Keyphrases
Thermal Conductivity
86%
Time-domain Thermoreflectance
33%
K(I)
19%
Thermal Conductance
18%
Si(111)
18%
Silica
14%
Heat Transport
13%
Thermal Transport
13%
Active Layer
11%
Temperature Effect
11%
Reverse Osmosis Membrane
10%
Scanning Tunneling Microscopy
10%
Phonons
10%
Room Temperature
10%
Heat Flow
10%
High Thermal Conductivity
9%
Temperature Range
9%
Surface Morphology
9%
Low Temperature
8%
Epitaxial Layers
8%
Ge(001)
8%
Thermal Properties
8%
Low Thermal Conductivity
8%
Ultralow Thermal Conductivity
7%
Time-resolved
7%
Epitaxial
7%
Atomic Force Microscopy
7%
Superlattices
7%
Elastic Constants
6%
SiGe
6%
Rutherford Backscattering Spectrometry
6%
Adatoms
6%
Mounds
6%
Heat Transfer
6%
Anisotropic Thermal Conductivity
6%
Ultrafast
6%
Micron-scale
5%
Single Crystal
5%
Picosecond
5%
Thermometry
5%
In Situ Scanning Tunneling Microscopy
5%
Nanofiltration Membrane
5%
Minimum Thermal Conductivity
5%
Thermoreflectance
5%
Material Science
Thermal Conductivity
100%
Film
38%
Thin Films
27%
Density
23%
Silicon
12%
Amorphous Material
11%
Crystalline Material
10%
Osmosis Membrane
10%
Polyamide
10%
Nanoparticle
10%
Surface Morphology
8%
Superlattice
8%
Thermal Property
8%
Molecular Beam Epitaxy
7%
Rutherford Backscattering Spectrometry
7%
Diamond
7%
Ultralow Thermal Conductivity
7%
Elastic Constant
7%
Epitaxial Layer
7%
Anisotropy
6%
Nanocrystalline Material
6%
Thermoelectrics
6%
Nanofiltration Membrane
6%
Single Crystal
6%
Dielectric Material
6%
Oxide Compound
6%
Transmission Electron Microscopy
5%
Boron
5%
Nucleation
5%
Engineering
Thermal Conductivity
68%
Time Domain
28%
Thin Films
16%
Nanoscale
12%
Scanning Tunneling Microscopy
10%
Temperature Range
10%
Anisotropic
10%
Heat Transport
10%
Room Temperature
9%
Picosecond
9%
Energy Engineering
8%
Epitaxial Layer
7%
Low Thermal Conductivity
6%
Reverse Osmosis Membrane
6%
Surface Morphology
5%
Probe Beam
5%
Diamond
5%
Spatial Resolution
5%
Active Layer
5%
Beam Deflection
5%
Length Scale
5%
Pulsed Laser
5%
Defects
5%
High Thermal Conductivity
5%
Good Agreement
5%
Atomic Force Microscopy
5%