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Fingerprint Fingerprint is based on mining the text of the expert's scholarly documents to create an index of weighted terms, which defines the key subjects of each individual researcher.

  • 4 Similar Profiles
Networks (circuits) Engineering & Materials Science
Electrostatic discharge Engineering & Materials Science
Thyristors Engineering & Materials Science
Electric potential Engineering & Materials Science
Circuit simulation Engineering & Materials Science
Oxides Chemical Compounds
Simulators Engineering & Materials Science
Hot carriers Engineering & Materials Science

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Research Output 1989 2019

Data-driven reliability for datacenter hard disk drives

Yang, A., Ghassami, A. E., Rosenbaum, E. & Kiyavash, N., May 1 2019, In : Electronic Device Failure Analysis. 21, 2, p. 18-20 3 p.

Research output: Contribution to journalComment/debate

Hard disk storage

Decomposition Method for Event-Detection State Vector Simulation of Switched-Mode Power Supplies

Reiman, C. & Rosenbaum, E., Jun 1 2019, 2019 IEEE 20th Workshop on Control and Modeling for Power Electronics, COMPEL 2019. Institute of Electrical and Electronics Engineers Inc., 8769654. (2019 IEEE 20th Workshop on Control and Modeling for Power Electronics, COMPEL 2019).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Switched mode power supplies
Event Detection
Decomposition Method
Decomposition
Feedback control

Discrete-Time Large-Signal Modeling and Numerical Methods for Flyback Converters

Reiman, C., Das, D. & Rosenbaum, E., Apr 24 2019, 2019 IEEE Power and Energy Conference at Illinois, PECI 2019. Institute of Electrical and Electronics Engineers Inc., 8698921. (2019 IEEE Power and Energy Conference at Illinois, PECI 2019).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Numerical methods
Decomposition

Guilty As Charged: Computational Reliability Threats Posed by Electrostatic Discharge-induced Soft Errors

Feng, K., Vora, S., Jiang, R., Rosenbaum, E. & Vasudevan, S., May 14 2019, Proceedings of the 2019 Design, Automation and Test in Europe Conference and Exhibition, DATE 2019. Institute of Electrical and Electronics Engineers Inc., p. 156-161 6 p. 8715149. (Proceedings of the 2019 Design, Automation and Test in Europe Conference and Exhibition, DATE 2019).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Soft Error
Electrostatic discharge
Electrostatics
Chip
Microcontroller

Measurement and simulation of on-chip supply noise induced by system-level ESD

Xiu, Y., Thomson, N. & Rosenbaum, E., Mar 1 2019, In : IEEE Transactions on Device and Materials Reliability. 19, 1, p. 211-220 10 p., 8640259.

Research output: Contribution to journalArticle

Networks (circuits)
Circuit simulation
Electric potential
Flip flop circuits