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Research Output

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Review article
2016

SIMS for analysis of nanostructures

Seebauer, E. G. & Barlaz, D. E., May 1 2016, In : Current Opinion in Chemical Engineering. 12, p. 8-13 6 p.

Research output: Contribution to journalReview article

2006

Charged point defects in semiconductors

Seebauer, E. G. & Kratzer, M. C., Dec 15 2006, In : Materials Science and Engineering R: Reports. 55, 3-6, p. 57-149 93 p.

Research output: Contribution to journalReview article

2002

Microelectronics research in chemical engineering: A metaphorical view

Seebauer, E. G. & Chan, H. Y. H., Aug 27 2002, In : Reviews in Chemical Engineering. 18, 1, p. 1-47 47 p.

Research output: Contribution to journalReview article

1995

Estimating surface diffusion coefficients

Seebauer, E. G. & Allen, C. E., Jul 1995, In : Progress in Surface Science. 49, 3, p. 265-330 66 p.

Research output: Contribution to journalReview article