Keyphrases
Active Layer
11%
Adatoms
6%
Anisotropic Thermal Conductivity
5%
Atomic Force Microscopy
7%
Elastic Constants
6%
Epitaxial
7%
Epitaxial Layers
8%
Ge(001)
8%
Heat Flow
9%
Heat Transfer
5%
Heat Transport
13%
High Thermal Conductivity
9%
In Situ Scanning Tunneling Microscopy
5%
K(I)
18%
Low Temperature
8%
Low Thermal Conductivity
7%
Micron-scale
5%
Minimum Thermal Conductivity
5%
Mounds
6%
Nanofiltration Membrane
5%
Phonons
9%
Picosecond
5%
Reverse Osmosis Membrane
10%
Room Temperature
9%
Rutherford Backscattering Spectrometry
6%
Scanning Tunneling Microscopy
10%
Si(111)
17%
SiGe
6%
Silica
13%
Single Crystal
5%
Superlattices
6%
Surface Morphology
8%
Temperature Effect
11%
Temperature Range
9%
Thermal Conductance
18%
Thermal Conductivity
85%
Thermal Properties
8%
Thermal Transport
13%
Thermometry
6%
Time-domain Thermoreflectance
33%
Time-resolved
7%
Ultrafast
6%
Ultralow Thermal Conductivity
7%
Material Science
Anisotropy
6%
Atomic Force Microscopy
5%
Boron
5%
Density
21%
Diamond
7%
Dielectric Material
6%
Elasticity
6%
Epitaxial Film
8%
Film
35%
Ion Bombardment
6%
Molecular Beam Epitaxy
7%
Nanofiltration Membrane
6%
Nanoparticle
9%
Osmosis Membrane
10%
Oxide Compound
5%
Polyamide
10%
Rutherford Backscattering Spectrometry
7%
Scanning Tunneling Microscopy
15%
Silicon
11%
Single Crystal
6%
Superlattice
7%
Surface (Surface Science)
35%
Surface Morphology
7%
Thermal Conductivity
100%
Thermal Property
7%
Thermoelectrics
6%
Thin Films
26%
Transmission Electron Microscopy
5%
Ultralow Thermal Conductivity
7%
Engineering
Anisotropic
9%
Atomic Force Microscopy
5%
Beam Deflection
5%
Epitaxial Film
8%
Good Agreement
5%
Heat Transport
8%
High Thermal Conductivity
5%
Length Scale
5%
Low Thermal Conductivity
6%
Nanoscale
12%
Picosecond
9%
Probe Beam
5%
Pulsed Laser
5%
Reverse Osmosis Membrane
5%
Room Temperature
9%
Scanning Tunneling Microscopy
10%
Silicon Dioxide
10%
Spatial Resolution
5%
Superlattice
7%
Surface Morphology
5%
Temperature Range
9%
Thermal Conductivity
62%
Thin Films
16%
Time Domain
26%
