, E., Nov 27 2012, Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2012, EOS/ESD 2012. 6333309. (Electrical Overstress/Electrostatic Discharge Symposium Proceedings).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Networks (circuits)
Electric potential

Diode-triggered silicon-controlled rectifier with reduced voltage overshoot for CDM ESD protection

Chen, W. Y., Rosenbaum, E. & Ker, M. D., Mar 1 2012, In : IEEE Transactions on Device and Materials Reliability. 12, 1, p. 10-14 5 p., 6163575.

Research output: Contribution to journalArticle

Thyristors
Diodes
Electric potential
Electrostatic discharge
Leakage currents