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Data for Magnetic Anisotropy due to Localized Structural Defects in Strained Yttrium Iron Garnet Thin Films

  • Xingzhi Wang (Creator)
  • Jinho Lim (Creator)
  • Yi Li (Creator)
  • Hsu Chih Ni (Creator)
  • Jonathan Schimmels (Creator)
  • Zhixin Zhang (Creator)
  • Jiangchao Qian (Creator)
  • Robert Busch (Creator)
  • Youfu Qian (Creator)
  • Phuoc Cao Van (Creator)
  • Jong-Ryul Jeong (Creator)
  • Axel Friedrich Hoffmann (Creator)
  • Jian-Min Zuo (Creator)

Dataset

Description

This dataset contains electron microscopy, magnetic, and X-ray diffraction characterization data for YIG/YSGG thin films associated with the manuscript "Magnetic anisotropy due to localized structural defects in strained yttrium iron garnet thin films". Characterizations include: scanning electron nano diffraction (SEND, or 4D-STEM), dark field transmission electron microscopy (DF-TEM), energy dispersive X-ray spectroscopy (EDS), ferrimagnetic resonance (FMR), superconducting quantum interference device (SQUID), scanning transmission electron microscopy (STEM), X-ray diffraction (XRD).
Date made availableJul 20 2026
PublisherUniversity of Illinois Urbana-Champaign

Keywords

  • Thin films
  • Magnetic materials
  • Materials engineering
  • Electron microscopy

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